SN74BCT8240ANT

SN74BCT8240ANT
Mfr. #:
SN74BCT8240ANT
Description:
Buffers & Line Drivers Device w/Octal Inverting Buffers
Lifecycle:
New from this manufacturer.
Datasheet:
SN74BCT8240ANT Datasheet
Delivery:
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ECAD Model:
More Information:
SN74BCT8240ANT more Information SN74BCT8240ANT Product Details
Product Attribute
Attribute Value
Manufacturer:
Texas Instruments
Product Category:
Buffers & Line Drivers
RoHS:
Y
Number of Input Lines:
8 Input
Number of Output Lines:
8 Output
Polarity:
Inverting
Supply Voltage - Max:
5.5 V
Supply Voltage - Min:
4.5 V
Minimum Operating Temperature:
0 C
Maximum Operating Temperature:
+ 70 C
Mounting Style:
Through Hole
Package / Case:
PDIP-24
Packaging:
Tube
Function:
Scan Buffer/Line Driver
Height:
4.57 mm
Length:
31.64 mm
Output Type:
3-State
Quiescent Current:
35 mA
Technology:
BiCMOS
Width:
6.73 mm
Brand:
Texas Instruments
Logic Family:
BCT
Logic Type:
Boundary Scan (JTAG) Logic
Number of Channels:
8
Supply Current - Max:
52000 uA
High Level Output Current:
- 15 mA
Input Signal Type:
Single-Ended
Low Level Output Current:
64 mA
Operating Supply Voltage:
5 V
Product Type:
Buffers & Line Drivers
Propagation Delay Time:
7.5 ns at 5 V
Factory Pack Quantity:
1
Subcategory:
Logic ICs
Unit Weight:
0.131925 oz
Tags
SN74BCT8240, SN74BCT82, SN74BCT8, SN74B, SN74, SN7
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Step1: Vacuum Packaging with PL
Step1:
Vacuum Packaging with PL
Step2: Anti-Static Bag
Step2:
Anti-Static Bag
Step3: Packaging Boxes
Step3:
Packaging Boxes
***i-Key
IC SCAN TEST DEVICE BUFF 24-DIP
***ark
Specialty Logic IC; Logic Family:BCT; Supply Voltage Min:4.5V; Supply Voltage Max:5.5V; Package/Case:24-PDIP; No. of Pins:24; Operating Temperature Range:0°C to +70°C; Input Type:TTL; Leaded Process Compatible:Yes; Output Type:TTL ;RoHS Compliant: Yes
***as Instruments
The 'BCT8240A scan test devices with octal buffers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface. In the normal mode, these devices are functionally equivalent to the 'F240 and 'BCT240 octal buffers. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device terminals or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does not affect the functional operation of the SCOPETM octal buffers. In the test mode, the normal operation of the SCOPETM octal buffers is inhibited and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry can perform boundary-scan test operations, as described in IEEE Standard 1149.1-1990. Four dedicated test terminals control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface. The SN54BCT8240A is characterized for operation over the full military temperature range of -55°C to 125°C. The SN74BCT8240A is characterized for operation from 0°C to 70°C.
Part # Description Stock Price
SN74BCT8240ANT
DISTI # SN74BCT8240ANT-ND
IC SCAN TEST DEVICE BUFF 24-DIP
RoHS: Compliant
Min Qty: 60
Container: Tube
Limited Supply - Call
    SN74BCT8240ANTG4
    DISTI # SN74BCT8240ANTG4-ND
    IC SCAN TEST DEVICE BUFF 24-DIP
    RoHS: Compliant
    Min Qty: 60
    Container: Tube
    Limited Supply - Call
      SN74BCT8240ANT
      DISTI # 595-SN74BCT8240ANT
      Buffers & Line Drivers Device w/Octal Inverting Buffers
      RoHS: Compliant
      0
        SN74BCT8240ANTE4
        DISTI # 595-SN74BCT8240ANTE4
        Specialty Function Logic Device w/Octal Inverting Buffers
        RoHS: Compliant
        0
          SN74BCT8240ANTBoundary Scan Bus Driver, BCT/FBT Series, 2-Func, 4-Bit, Inverted Output, BICMOS, PDIP24
          RoHS: Compliant
          1404
          • 1000:$6.7600
          • 500:$7.1200
          • 100:$7.4100
          • 25:$7.7300
          • 1:$8.3200
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          IC SCAN TEST DEVICE BUFF 24-SOIC
          Availability
          Stock:
          Available
          On Order:
          3000
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