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SN74LVTH18512DGGR

SN74LVTH18512DGGR
Mfr. #:
SN74LVTH18512DGGR
Description:
Specialty Function Logic Octal 25 Ohm Bus Transceivers
Lifecycle:
New from this manufacturer.
Datasheet:
SN74LVTH18512DGGR Datasheet
Delivery:
DHL FedEx Ups TNT EMS
Payment:
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ECAD Model:
More Information:
SN74LVTH18512DGGR more Information SN74LVTH18512DGGR Product Details
Product Attribute
Attribute Value
Manufacturer:
Texas Instruments
Product Category:
Specialty Function Logic
RoHS:
Y
Series:
SN74LVTH18512
Operating Supply Voltage:
3.3 V
Minimum Operating Temperature:
- 40 C
Maximum Operating Temperature:
+ 85 C
Package / Case:
TSSOP-64
Packaging:
Reel
Function:
Scan Test Device with Universal Bus Transceiver
Number of Circuits:
2
Operating Temperature Range:
- 40 C to + 85 C
Brand:
Texas Instruments
Mounting Style:
SMD/SMT
Product Type:
Specialty Function Logic
Propagation Delay Time:
6.8 ns
Factory Pack Quantity:
2000
Subcategory:
Logic ICs
Tradename:
SCOPE
Unit Weight:
0.009171 oz
Tags
SN74LVTH18512, SN74LVTH1851, SN74LVTH185, SN74LVTH18, SN74LVTH1, SN74LVTH, SN74LVT, SN74LV, SN74L, SN74, SN7
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We guarantee 100% customer satisfaction.

Quality Guarantees

We provide 90-360 days warranty.

If the items you received were not in perfect quality, we would be responsible for your refund or replacement, but the items must be returned in their original condition.
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we buy and manage excess electronic components, including excess inventory identified for disposal.
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Step1: Vacuum Packaging with PL
Step1:
Vacuum Packaging with PL
Step2: Anti-Static Bag
Step2:
Anti-Static Bag
Step3: Packaging Boxes
Step3:
Packaging Boxes
***as Instruments
3.3-V ABT Scan Test Devices With 18-Bit Universal Bus Transceivers 64-TSSOP -40 to 85
***et
Bus XCVR Dual 18-CH 3-ST 64-Pin TSSOP T/R
***Components
74LVTH18512DGGR 18-bit transceiver,TSSOP
***i-Key
IC SCAN TEST UNIV TXRX 64TSSOP
***AS INSRUMENT
The 'LVTH18512 and 'LVTH182512 scan test devices with 18-bit universal bus transceivers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.
***as Instr.
Additionally, these devices are designed specifically for low-voltage (3.3-V) VCC operation, but with the capability to provide a TTL interface to a 5-V system environment.
***INS
In the normal mode, these devices are 18-bit universal bus transceivers that combine D-type latches and D-type flip-flops to allow data flow in transparent, latched, or clocked modes. They can be used either as two 9-bit transceivers or one 18-bit transceiver. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self test on the boundary-test cells. Activating the TAP in the normal mode does not affect the functional operation of the SCOPETM universal bus transceivers.
***AS INSRUMENT
Data flow in each direction is controlled by output-enable (OEAB\ and OEBA\), latch-enable (LEAB and LEBA), and clock (CLKAB and CLKBA) inputs. For A-to-B data flow, the devices operate in the transparent mode when LEAB is high. When LEAB is low, the A data is latched while CLKAB is held at a static low or high logic level. Otherwise, if LEAB is low, A data is stored on a low-to-high transition of CLKAB. When OEAB\ is low, the B outputs are active. When OEAB\ is high, the B outputs are in the high-impedance state. B-to-A data flow is similar to A-to-B data flow but uses the OEBA\, LEBA, and CLKBA inputs.
***as Instr.
In the test mode, the normal operation of the SCOPETM universal bus transceivers is inhibited, and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry performs boundary-scan test operations according to the protocol described in IEEE Std 1149.1-1990.
***XS
Four dedicated test pins are used to observe and control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface.
***AS INSTRUM
Active bus-hold circuitry is provided to hold unused or floating data inputs at a valid logic level.
***TEXAS
The B-port outputs of 'LVTH182512, which are designed to source or sink up to 12 mA, include equivalent 25- series resistors to reduce overshoot and undershoot.
***AS INSTRUMENTS INC
The SN54LVTH18512 and SN54LVTH182512 are characterized for operation over the full military temperature range of -55°C to 125°C. The SN74LVTH18512 and SN74LVTH182512 are characterized for operation from -40°C to 85°C.
Part # Description Stock Price
SN74LVTH18512DGGR
DISTI # 29460481		Bus XCVR Dual 18-CH 3-ST 64-Pin TSSOP T/R
RoHS: Compliant		10000
  • 2000:$4.3246
SN74LVTH18512DGGR
DISTI # 296-8701-1-ND		IC SCAN TEST UNIV TXRX 64TSSOP
RoHS: Compliant
Min Qty: 1
Container: Cut Tape (CT)		2854In Stock
  • 1000:$4.7500
  • 500:$5.4536
  • 100:$6.2629
  • 10:$7.5650
  • 1:$8.3700
SN74LVTH18512DGGR
DISTI # 296-8701-6-ND		IC SCAN TEST UNIV TXRX 64TSSOP
RoHS: Compliant
Min Qty: 1
Container: Digi-Reel®		2854In Stock
  • 1000:$4.7500
  • 500:$5.4536
  • 100:$6.2629
  • 10:$7.5650
  • 1:$8.3700
SN74LVTH18512DGGR
DISTI # 296-8701-2-ND		IC SCAN TEST UNIV TXRX 64TSSOP
RoHS: Compliant
Min Qty: 2000
Container: Tape & Reel (TR)		Temporarily Out of Stock
  • 2000:$4.4408
SN74LVTH18512DGGR
DISTI # SN74LVTH18512DGGR		Bus XCVR Dual 18-CH 3-ST 64-Pin TSSOP T/R - Tape and Reel (Alt: SN74LVTH18512DGGR)
RoHS: Compliant
Min Qty: 2000
Container: Reel		Americas - 0
  • 2000:$4.2900
  • 4000:$4.2900
  • 8000:$4.1900
  • 12000:$4.1900
  • 20000:$4.1900
SN74LVTH18512DGGR
DISTI # SN74LVTH18512DGGR		Bus XCVR Dual 18-CH 3-ST 64-Pin TSSOP T/R (Alt: SN74LVTH18512DGGR)
RoHS: Compliant
Min Qty: 2000
Container: Tape and Reel		Europe - 0
  • 2000:€4.0900
  • 4000:€4.0900
  • 8000:€4.0900
  • 12000:€4.0900
  • 20000:€4.0900
SN74LVTH18512DGGR3.3-V ABT Scan Test Devices With 18-Bit Universal Bus Transceivers6000
  • 1000:$3.8800
  • 750:$3.9600
  • 500:$4.5800
  • 250:$5.2600
  • 100:$5.6400
  • 25:$6.2900
  • 10:$6.7300
  • 1:$7.4800
SN74LVTH18512DGGRBoundary Scan Reg Bus Transceiver, LVT Series, 2-Func, 9-Bit, True Output, CMOS, PDSO64
RoHS: Compliant		1520
  • 1000:$4.5000
  • 500:$4.7400
  • 100:$4.9300
  • 25:$5.1400
  • 1:$5.5400
SN74LVTH18512DGGR
DISTI # 595-SN74LVTH18512DGG		Specialty Function Logic Octal 25 Ohm Bus Transceivers
RoHS: Compliant		1040
  • 1:$8.1300
  • 10:$7.3500
  • 25:$6.8000
  • 100:$6.0900
  • 250:$5.7800
  • 500:$5.3000
  • 1000:$4.6200
  • 2000:$4.4500
SN74LVTH18512DGGRG4LVT SERIES, DUAL 9-BIT BOUNDARY SCAN REG TRANSCEIVER, TRUE OUTPUT, PDSO64157
  • 123:$3.7800
  • 43:$4.0950
  • 1:$9.4500
SN74LVTH18512DGGRG4LVT SERIES, DUAL 9-BIT BOUNDARY SCAN REG TRANSCEIVER, TRUE OUTPUT, PDSO64689
  • 489:$3.7800
  • 114:$4.0950
  • 1:$9.4500
SN74LVTH18512DGGR 50
    SN74LVTH18512DGGR
    DISTI # 1470404    		IC, TRANCEIVER, BUS, SMD
    RoHS: Compliant    		0
    • 1:$12.8700
    • 10:$11.6400
    • 25:$10.7700
    • 100:$9.6400
    • 250:$9.1500
    • 500:$8.3900
    • 1000:$7.3100
    • 2000:$7.0500
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    Availability
    Stock:
    938
    On Order:
    2921
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