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SN74LVTH18504APMR

SN74LVTH18504APMR
Mfr. #:
SN74LVTH18504APMR
Description:
Specialty Function Logic 10-Bit Bus/MOS Mem Drv
Lifecycle:
New from this manufacturer.
Datasheet:
SN74LVTH18504APMR Datasheet
Delivery:
DHL FedEx Ups TNT EMS
Payment:
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ECAD Model:
More Information:
SN74LVTH18504APMR more Information SN74LVTH18504APMR Product Details
Product Attribute
Attribute Value
Manufacturer:
Texas Instruments
Product Category:
Specialty Function Logic
RoHS:
Y
Series:
SN74LVTH18504A
Operating Supply Voltage:
2.7 V to 3.6 V
Minimum Operating Temperature:
- 40 C
Maximum Operating Temperature:
+ 85 C
Package / Case:
LQFP-64
Packaging:
Reel
Function:
Scan Test Device with Universal Bus Transceiver
Number of Circuits:
1
Operating Temperature Range:
- 40 C to + 85 C
Brand:
Texas Instruments
Mounting Style:
SMD/SMT
Moisture Sensitive:
Yes
Product Type:
Specialty Function Logic
Propagation Delay Time:
7.4 ns
Factory Pack Quantity:
1000
Subcategory:
Logic ICs
Tradename:
SCOPE
Unit Weight:
0.012088 oz
Tags
SN74LVTH18504, SN74LVTH1850, SN74LVTH185, SN74LVTH18, SN74LVTH1, SN74LVTH, SN74LVT, SN74LV, SN74L, SN74, SN7
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If the items you received were not in perfect quality, we would be responsible for your refund or replacement, but the items must be returned in their original condition.
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Step1: Vacuum Packaging with PL
Step1:
Vacuum Packaging with PL
Step2: Anti-Static Bag
Step2:
Anti-Static Bag
Step3: Packaging Boxes
Step3:
Packaging Boxes
*** Stop Electro
Boundary Scan Reg Bus Transceiver, LVT Series, 1-Func, 20-Bit, True Output, BICMOS, PQFP64
***as Instruments
3.3-V ABT Scan Test Devices With 20-Bit Universal Bus Transceivers 64-LQFP -40 to 85
***ark
Specialty Logic IC; Logic Family:LVT; Supply Voltage Min:2.7V; Supply Voltage Max:3.6V; Package/Case:64-LQFP; No. of Pins:64; Operating Temperature Range:-40°C to +85°C; Input Type:TTL/CMOS; Leaded Process Compatible:Yes ;RoHS Compliant: Yes
***ASIN
The 'LVTH18504A and 'LVTH182504A scan test devices with 20-bit universal bus transceivers are members of the Texas Instruments (TI) SCOPE testability integrated-circuit family. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.
***AS INSTR
Additionally, these devices are designed specifically for low-voltage (3.3-V) VCC operation, but with the capability to provide a TTL interface to a 5-V system environment.
***AS INTRUMENTS
In the normal mode, these devices are 20-bit universal bus transceivers that combine D-type latches and D-type flip-flops to allow data flow in transparent, latched, or clocked modes. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self-test on the boundary-test cells. Activating the TAP in the normal mode does not affect the functional operation of the SCOPE universal bus transceivers.
***ASIN
Data flow in each direction is controlled by output-enable ( and ), latch-enable (LEAB and LEBA), clock-enable ( and ), and clock (CLKAB and CLKBA) inputs. For A-to-B data flow, the device operates in the transparent mode when LEAB is high. When LEAB is low, the A-bus data is latched while is high and/or CLKAB is held at a static low or high logic level. Otherwise, if LEAB is low and is low, A-bus data is stored on a low-to-high transition of CLKAB. When is low, the B outputs are active. When is high, the B outputs are in the high-impedance state. B-to-A data flow is similar to A-to-B data flow, but uses the , LEBA,, and CLKBA inputs.
***AS USD
In the test mode, the normal operation of the SCOPE universal bus transceivers is inhibited, and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry performs boundary-scan test operations according to the protocol described in IEEE Std 1149.1-1990.
***AS INTRUMENTS
 
***AS INSRUMENTS
Four dedicated test pins are used to observe and control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing functions, such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface.
***AS INTRUMENTS
Active bus-hold circuitry is provided to hold unused or floating data inputs at a valid logic level.
***AS INS
The B-port outputs of 'LVTH182504A, which are designed to source or sink up to 12 mA, include equivalent 25- series resistors to reduce overshoot and undershoot.
***AS INTRUMENTS
The SN54LVTH18504A and SN54LVTH182504A are characterized for operation over the full military temperature range of -55°C to 125°C. The SN74LVTH18504A and SN74LVTH182504A are characterized for operation from -40°C to 85°C.
***AS INSTR
 
***AS INSRUMENTS
 
***TEXAS
 
***OMO Electronic
 
***AS INSTR
 
Logic Solutions
OMO Electronic Logic Solutions offers a full spectrum of logic functions and technologies from the mature to the advanced, including bipolar, BiCMOS, and CMOS. TI's process technologies offer the logic performance and features required for modern logic designs, while maintaining support for more traditional logic products.Learn More
Part # Description Stock Price
SN74LVTH18504APMR
DISTI # 296-14933-1-ND		IC 20BIT SCAN TST DEV UBT 64LQFP
RoHS: Compliant
Min Qty: 1
Container: Cut Tape (CT)		1625In Stock
  • 500:$6.0332
  • 100:$6.9284
  • 10:$8.3690
  • 1:$9.2600
SN74LVTH18504APMR
DISTI # 296-14933-6-ND		IC 20BIT SCAN TST DEV UBT 64LQFP
RoHS: Compliant
Min Qty: 1
Container: Digi-Reel®		1625In Stock
  • 500:$6.0332
  • 100:$6.9284
  • 10:$8.3690
  • 1:$9.2600
SN74LVTH18504APMR
DISTI # 296-14933-2-ND		IC 20BIT SCAN TST DEV UBT 64LQFP
RoHS: Compliant
Min Qty: 1000
Container: Tape & Reel (TR)		Temporarily Out of Stock
  • 2000:$4.9127
  • 1000:$5.1017
SN74LVTH18504APMR
DISTI # SN74LVTH18504APMR		Bus XCVR Single 20-CH 3-ST 64-Pin LQFP T/R - Tape and Reel (Alt: SN74LVTH18504APMR)
RoHS: Compliant
Min Qty: 1000
Container: Reel		Americas - 0
  • 1000:$5.3900
  • 2000:$5.1900
  • 4000:$4.9900
  • 6000:$4.7900
  • 10000:$4.6900
SN74LVTH18504APMR3.3-V ABT Scan Test Devices With 20-Bit Universal Bus Transceivers4000
  • 1000:$4.2900
  • 750:$4.3800
  • 500:$5.0600
  • 250:$5.8200
  • 100:$6.2400
  • 25:$6.9500
  • 10:$7.4500
  • 1:$8.2800
SN74LVTH18504APM
DISTI # 595-SN74LVTH18504APM		Specialty Function Logic 3.3-V ABT w/20-Bit Univ Bus Transceiver
RoHS: Compliant		86
  • 1:$10.7900
  • 10:$9.7600
  • 25:$9.0300
  • 100:$8.0800
  • 250:$7.6700
  • 500:$7.0300
  • 1000:$6.1300
SN74LVTH18504APMR
DISTI # 595-SN74LVTH18504AMR		Specialty Function Logic 10-Bit Bus/MOS Mem Drv
RoHS: Compliant		0
  • 1000:$5.1100
SN74LVTH18504APMG4
DISTI # 595-SN74LVTH18504AG4		Specialty Function Logic 3.3-V ABT w/20-Bit Univ Bus Transceiver
RoHS: Compliant		0
    SN74LVTH18504APMRBoundary Scan Reg Bus Transceiver, LVT Series, 1-Func, 20-Bit, True Output, BICMOS, PQFP64
    RoHS: Compliant    		17200
    • 1000:$5.5600
    • 500:$5.8500
    • 100:$6.0900
    • 25:$6.3500
    • 1:$6.8400
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    OMO.#: OMO-SN74LVTH2245DBRG4-1190

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    Availability
    Stock:
    Available
    On Order:
    2500
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