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SN74ABT18640DLRG4

SN74ABT18640DLRG4
Mfr. #:
SN74ABT18640DLRG4
Description:
Specialty Function Logic Device w/18-Bit Inv Bus Transceiver
Lifecycle:
New from this manufacturer.
Datasheet:
SN74ABT18640DLRG4 Datasheet
Delivery:
DHL FedEx Ups TNT EMS
Payment:
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ECAD Model:
More Information:
SN74ABT18640DLRG4 more Information SN74ABT18640DLRG4 Product Details
Product Attribute
Attribute Value
Manufacturer:
Texas Instruments
Product Category:
Specialty Function Logic
RoHS:
Y
Product:
Boundry Scan JTAG Logic
Series:
74AB
Operating Supply Voltage:
4.5 V to 5.5 V
Package / Case:
SSOP-56
Packaging:
Reel
Brand:
Texas Instruments
Mounting Style:
SMD/SMT
Product Type:
Specialty Function Logic
Factory Pack Quantity:
1
Subcategory:
Logic ICs
Unit Weight:
0.024508 oz
Tags
SN74ABT18640DL, SN74ABT18640, SN74ABT1864, SN74ABT186, SN74ABT18, SN74ABT1, SN74AB, SN74A, SN74, SN7
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Step1: Vacuum Packaging with PL
Step1:
Vacuum Packaging with PL
Step2: Anti-Static Bag
Step2:
Anti-Static Bag
Step3: Packaging Boxes
Step3:
Packaging Boxes
***i-Key
IC SCAN TEST DEVICE 18BIT 56SSOP
***as Instruments
The 'ABT18640 scan test devices with 18-bit inverting bus transceivers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface. In the normal mode, these devices are 18-bit inverting bus transceivers. They can be used either as two 9-bit transceivers or one 18-bit transceiver. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self test on the boundary-test cells. Activating the TAP in the normal mode does not affect the functional operation of the SCOPETM bus transceivers. Data flow is controlled by the direction-control (DIR) and output-enable () inputs. Data transmission is allowed from the A bus to the B bus or from the B bus to the A bus, depending on the logic level at DIR. can be used to disable the device so that the buses are effectively isolated. In the test mode, the normal operation of the SCOPETM bus transceivers is inhibited and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry can perform boundary-scan test operations according to the protocol described in IEEE Standard 1149.1-1990. Four dedicated test pins observe and control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface. The SN74ABT18640 is available in TI's shrink small-outline (DL) and thin shrink small-outline (DGG) packages, which provide twice the I/O pin count and functionality of standard small-outline packages in the same printed-circuit-board area. The SN54ABT18640 is characterized for operation over the full military temperature range of -55°C to 125°C. The SN74ABT18640 is characterized for operation from -40°C to 85°C.
Part # Description Stock Price
SN74ABT18640DLRG4
DISTI # SN74ABT18640DLRG4-ND		IC SCAN TEST DEVICE 18BIT 56SSOP
RoHS: Compliant
Min Qty: 1000
Container: Tape & Reel (TR)		Limited Supply - Call
    SN74ABT18640DLRG4
    DISTI # 595-SN74ABT18640DLRG    		Specialty Function Logic Device w/18-Bit Inv Bus Transceiver
    RoHS: Compliant    		0
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      Availability
      Stock:
      Available
      On Order:
      4000
      Enter Quantity:
      Current price of SN74ABT18640DLRG4 is for reference only, if you want to get best price, please submit a inquiry or direct email to our sales team sales@omo-ic.com
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