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SN74ABTH18646APM

SN74ABTH18646APM
Mfr. #:
SN74ABTH18646APM
Description:
Specialty Function Logic Device w/18-Bit Trnscvr & Register
Lifecycle:
New from this manufacturer.
Datasheet:
SN74ABTH18646APM Datasheet
Delivery:
DHL FedEx Ups TNT EMS
Payment:
T/T Paypal Visa MoneyGram Western Union
ECAD Model:
More Information:
SN74ABTH18646APM more Information SN74ABTH18646APM Product Details
Product Attribute
Attribute Value
Manufacturer:
Texas Instruments
Product Category:
Specialty Function Logic
RoHS:
Y
Series:
SN74ABTH18646A
Operating Supply Voltage:
5 V
Minimum Operating Temperature:
- 40 C
Maximum Operating Temperature:
+ 85 C
Package / Case:
LQFP-64
Packaging:
Tray
Function:
Scan Test Device with Bus Transceiver / Register
Number of Circuits:
2
Operating Temperature Range:
- 40 C to + 85 C
Brand:
Texas Instruments
Mounting Style:
SMD/SMT
Moisture Sensitive:
Yes
Product Type:
Specialty Function Logic
Propagation Delay Time:
5.8 ns
Factory Pack Quantity:
160
Subcategory:
Logic ICs
Tradename:
SCOPE
Unit Weight:
0.012088 oz
Tags
SN74ABTH186, SN74ABTH18, SN74ABTH1, SN74ABTH, SN74AB, SN74A, SN74, SN7
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We guarantee 100% customer satisfaction.

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We provide 90-360 days warranty.

If the items you received were not in perfect quality, we would be responsible for your refund or replacement, but the items must be returned in their original condition.
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Step1: Vacuum Packaging with PL
Step1:
Vacuum Packaging with PL
Step2: Anti-Static Bag
Step2:
Anti-Static Bag
Step3: Packaging Boxes
Step3:
Packaging Boxes
*** Stop Electro
Boundary Scan Reg Bus Transceiver, ABT Series, 2-Func, 9-Bit, True Output, BICMOS, PQFP64
***as Instruments
Scan Test Devices With 18-Bit Transceivers And egisters 64-LQFP -40 to 85
***ow.cn
Scan Test Device -40°C to 85°C 64-Pin LQFP Tray
***et
Bus XCVR Dual 18-CH 3-ST 64-Pin LQFP Tray
***DA Technology Co., Ltd.
Product Description Demo for Development.
***i-Key Marketplace
SN74ABTH18646A SCAN TEST DEVICES
*** Stop Electro
Boundary Scan Reg Bus Transceiver, ABT Series, 2-Func, 9-Bit, True Output, BICMOS, PQFP64
***as Instruments
Scan Test Devices With 18-Bit Bus Transceivers And egisters 64-LQFP -40 to 85
***ark
Specialty Logic IC; Logic Family:ABT; Supply Voltage Min:4.5V; Supply Voltage Max:5.5V; Package/Case:64-LQFP; No. of Pins:64; Operating Temperature Range:-40°C to +85°C; Input Type:TTL; Leaded Process Compatible:Yes ;RoHS Compliant: Yes
*** Stop Electro
Boundary Scan Reg Bus Transceiver, ABT Series, 2-Func, 9-Bit, True Output, BICMOS, PQFP64
***as Instruments
Scan Test Devices With 18-Bit Bus Transceivers And egisters 64-LQFP -40 to 85
***ark
Specialty Logic IC; Logic Family:ABT; Supply Voltage Min:4.5V; Supply Voltage Max:5.5V; Package/Case:64-LQFP; No. of Pins:64; Operating Temperature Range:-40°C to +85°C; Input Type:TTL; Leaded Process Compatible:Yes ;RoHS Compliant: Yes
*** Stop Electro
Boundary Scan Reg Bus Transceiver, ABT Series, 1-Func, 20-Bit, True Output, BICMOS, PQFP64
***as Instruments
Scan Test Devices With 20-Bit Universal Bus Transceivers 64-LQFP -40 to 85
***ark
Specialty Logic IC; Logic Family:ABT; Supply Voltage Min:4.5V; Supply Voltage Max:5.5V; Package/Case:64-LQFP; No. of Pins:64; Operating Temperature Range:-40°C to +85°C; Input Type:TTL; Leaded Process Compatible:Yes ;RoHS Compliant: Yes
***
The 'ABTH18646A and 'ABTH182646A scan test devices with 18-bit bus transceivers and registers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.
***TEXAS
In the normal mode, these devices are 18-bit bus transceivers and registers that allow for multiplexed transmission of data directly from the input bus or from the internal registers. They can be used either as two 9-bit transceivers or one 18-bit transceiver. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self test on the boundary-test cells. Activating the TAP in the normal mode does not affect the functional operation of the SCOPETM bus transceivers and registers.
***AS INSRUMENTS
Transceiver function is controlled by output-enable () and direction (DIR) inputs. When is low, the transceiver is active and operates in the A-to-B direction when DIR is high or in the B-to-A direction when DIR is low. When is high, both the A and B outputs are in the high-impedance state, effectively isolating both buses.
***
Data flow is controlled by clock (CLKAB and CLKBA) and select (SAB and SBA) inputs. Data on the A bus is clocked into the associated registers on the low-to-high transition of CLKAB. When SAB is low, real-time A data is selected for presentation to the B bus (transparent mode). When SAB is high, stored A data is selected for presentation to the B bus (registered mode). The function of the CLKBA and SBA inputs mirrors that of CLKAB and SAB, respectively. Figure 1 shows the four fundamental bus-management functions that are performed with the 'ABTH18646A and 'ABTH182646A.
***AS USD
 
***AS INSTRUMEN
In the test mode, the normal operation of the SCOPETM bus transceivers and registers is inhibited, and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry performs boundary-scan test operations according to the protocol described in IEEE Standard 1149.1-1990.
***OMO Electronic
Four dedicated test pins observe and control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface.
***AS INSTRUMENTS INC
Improved scan efficiency is accomplished through the adoption of a one boundary-scan cell (BSC) per I/O pin architecture. This architecture is implemented in such a way as to capture the most pertinent test data. A PSA/COUNT instruction also is included to ease the testing of memories and other circuits where a binary count addressing scheme is useful.
***AS INSTRUMEN
Active bus-hold circuitry holds unused or floating data inputs at a valid logic level.
***TEXAS
The B-port outputs of 'ABTH182646A, which are designed to source or sink up to 12 mA, include 25- series resistors to reduce overshoot and undershoot.
***as Instr.
The SN54ABTH18646A and SN54ABTH182646A are characterized for operation over the full military temperature range of -55°C to 125°C. The SN74ABTH18646A and SN74ABTH182646A are characterized for operation from -40°C to 85°C.
***AS INSTRUM
 
***OMO Electronic
 
***as Instr.
The data-output functions can be enabled or disabled by various signals at and DIR. Data-input functions are always enabled; i.e., data at the bus pins is stored on every low-to-high transition of the clock inputs.
Logic Solutions
OMO Electronic Logic Solutions offers a full spectrum of logic functions and technologies from the mature to the advanced, including bipolar, BiCMOS, and CMOS. TI's process technologies offer the logic performance and features required for modern logic designs, while maintaining support for more traditional logic products.Learn More
Part # Description Stock Price
SN74ABTH18646APM
DISTI # 29459251		Bus XCVR Dual 18-CH 3-ST 64-Pin LQFP Tray
RoHS: Compliant		8320
  • 500:$11.1460
  • 160:$12.5296
SN74ABTH18646APM
DISTI # 296-4136-ND		IC SCAN-TEST-DEV/TXRX 64-LQFP
RoHS: Compliant
Min Qty: 1
Container: Tray		210In Stock
  • 640:$12.3844
  • 160:$13.9218
  • 25:$15.8008
  • 10:$16.4840
  • 1:$17.9400
SN74ABTH18646APM
DISTI # SN74ABTH18646APM		Bus XCVR Dual 18-CH 3-ST 64-Pin LQFP Tray (Alt: SN74ABTH18646APM)
RoHS: Compliant
Min Qty: 160
Container: Tray		Asia - 0
    SN74ABTH18646APM
    DISTI # SN74ABTH18646APM    		Bus XCVR Dual 18-CH 3-ST 64-Pin LQFP Tray (Alt: SN74ABTH18646APM)
    RoHS: Compliant
    Min Qty: 1
    Container: Tray    		Europe - 0
    • 1:€13.4900
    • 10:€12.8900
    • 25:€12.1900
    • 50:€11.6900
    • 100:€11.0900
    • 500:€10.6900
    • 1000:€10.1900
    SN74ABTH18646APM
    DISTI # SN74ABTH18646APM    		Bus XCVR Dual 18-CH 3-ST 64-Pin LQFP Tray - Rail/Tube (Alt: SN74ABTH18646APM)
    RoHS: Compliant
    Min Qty: 160
    Container: Tube    		Americas - 0
    • 160:$12.2900
    • 320:$11.6900
    • 640:$11.3900
    • 960:$10.9900
    • 1600:$10.6900
    SN74ABTH18646APMScan Test Devices With 18-Bit Transceivers And Registers4800
    • 1000:$9.7100
    • 750:$9.7400
    • 500:$10.8500
    • 250:$11.7900
    • 100:$12.3800
    • 25:$14.1800
    • 10:$14.6900
    • 1:$15.8000
    SN74ABTH18646APMBoundary Scan Reg Bus Transceiver, ABT Series, 2-Func, 9-Bit, True Output, BICMOS, PQFP64
    RoHS: Compliant    		20708
    • 1000:$11.2400
    • 500:$11.8300
    • 100:$12.3100
    • 25:$12.8400
    • 1:$13.8300
    SN74ABTH18646APM
    DISTI # 595-SN74ABTH18646APM    		Specialty Function Logic Device w/18-Bit Trnscvr & Register
    RoHS: Compliant    		0
    • 160:$13.9300
    • 320:$13.2400
    • 640:$12.3900
    SN74ABTH18646APMG4
    DISTI # 595-SN74ABTH18646AG4    		Specialty Function Logic Device w/18-Bit Trnscvr & Register
    RoHS: Compliant    		0
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      Availability
      Stock:
      Available
      On Order:
      3000
      Enter Quantity:
      Current price of SN74ABTH18646APM is for reference only, if you want to get best price, please submit a inquiry or direct email to our sales team sales@omo-ic.com
      Reference price (USD)
      Quantity
      Unit Price
      Ext. Price
      160
      $13.93
      $2 228.80
      320
      $13.24
      $4 236.80
      640
      $12.39
      $7 929.60
      Due to semiconductor in short supply from 2021,below price is the Normal price before 2021.please send inquire to confirm.
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