8V182512IDGGREP

8V182512IDGGREP
Mfr. #:
8V182512IDGGREP
Description:
Specialty Function Logic Mil Enhanced 3.3V ABT Scan Test Device
Lifecycle:
New from this manufacturer.
Datasheet:
8V182512IDGGREP Datasheet
Delivery:
DHL FedEx Ups TNT EMS
Payment:
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ECAD Model:
More Information:
8V182512IDGGREP more Information 8V182512IDGGREP Product Details
Product Attribute
Attribute Value
Manufacturer:
Texas Instruments
Product Category:
Specialty Function Logic
RoHS:
Y
Series:
SN74LVTH182512-EP
Operating Supply Voltage:
3.3 V
Minimum Operating Temperature:
- 40 C
Maximum Operating Temperature:
+ 85 C
Package / Case:
TSSOP-64
Packaging:
Reel
Function:
Scan Test Device with Universal Bus Transceiver
Number of Circuits:
2
Operating Temperature Range:
- 40 C to + 85 C
Brand:
Texas Instruments
Mounting Style:
SMD/SMT
Product Type:
Specialty Function Logic
Propagation Delay Time:
7.7 ns
Factory Pack Quantity:
2000
Subcategory:
Logic ICs
Part # Aliases:
V62/04730-01XE
Unit Weight:
0.009263 oz
Tags
8V18, 8V1
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Step1: Vacuum Packaging with PL
Step1:
Vacuum Packaging with PL
Step2: Anti-Static Bag
Step2:
Anti-Static Bag
Step3: Packaging Boxes
Step3:
Packaging Boxes
***as Instruments
Enhanced Product 3.3-V Abt Scan Test Devices With 18-Bit Universal Bus Transceivers 64-TSSOP -40 to 85
***et
Bus XCVR Dual 18-CH 3-ST 64-Pin TSSOP T/R
***i-Key
IC ABT SCAN TEST DEV3.3V 64TSSOP
***AS INSRUMENTS
The SN74LVTH18512 and SN74LVTH182512 scan test devices with 18-bit universal bus transceivers are members of the Texas Instruments SCOPE™ testability integrated-circuit family. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.
***AS INSTRUMENTS INC
Additionally, these devices are designed specifically for low-voltage (3.3-V) VCC operation, but with the capability to provide a TTL interface to a 5-V system environment.
***ASIN
In the normal mode, these devices are 18-bit universal bus transceivers that combine D-type latches and D-type flip-flops to allow data flow in transparent, latched, or clocked modes. They can be used either as two 9-bit transceivers or one 18-bit transceiver. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self test on the boundary-test cells. Activating the TAP in the normal mode does not affect the functional operation of the SCOPE™ universal bus transceivers.
***AS INSTRUMENT
Data flow in each direction is controlled by output-enable (OEAB\ and OEBA\), latch-enable (LEAB and LEBA), and clock (CLKAB and CLKBA) inputs. For A-to-B data flow, the devices operate in the transparent mode when LEAB is high. When LEAB is low, the A data is latched while CLKAB is held at a static low or high logic level. Otherwise, if LEAB is low, A data is stored on a low-to-high transition of CLKAB. When OEAB\ is low, the B outputs are active. When OEAB\ is high, the B outputs are in the high-impedance state. B-to-A data flow is similar to A-to-B data flow but uses the OEBA\, LEBA, and CLKBA inputs.
***AS INST
In the test mode, the normal operation of the SCOPE™ universal bus transceivers is inhibited, and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry performs boundary-scan test operations according to the protocol described in IEEE Std 1149.1-1990.
***XS
Four dedicated test pins are used to observe and control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface.
***AS INSRUMENTS
Active bus-hold circuitry is provided to hold unused or floating data inputs at a valid logic level.
***as Instruments (TI)
The B-port outputs of SN74LVTH182512, which are designed to source or sink up to 12 mA, include equivalent 25- series resistors to reduce overshoot and undershoot.
Logic Solutions
OMO Electronic Logic Solutions offers a full spectrum of logic functions and technologies from the mature to the advanced, including bipolar, BiCMOS, and CMOS. TI's process technologies offer the logic performance and features required for modern logic designs, while maintaining support for more traditional logic products.Learn More
Part # Description Stock Price
8V182512IDGGREP
DISTI # 296-22075-1-ND
IC ABT SCAN TEST DEV3.3V 64TSSOP
RoHS: Compliant
Min Qty: 1
Container: Cut Tape (CT)
1991In Stock
  • 500:$12.3961
  • 100:$13.9349
  • 10:$16.5000
  • 1:$17.9500
8V182512IDGGREP
DISTI # 296-22075-6-ND
IC ABT SCAN TEST DEV3.3V 64TSSOP
RoHS: Compliant
Min Qty: 1
Container: Digi-Reel®
1991In Stock
  • 500:$12.3961
  • 100:$13.9349
  • 10:$16.5000
  • 1:$17.9500
8V182512IDGGREP
DISTI # 296-22075-2-ND
IC ABT SCAN TEST DEV3.3V 64TSSOP
RoHS: Compliant
Min Qty: 2000
Container: Tape & Reel (TR)
Temporarily Out of Stock
  • 2000:$10.6240
8V182512IDGGREP
DISTI # 8V182512IDGGREP
Bus XCVR Dual 18-CH 3-ST 64-Pin TSSOP T/R - Tape and Reel (Alt: 8V182512IDGGREP)
RoHS: Compliant
Min Qty: 2000
Container: Reel
Americas - 0
  • 2000:$11.9900
  • 4000:$11.3900
  • 8000:$10.9900
  • 12000:$10.6900
  • 20000:$10.3900
8V182512IDGGREPEnhanced Product 3.3-V Abt Scan Test Devices With 18-Bit Universal Bus Transceivers4000
  • 1000:$9.4300
  • 750:$9.4600
  • 500:$10.5400
  • 250:$11.4500
  • 100:$12.0400
  • 25:$13.7800
  • 10:$14.2800
  • 1:$15.3600
8V182512IDGGREP
DISTI # 595-8V182512IDGGREP
Specialty Function Logic Mil Enhanced 3.3V ABT Scan Test Device
RoHS: Compliant
0
  • 2000:$11.0400
V62/04730-01XE
DISTI # 595-V62/04730-01XE
Specialty Function Logic Mil Enhanced 3.3V ABT Scan Test Device
RoHS: Compliant
0
    Image Part # Description
    8V182512IDGGREP

    Mfr.#: 8V182512IDGGREP

    OMO.#: OMO-8V182512IDGGREP

    Specialty Function Logic Mil Enhanced 3.3V ABT Scan Test Device
    8V182512IDGGREP

    Mfr.#: 8V182512IDGGREP

    OMO.#: OMO-8V182512IDGGREP-TEXAS-INSTRUMENTS

    Specialty Function Logic Mil Enhanced 3.3V ABT Scan Test Device
    Availability
    Stock:
    Available
    On Order:
    5000
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    Current price of 8V182512IDGGREP is for reference only, if you want to get best price, please submit a inquiry or direct email to our sales team sales@omo-ic.com
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