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SN74BCT8373ADWRG4

SN74BCT8373ADWRG4
Mfr. #:
SN74BCT8373ADWRG4
Description:
Specialty Function Logic IEEE Std 1149.1 Bndry Scan Tst Devic
Lifecycle:
New from this manufacturer.
Datasheet:
SN74BCT8373ADWRG4 Datasheet
Delivery:
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ECAD Model:
More Information:
SN74BCT8373ADWRG4 more Information SN74BCT8373ADWRG4 Product Details
Product Attribute
Attribute Value
Manufacturer:
Texas Instruments
Product Category:
Specialty Function Logic
RoHS:
Y
Package / Case:
SOIC-24
Packaging:
Reel
Brand:
Texas Instruments
Mounting Style:
SMD/SMT
Product Type:
Specialty Function Logic
Factory Pack Quantity:
1
Subcategory:
Logic ICs
Unit Weight:
0.038731 oz
Tags
SN74BCT8373ADWR, SN74BCT8373AD, SN74BCT8373A, SN74BCT8373, SN74BCT83, SN74BCT8, SN74B, SN74, SN7
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Step1: Vacuum Packaging with PL
Step1:
Vacuum Packaging with PL
Step2: Anti-Static Bag
Step2:
Anti-Static Bag
Step3: Packaging Boxes
Step3:
Packaging Boxes
*** Stop Electro
Boundary Scan Bus Driver, BCT/FBT Series, 1-Func, 8-Bit, True Output, BICMOS, PDSO24
***ark
Specialty Logic IC; Logic Family:BCT; Supply Voltage Min:4.5V; Supply Voltage Max:5.5V; Package/Case:24-SOIC; No. of Pins:24; Operating Temperature Range:0°C to +70°C; Input Type:TTL; Leaded Process Compatible:Yes; Output Type:TTL ;RoHS Compliant: Yes
***as Instruments
The 'BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPETM testability integrated- circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface. In the normal mode, these devices are functionally equivalent to the 'F373 and 'BCT373 octal D-type latches. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device terminals or to perform a self test on the boundary test cells. Activating the TAP in normal mode does not affect the functional operation of the SCOPETM octal latches. In the test mode, the normal operation of the SCOPETM octal latches is inhibited and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry can perform boundary scan test operations, as described in IEEE Standard 1149.1-1990. Four dedicated test terminals are used to control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry can perform other testing functions such as parallel signature analysis (PSA) on data inputs and pseudo-random pattern generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface. The SN54BCT8373A is characterized for operation over the full military temperature range of -55°C to 125°C. The SN74BCT8373A is characterized for operation from 0°C to 70°C.
Part # Description Stock Price
SN74BCT8373ADWRG4
DISTI # SN74BCT8373ADWRG4-ND		IC SCAN TEST DEVICE 24SOIC
RoHS: Compliant
Min Qty: 2000
Container: Tape & Reel (TR)		Limited Supply - Call
    SN74BCT8373ADWRG4
    DISTI # 595-74BCT8373ADWRG4    		Specialty Function Logic IEEE Std 1149.1 Bndry Scan Tst Devic
    RoHS: Compliant    		0
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      Availability
      Stock:
      Available
      On Order:
      1500
      Enter Quantity:
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