SN74LVT18512DGGR

SN74LVT18512DGGR
Mfr. #:
SN74LVT18512DGGR
Description:
Specialty Function Logic 3.3-V ABT w/18-Bit Univ Bus Transceiver
Lifecycle:
New from this manufacturer.
Datasheet:
SN74LVT18512DGGR Datasheet
Delivery:
DHL FedEx Ups TNT EMS
Payment:
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ECAD Model:
More Information:
SN74LVT18512DGGR more Information SN74LVT18512DGGR Product Details
Product Attribute
Attribute Value
Manufacturer:
Texas Instruments
Product Category:
Specialty Function Logic
RoHS:
Y
Series:
SN74LVT18512
Operating Supply Voltage:
2.7 V to 3.6 V
Minimum Operating Temperature:
- 40 C
Maximum Operating Temperature:
+ 85 C
Package / Case:
TSSOP-64
Packaging:
Reel
Function:
Scan Test Device with Universal Bus Transceiver
Number of Circuits:
2
Operating Temperature Range:
- 40 C to + 85 C
Brand:
Texas Instruments
Mounting Style:
SMD/SMT
Product Type:
Specialty Function Logic
Propagation Delay Time:
6.8 ns
Factory Pack Quantity:
2000
Subcategory:
Logic ICs
Tradename:
SCOPE
Unit Weight:
0.009263 oz
Tags
SN74LVT1851, SN74LVT185, SN74LVT18, SN74LVT1, SN74LVT, SN74LV, SN74L, SN74, SN7
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We guarantee 100% customer satisfaction.

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We provide 90-360 days warranty.

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Step1: Vacuum Packaging with PL
Step1:
Vacuum Packaging with PL
Step2: Anti-Static Bag
Step2:
Anti-Static Bag
Step3: Packaging Boxes
Step3:
Packaging Boxes
***as Instruments
3.3-V ABT Scan Test Devices With 18-Bit Universal Bus Transceivers 64-TSSOP -40 to 85
***p One Stop Japan
Bus XCVR Dual 18-CH 3-ST 64-Pin TSSOP T/R
***nell
SCAN TEST DEVICE, TSSOP-64, FULL REEL
***i-Key
IC SCAN TEST UNIV TXRX 64TSSOP
***et
SCOPE 18-BIT UNIV BUS TRANSCEIVER
***ark
Scan Test Device, Tssop-64, Full Reel; No. Of Channels:9Channels; Output Current:-; Logic Type:scan Test Device With Universal Bus Transceivers; Input Level:2V; No. Of Pins:64Pins; Logic Case Style:tssop; Supply Voltage Min:2.7V Rohs Compliant: Yes
***
The 'LVT18512 and 'LVT182512 scan test devices with 18-bit universal bus transceivers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.
***AS
Additionally, these devices are designed specifically for low-voltage (3.3-V) VCC operation, but with the capability to provide a TTL interface to a 5-V system environment.
***AS INST
In the normal mode, these devices are 18-bit universal bus transceivers that combine D-type latches and D-type flip-flops to allow data flow in transparent, latched, or clocked modes. They can be used either as two 9-bit transceivers or one 18-bit transceiver. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self test on the boundary-test cells. Activating the TAP in the normal mode does not affect the functional operation of the SCOPETM universal bus transceivers.
***ASI
Data flow in each direction is controlled by output-enable (OEAB\ and OEBA\), latch-enable (LEAB and LEBA), and clock (CLKAB and CLKBA) inputs. For A-to-B data flow, the devices operate in the transparent mode when LEAB is high. When LEAB is low, the A data is latched while CLKAB is held at a static low or high logic level. Otherwise, if LEAB is low, A data is stored on a low-to-high transition of CLKAB. When OEAB\ is low, the B outputs are active. When OEAB\ is high, the B outputs are in the high-impedance state. B-to-A data flow is similar to A-to-B data flow but uses the OEBA\, LEBA, and CLKBA inputs.
***AS INS
In the test mode, the normal operation of the SCOPETM universal bus transceivers is inhibited, and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry performs boundary-scan test operations according to the protocol described in IEEE Std 1149.1-1990.
***AS INSTUMENTS
Four dedicated test pins are used to observe and control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface.
***AS
The B-port outputs of 'LVT182512, which are designed to source or sink up to 12 mA, include equivalent 25- series resistors to reduce overshoot and undershoot.
***AS INSTRU
The SN54LVT18512 and SN54LVT182512 are characterized for operation over the full military temperature range of -55°C to 125°C. The SN74LVT18512 and SN74LVT182512 are characterized for operation from -40°C to 85°C.
Part # Description Stock Price
SN74LVT18512DGGR
DISTI # V72:2272_07360010
Bus XCVR Dual 18-CH 3-ST 64-Pin TSSOP T/R
RoHS: Compliant
144
  • 100:$5.3140
  • 25:$5.9810
  • 10:$6.3580
  • 1:$7.0540
SN74LVT18512DGGR
DISTI # 296-8646-1-ND
IC SCAN TEST UNIV TXRX 64TSSOP
RoHS: Compliant
Min Qty: 1
Container: Cut Tape (CT)
1255In Stock
  • 1000:$4.3189
  • 500:$4.9587
  • 100:$5.6945
  • 10:$6.8780
  • 1:$7.6100
SN74LVT18512DGGR
DISTI # 296-8646-6-ND
IC SCAN TEST UNIV TXRX 64TSSOP
RoHS: Compliant
Min Qty: 1
Container: Digi-Reel®
1255In Stock
  • 1000:$4.3189
  • 500:$4.9587
  • 100:$5.6945
  • 10:$6.8780
  • 1:$7.6100
SN74LVT18512DGGR
DISTI # 296-8646-2-ND
IC SCAN TEST UNIV TXRX 64TSSOP
RoHS: Compliant
Min Qty: 2000
Container: Tape & Reel (TR)
Temporarily Out of Stock
  • 2000:$4.0378
SN74LVT18512DGGR
DISTI # 25776957
Bus XCVR Dual 18-CH 3-ST 64-Pin TSSOP T/R
RoHS: Compliant
144
  • 100:$5.3140
  • 25:$5.9810
  • 10:$6.3580
  • 2:$7.0540
SN74LVT18512DGGR
DISTI # SN74LVT18512DGGR
Bus XCVR Dual 18-CH 3-ST 64-Pin TSSOP T/R (Alt: SN74LVT18512DGGR)
RoHS: Compliant
Min Qty: 2000
Container: Tape and Reel
Asia - 0
    SN74LVT18512DGGR
    DISTI # SN74LVT18512DGGR
    Bus XCVR Dual 18-CH 3-ST 64-Pin TSSOP T/R (Alt: SN74LVT18512DGGR)
    RoHS: Compliant
    Min Qty: 2000
    Container: Tape and Reel
    Europe - 0
    • 2000:€5.1900
    • 4000:€4.5900
    • 8000:€4.0900
    • 12000:€3.8900
    • 20000:€3.6900
    SN74LVT18512DGGR
    DISTI # SN74LVT18512DGGR
    Bus XCVR Dual 18-CH 3-ST 64-Pin TSSOP T/R - Tape and Reel (Alt: SN74LVT18512DGGR)
    RoHS: Compliant
    Min Qty: 2000
    Container: Reel
    Americas - 0
    • 2000:$4.4900
    • 4000:$4.1900
    • 8000:$4.0900
    • 12000:$3.9900
    • 20000:$3.7900
    SN74LVT18512DGGR
    DISTI # 76C4591
    SCAN TEST DEVICE, TSSOP-64, FULL REEL,No. of Channels:9Channels,Output Current:-,Logic Type:Scan Test Device with Universal Bus Transceivers,Input Level:2V,No. of Pins:64Pins,Logic Case Style:TSSOP,Supply Voltage Min:2.7V RoHS Compliant: Yes2000
    • 1:$4.0400
    • 2000:$4.0400
    SN74LVT18512DGGR3.3-V ABT Scan Test Devices With 18-Bit Universal Bus Transceivers6000
    • 1000:$3.5300
    • 750:$3.6000
    • 500:$4.1600
    • 250:$4.7800
    • 100:$5.1300
    • 25:$5.7200
    • 10:$6.1200
    • 1:$6.8000
    SN74LVT18512DGGRMicroprocessor Circuit, CMOS, PDSO64
    RoHS: Compliant
    1684
    • 1000:$4.0900
    • 500:$4.3100
    • 100:$4.4800
    • 25:$4.6800
    • 1:$5.0400
    SN74LVT18512DGGR
    DISTI # 595-SN74LVT18512DGGR
    Specialty Function Logic 3.3-V ABT w/18-Bit Univ Bus Transceiver
    RoHS: Compliant
    1443
    • 1:$7.3900
    • 10:$6.6800
    • 25:$6.1900
    • 100:$5.5300
    • 250:$5.2500
    • 500:$4.8200
    • 1000:$4.2000
    • 2000:$4.0400
    SN74LVT18512DGGR 40
    • 32:$7.4542
    • 9:$8.0586
    • 1:$12.0879
    SN74LVT18512DGGR
    DISTI # C1S746202505863
    Bus XCVR Dual 18-CH 3-ST 64-Pin TSSOP T/R
    RoHS: Compliant
    144
    • 1:$4.7100
    SN74LVT18512DGGR
    DISTI # C1S746200212039
    Bus XCVR Dual 18-CH 3-ST 64-Pin TSSOP T/R
    RoHS: Compliant
    144
    • 100:$5.3140
    • 25:$5.9810
    • 10:$6.3580
    • 1:$7.0540
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    Stock:
    Available
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    1984
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