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SN74ABT18646PM

SN74ABT18646PM
Mfr. #:
SN74ABT18646PM
Description:
Specialty Function Logic Device w/18-Bit Bus Trnscvr & Register
Lifecycle:
New from this manufacturer.
Datasheet:
SN74ABT18646PM Datasheet
Delivery:
DHL FedEx Ups TNT EMS
Payment:
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ECAD Model:
More Information:
SN74ABT18646PM more Information SN74ABT18646PM Product Details
Product Attribute
Attribute Value
Manufacturer:
Texas Instruments
Product Category:
Specialty Function Logic
RoHS:
Y
Product:
Boundry Scan JTAG Logic
Series:
SN74ABT18646
Minimum Operating Temperature:
- 40 C
Maximum Operating Temperature:
+ 85 C
Package / Case:
LQFP-64
Packaging:
Tray
Operating Temperature Range:
- 40 C to + 85 C
Brand:
Texas Instruments
Mounting Style:
SMD/SMT
Moisture Sensitive:
Yes
Product Type:
Specialty Function Logic
Factory Pack Quantity:
160
Subcategory:
Logic ICs
Tradename:
SCOPE
Unit Weight:
0.012088 oz
Tags
SN74ABT1864, SN74ABT186, SN74ABT18, SN74ABT1, SN74AB, SN74A, SN74, SN7
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Step1: Vacuum Packaging with PL
Step1:
Vacuum Packaging with PL
Step2: Anti-Static Bag
Step2:
Anti-Static Bag
Step3: Packaging Boxes
Step3:
Packaging Boxes
*** Stop Electro
Boundary Scan Reg Bus Transceiver, ABT Series, 2-Func, 9-Bit, True Output, BICMOS, PQFP64
***as Instruments
Scan Test Devices With 18-Bit Bus Transceivers And egisters 64-LQFP -40 to 85
***ark
Specialty Logic IC; Logic Family:ABT; Supply Voltage Min:4.5V; Supply Voltage Max:5.5V; Package/Case:64-LQFP; No. of Pins:64; Operating Temperature Range:-40°C to +85°C; Input Type:TTL; Leaded Process Compatible:Yes ;RoHS Compliant: Yes
*** Stop Electro
Boundary Scan Reg Bus Transceiver, ABT Series, 2-Func, 9-Bit, True Output, BICMOS, PQFP64
***as Instruments
Scan Test Devices With 18-Bit Universal Bus Transceivers 64-LQFP -40 to 85
***eco
Bus Transceiver Dual 18 Channel 3 State 64-Pin LQFP Tray
*** Stop Electro
Boundary Scan Reg Bus Transceiver, ABT Series, 2-Func, 9-Bit, True Output, BICMOS, PQFP64
***as Instruments
Scan Test Devices With 18-Bit Universal Bus Transceivers 64-LQFP -40 to 85
***inecomponents.com
Bus XCVR Dual 18-CH 3-ST 64-Pin LQFP Tray
***DA Technology Co., Ltd.
Product Description Demo for Development.
***i-Key Marketplace
SN74ABTH182502A SCAN TEST DEVICE
*** Stop Electro
Boundary Scan Reg Bus Transceiver, ABT Series, 2-Func, 9-Bit, True Output, BICMOS, PQFP64
***as Instruments
Scan Test Devices With 18-Bit Transceivers And egisters 64-LQFP -40 to 85
***ow.cn
Scan Test Device -40°C to 85°C 64-Pin LQFP Tray
***et
Bus XCVR Dual 18-CH 3-ST 64-Pin LQFP Tray
***DA Technology Co., Ltd.
Product Description Demo for Development.
***i-Key Marketplace
SN74ABTH18646A SCAN TEST DEVICES
***AS INSTRUM
This scan test device with a 18-bit bus transceiver and register is a member of the Texas Instruments SCOPE™ testability IC family. This device supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit board assemblies. Scan access to the test circuitry is accomplished via the four-wire test access port (TAP) interface.
***
In the normal mode, this device is an 18-bit bus transceiver and register that allows for multiplexed transmission of data directly from the input bus or from the internal registers. It can be used either as two 9-bit transceivers or one 18-bit transceiver. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self-test on the boundary test cells. Activating the TAP in the normal mode does not affect the functional operation of the SCOPE bus transceivers and registers.
***
Transceiver function is controlled by output-enable (OE)\ and direction (DIR) inputs. When (OE)\ is low, the transceiver is active and operates in the A-to-B direction when DIR is high or in the B-to-A direction when DIR is low. When (OE)\ is high, both the A and B outputs are in the high-impedance state, effectively isolating both buses.
***AS INSTRU
Data flow is controlled by clock (CLKAB and CLKBA) and select (SAB and SBA) inputs. Data on the A bus is clocked into the associated registers on the low-to-high transition of CLKAB. When SAB is low, real-time A data is selected for presentation to the B bus (transparent mode). When SAB is high, stored A data is selected for presentation to the B bus (registered mode). The function of the CLKBA and SBA inputs mirrors that of CLKAB and SAB, respectively. Figure 1 illustrates the four fundamental bus-management functions that can be performed with the SN74ABT18646.
***OMO Electronic
In the test mode, the normal operation of the SCOPE bus transceivers and registers is inhibited, and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry can perform boundary scan test operations according to the protocol described in IEEE Std 1149.1-1990.
***OMO Electronic
Four dedicated test pins are used to observe and control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry can perform other testing functions, such as parallel signature analysis on data inputs and pseudorandom pattern generation from data outputs. All testing and scan operations are synchronized to the TAP interface.
***AS INTRUMENTS
Additional flexibility is provided in the test mode through the use of two boundary scan cells (BSCs) for each I/O pin. This allows independent test data to be captured and forced at either bus (A or B). A PSA/COUNT instruction is also included to ease the testing of memories and other circuits where a binary count addressing scheme is useful.
Part # Description Stock Price
SN74ABT18646PM
DISTI # 29459519		Bus XCVR Dual 18-CH 3-ST 64-Pin LQFP Tray
RoHS: Compliant		4160
  • 500:$12.3623
  • 160:$13.8969
SN74ABT18646PM
DISTI # 27569030		Bus XCVR Dual 18-CH 3-ST 64-Pin LQFP Tray
RoHS: Compliant		110
  • 500:$13.1864
  • 110:$14.8234
SN74ABT18646PM
DISTI # 296-3943-ND		IC SCAN-TEST-DEV/TXRX 64-LQFP
RoHS: Compliant
Min Qty: 1
Container: Tray		349In Stock
  • 640:$13.7358
  • 160:$15.4410
  • 25:$17.5252
  • 10:$18.2830
  • 1:$19.8900
SN74ABT18646PM
DISTI # SN74ABT18646PM		Bus XCVR Dual 18-CH 3-ST 64-Pin LQFP Tray - Trays (Alt: SN74ABT18646PM)
RoHS: Compliant
Min Qty: 160
Container: Tray		Americas - 0
  • 160:$15.7900
  • 320:$15.3900
  • 640:$14.7900
  • 960:$14.3900
  • 1600:$14.1900
SN74ABT18646PM
DISTI # SN74ABT18646PM		Bus XCVR Dual 18-CH 3-ST 64-Pin LQFP Tray (Alt: SN74ABT18646PM)
RoHS: Compliant
Min Qty: 160
Container: Tray		Europe - 0
  • 160:€14.9900
  • 320:€13.5900
  • 640:€12.3900
  • 960:€11.7900
  • 1600:€11.3900
SN74ABT18646PMScan Test Devices With 18-Bit Bus Transceivers And Registers4800
  • 1000:$10.7700
  • 750:$10.8000
  • 500:$12.0300
  • 250:$13.0700
  • 100:$13.7400
  • 25:$15.7300
  • 10:$16.2900
  • 1:$17.5300
SN74ABT18646PM
DISTI # 595-SN74ABT18646PM		Specialty Function Logic Device w/18-Bit Bus Trnscvr & Register
RoHS: Compliant		160
  • 1:$19.8900
  • 10:$18.2900
  • 25:$17.3400
  • 100:$15.4500
  • 250:$14.6900
  • 500:$13.7400
SN74ABT18646PMG4
DISTI # 595-SN74ABT18646PMG4		Specialty Function Logic Device w/18-Bit Bus Trnscvr & Register
RoHS: Compliant		0
    SN74ABT18646PMBoundary Scan Reg Bus Transceiver, ABT Series, 2-Func, 9-Bit, True Output, BICMOS, PQFP64
    RoHS: Compliant    		6727
    • 1000:$12.4600
    • 500:$13.1200
    • 100:$13.6600
    • 25:$14.2400
    • 1:$15.3400
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    SN74ABTH18646APMG4

    Mfr.#: SN74ABTH18646APMG4

    OMO.#: OMO-SN74ABTH18646APMG4-1190

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    SN74ABT646ADGVR

    Mfr.#: SN74ABT646ADGVR

    OMO.#: OMO-SN74ABT646ADGVR-TEXAS-INSTRUMENTS

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    SN74ABTH182504APM

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    Availability
    Stock:
    160
    On Order:
    2143
    Enter Quantity:
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