Texas Instruments' ADC32RF45 device is a 14-bit, 3 GSPS, dual-channel, analog-to-digital converter (ADC) that supports RF sampling with input frequencies up to 4 GHz and beyond. Designed for high signal-to-noise ratio (SNR), the ADC32RF45 delivers a noise spectral density of -155 dBFS/Hz as well as dynamic range and channel isolation over a large input frequency range. The buffered analog input with on-chip termination provides uniform input impedance across a wide frequency range and minimizes sample-and-hold glitch energy.

Each ADC channel can be connected to a dual-band, digital down-converter (DDC) with up to three independent, 16-bit numerically controlled oscillators (NCOs) per DDC for phase-coherent frequency hopping. Additionally, the ADC is equipped with front-end peak and RMS power detectors and alarm functions to support external automatic gain control (AGC) algorithms.

The ADC32RF45 supports the JESD204B serial interface with subclass 1-based deterministic latency using data rates up to 12.5 Gbps with up to four lanes per ADC. The device is offered in a 72-pin VQFN package (10 mm x 10 mm) and supports the industrial temperature range (-40°C to +85°C).

TI Design Link: Efficient, LDO-Less, Power-Supply Network Reference Design for RF-Sampling ADC