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SN74ABTH182652APM

SN74ABTH182652APM
Mfr. #:
SN74ABTH182652APM
Description:
Specialty Function Logic Device w/18-Bit Trnscvr & Register
Lifecycle:
New from this manufacturer.
Datasheet:
SN74ABTH182652APM Datasheet
Delivery:
DHL FedEx Ups TNT EMS
Payment:
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ECAD Model:
More Information:
SN74ABTH182652APM more Information SN74ABTH182652APM Product Details
Product Attribute
Attribute Value
Manufacturer:
Texas Instruments
Product Category:
Specialty Function Logic
RoHS:
Y
Product:
Boundry Scan JTAG Logic
Series:
SN74ABTH182652A
Minimum Operating Temperature:
- 40 C
Maximum Operating Temperature:
+ 85 C
Package / Case:
LQFP-64
Packaging:
Tray
Operating Temperature Range:
- 40 C to + 85 C
Brand:
Texas Instruments
Mounting Style:
SMD/SMT
Moisture Sensitive:
Yes
Product Type:
Specialty Function Logic
Factory Pack Quantity:
160
Subcategory:
Logic ICs
Tradename:
SCOPE
Unit Weight:
0.012088 oz
Tags
SN74ABTH1826, SN74ABTH182, SN74ABTH18, SN74ABTH1, SN74ABTH, SN74AB, SN74A, SN74, SN7
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We guarantee 100% customer satisfaction.

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We provide 90-360 days warranty.

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Step1: Vacuum Packaging with PL
Step1:
Vacuum Packaging with PL
Step2: Anti-Static Bag
Step2:
Anti-Static Bag
Step3: Packaging Boxes
Step3:
Packaging Boxes
    N***n
    N***n
    UA

    Good inexpensive settlement!

    2019-07-12
    E**y
    E**y
    IT

    Perfect

    2019-07-09
    E**d
    E**d
    RU

    Capacitors good i will still order, came for a month the track was not tracked

    2019-05-16
*** Stop Electro
Boundary Scan Reg Bus Transceiver, ABT Series, 2-Func, 9-Bit, True Output, BICMOS, PQFP64
***as Instruments
Scan Test Devices With 18-Bit Transceivers And egisters 64-LQFP -40 to 85
***ark
Specialty Logic IC; Logic Family:ABT; Supply Voltage Min:4.5V; Supply Voltage Max:5.5V; Package/Case:64-LQFP; No. of Pins:64; Operating Temperature Range:-40°C to +85°C; Input Type:TTL; Leaded Process Compatible:Yes ;RoHS Compliant: Yes
***ASIN
The 'ABTH18652A and 'ABTH182652A scan test devices with 18-bit bus transceivers and registers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.
***
In the normal mode, these devices are 18-bit bus transceivers and registers that allow for multiplexed transmission of data directly from the input bus or from the internal registers. They can be used either as two 9-bit transceivers or one 18-bit transceiver. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self test on the boundary-test cells. Activating the TAP in the normal mode does not affect the functional operation of the SCOPETM bus transceivers and registers.
***
Data flow in each direction is controlled by clock (CLKAB and CLKBA), select (SAB and SBA), and output-enable (OEAB and ) inputs. For A-to-B data flow, data on the A bus is clocked into the associated registers on the low-to-high transition of CLKAB. When SAB is low, real-time A data is selected for presentation to the B bus (transparent mode). When SAB is high, stored A data is selected for presentation to the B bus (registered mode). When OEAB is high, the B outputs are active. When OEAB is low, the B outputs are in the high-impedance state. Control for B-to-A data flow is similar to that for A-to-B data flow, but uses CLKBA, SBA, and inputs. Since the input is active-low, the A outputs are active when is low and are in the high-impedance state when is high. Figure 1 illustrates the four fundamental bus-management functions that are performed with the 'ABTH18652A and 'ABTH182652A.
***AS INS
 
***TEXAS
In the test mode, the normal operation of the SCOPETM bus transceivers and registers is inhibited, and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry performs boundary-scan test operations according to the protocol described in IEEE Standard 1149.1-1990.
***AS USD
Four dedicated test pins observe and control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface.
***AS INSTRUM
Improved scan efficiency is accomplished through the adoption of a one boundary-scan cell (BSC) per I/O pin architecture. This architecture is implemented in such a way as to capture the most pertinent test data. A PSA/COUNT instruction is also included to ease the testing of memories and other circuits where a binary count addressing scheme is useful.
***
Active bus-hold circuitry holds unused or floating data inputs at a valid logic level.
***AS INSTRUMENTS INC
The B-port outputs of 'ABTH182652A, which are designed to source or sink up to 12 mA, include 25- series resistors to reduce overshoot and undershoot.
***XS
The SN54ABTH18652A and SN54ABTH182652A are characterized for operation over the full military temperature range of -55°C to 125°C. The SN74ABTH18652A and SN74ABTH182652A are characterized for operation from -40°C to 85°C.
***AS INSTUMENTS
 
***as Instr.
 
Logic Solutions
OMO Electronic Logic Solutions offers a full spectrum of logic functions and technologies from the mature to the advanced, including bipolar, BiCMOS, and CMOS. TI's process technologies offer the logic performance and features required for modern logic designs, while maintaining support for more traditional logic products.Learn More
Part # Description Stock Price
SN74ABTH182652APM
DISTI # SN74ABTH182652APM-ND		IC SCAN TEST DEVICE 18BIT 64LQFP
RoHS: Compliant
Min Qty: 160
Container: Tray		Temporarily Out of Stock
  • 160:$15.8931
SN74ABTH182652APM
DISTI # SN74ABTH182652APM		Bus XCVR Dual 18-CH 3-ST 64-Pin LQFP Tray - Trays (Alt: SN74ABTH182652APM)
RoHS: Compliant
Min Qty: 160
Container: Tray		Americas - 0
  • 160:$17.3900
  • 320:$16.9900
  • 640:$16.2900
  • 960:$15.8900
  • 1600:$15.5900
SN74ABTH182652APM
DISTI # SN74ABTH182652APM		Bus XCVR Dual 18-CH 3-ST 64-Pin LQFP Tray (Alt: SN74ABTH182652APM)
RoHS: Compliant
Min Qty: 1
Container: Tray		Europe - 0
  • 1:€16.5900
  • 10:€15.6900
  • 25:€14.9900
  • 50:€14.2900
  • 100:€13.5900
  • 500:€13.0900
  • 1000:€12.4900
SN74ABTH182652APM
DISTI # 595-SN74ABTH182652AP		Specialty Function Logic Device w/18-Bit Trnscvr & Register
RoHS: Compliant		0
  • 1:$20.1800
  • 5:$19.3500
  • 10:$18.6200
  • 25:$17.7800
  • 100:$15.9000
  • 250:$15.1700
  • 500:$14.4300
SN74ABTH182652APMBoundary Scan Reg Bus Transceiver, ABT Series, 2-Func, 9-Bit, True Output, BICMOS, PQFP64
RoHS: Compliant		2400
  • 1000:$13.7600
  • 500:$14.4900
  • 100:$15.0800
  • 25:$15.7300
  • 1:$16.9400
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Availability
Stock:
Available
On Order:
3000
Enter Quantity:
Current price of SN74ABTH182652APM is for reference only, if you want to get best price, please submit a inquiry or direct email to our sales team sales@omo-ic.com
Reference price (USD)
Quantity
Unit Price
Ext. Price
1
$20.18
$20.18
5
$19.35
$96.75
10
$18.62
$186.20
25
$17.78
$444.50
100
$15.90
$1 590.00
250
$15.17
$3 792.50
500
$14.43
$7 215.00
Due to semiconductor in short supply from 2021,below price is the Normal price before 2021.please send inquire to confirm.
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