SN74ABTH18504APM

Mfr. #:: SN74ABTH18504APM
Description:: Specialty Function Logic Device w/20-Bit Univ Bus Transceiver
Lifecycle:: New from this manufacturer.
Datasheet:: SN74ABTH18504APM Datasheet
Delivery:: DHL FedEx Ups TNT EMS
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More Information:: SN74ABTH18504APM more Information SN74ABTH18504APM Product Details

Product Attribute
Attribute Value

Manufacturer:: Texas Instruments

Product Category:: Specialty Function Logic

RoHS:: Y

Series:: SN74ABTH18504A

Operating Supply Voltage:: 5 V

Minimum Operating Temperature:: - 40 C

Maximum Operating Temperature:: + 85 C

Package / Case:: LQFP-64

Packaging:: Tray

Function:: Scan Test Device with Universal Bus Transceiver

Number of Circuits:: 1

Operating Temperature Range:: - 40 C to + 85 C

Brand:: Texas Instruments

Mounting Style:: SMD/SMT

Moisture Sensitive:: Yes

Product Type:: Specialty Function Logic

Propagation Delay Time:: 5 ns

Factory Pack Quantity:: 160

Subcategory:: Logic ICs

Tradename:: SCOPE

Unit Weight:: 0.012088 oz

Tags: SN74ABTH18504, SN74ABTH185, SN74ABTH18, SN74ABTH1, SN74ABTH, SN74AB, SN74A, SN74, SN7

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Quality Guarantees

We provide 90-360 days warranty.

If the items you received were not in perfect quality, we would be responsible for your refund or replacement, but the items must be returned in their original condition.
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Step1:
Vacuum Packaging with PL

Step2:
Anti-Static Bag

Step3:
Packaging Boxes

SN74ABTH18504APM Ratings and Reviews

A***v

Norm, came quickly, threw in a box

2019-03-03

E**p

Good quality. Item arrived on time.

2019-03-11

S***z

As advertised

2019-03-06

S***e

good

2019-03-18

SN74ABTH18504APM Description

***as Instruments: Scan Test Devices With 20-Bit Universal Bus Transceivers 64-LQFP -40 to 85

***p One Stop Global: Bus XCVR Single 20-CH 3-ST 64-Pin LQFP Tray

***i-Key: IC SCAN TEST UNIV TXRX 64LQFP

***ical: Scan Test Device

***ark: Specialty Logic IC; Logic Family:ABT; Supply Voltage Min:4.5V; Supply Voltage Max:5.5V; Package/Case:64-LQFP; No. of Pins:64; Operating Temperature Range:-40°C to +85°C; Input Type:TTL; Leaded Process Compatible:Yes ;RoHS Compliant: Yes

***AS INS: The 'ABTH18504A and 'ABTH182504A scan test devices with 20-bit universal bus transceivers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.

***AS INSRUMENTS: In the normal mode, these devices are 20-bit universal bus transceivers that combine D-type latches and D-type flip-flops to allow data flow in transparent, latched, or clocked modes. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self test on the boundary-test cells. Activating the TAP in the normal mode does not affect the functional operation of the SCOPETM universal bus transceivers.

***as Instruments Inc.: Data flow in each direction is controlled by output-enable ( and ), latch-enable (LEAB and LEBA), clock-enable ( and ), and clock (CLKAB and CLKBA) inputs. For A-to-B data flow, the device operates in the transparent mode when LEAB is high. When LEAB is low, the A-bus data is latched while is high and/or CLKAB is held at a static low or high logic level. Otherwise, if LEAB is low and is low, A-bus data is stored on a low-to-high transition of CLKAB. When is low, the B outputs are active. When is high, the B outputs are in the high-impedance state. B-to-A data flow is similar to A-to-B data flow, but uses the , LEBA, , and CLKBA inputs.

***as Instruments Inc.: In the test mode, the normal operation of the SCOPETM universal bus transceivers is inhibited, and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry performs boundary-scan test operations according to the protocol described in IEEE Standard 1149.1-1990.

***AS INSTRUMENTS INCORPORATED

***ASI: Four dedicated test pins observe and control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface.

***AS INSTRUMENTS INCORPORATED: Improved scan efficiency is accomplished through the adoption of a one boundary-scan cell (BSC) per I/O pin architecture. This architecture is implemented in such a way as to capture the most pertinent test data. A PSA/COUNT instruction also is included to ease the testing of memories and other circuits where a binary count addressing scheme is useful.

***AS INSTRUMENTS INCORPORATED: Active bus-hold circuitry holds unused or floating data inputs at a valid logic level.

***AS INS: The B-port outputs of 'ABTH182504A, which are designed to source or sink up to 12 mA, include 25- series resistors to reduce overshoot and undershoot.

***AS INSRUMENTS: The SN54ABTH18504A and SN54ABTH182504A are characterized for operation over the full military temperature range of -55°C to 125°C. The SN74ABTH18504A and SN74ABTH182504A are characterized for operation from -40°C to 85°C.

***XS

***AS INSTUMENTS

***AS USD: A-to-B data flow is shown. B-to-A data flow is similar but uses OEBA\, LEBA, CLKENBA\, and CLKBA.

***AS USD: Output level before the indicated steady-state input conditions were established

SN74ABTH18504APM More Information

Logic Solutions: OMO Electronic Logic Solutions offers a full spectrum of logic functions and technologies from the mature to the advanced, including bipolar, BiCMOS, and CMOS. TI's process technologies offer the logic performance and features required for modern logic designs, while maintaining support for more traditional logic products.Learn More

Market price

Part #	Description	Stock	Price
SN74ABTH18504APM DISTI # 29450248	Bus XCVR Single 20-CH 3-ST 64-Pin LQFP Tray RoHS: Compliant	480	160:$17.4300
SN74ABTH18504APM DISTI # 296-4135-ND	IC SCAN TEST UNIV TXRX 64LQFP RoHS: Compliant Min Qty: 1 Container: Tray	307In Stock	640:$13.9606 160:$15.6936 25:$17.8120 10:$18.5820 1:$20.2200
SN74ABTH18504APMR DISTI # SN74ABTH18504APMR-ND	IC SCAN TEST UNIV TXRX 64LQFP RoHS: Compliant Min Qty: 1000 Container: Tape & Reel (TR)	Limited Supply - Call
SN74ABTH18504APM DISTI # SN74ABTH18504APM	Bus XCVR Single 20-CH 3-ST 64-Pin LQFP Tray - Trays (Alt: SN74ABTH18504APM) RoHS: Compliant Min Qty: 160 Container: Tray	Americas - 0	160:$15.9900 320:$15.5900 640:$14.9900 960:$14.5900 1600:$14.3900
SN74ABTH18504APM	Scan Test Devices With 20-Bit Universal Bus Transceivers	3520	1000:$10.9400 750:$10.9800 500:$12.2300 250:$13.2900 100:$13.9600 25:$15.9800 10:$16.5600 1:$17.8100
SN74ABTH18504APM	Boundary Scan Reg Bus Transceiver, ABT Series, 1-Func, 20-Bit, True Output, BICMOS, PQFP64 RoHS: Compliant	25152	1000:$12.6700 500:$13.3400 100:$13.8900 25:$14.4800 1:$15.6000
SN74ABTH18504APM DISTI # 595-SN74ABTH18504APM	Specialty Function Logic Device w/20-Bit Univ Bus Transceiver RoHS: Compliant	184	1:$20.2200 10:$18.5900 25:$17.6200 100:$15.7000 250:$14.9300 500:$13.9700
SN74ABTH18504APMR DISTI # 595-SN74ABTH18504AMR	Specialty Function Logic Device w/20-Bit Univ Bus Transceiver RoHS: Compliant	0
SN74ABTH18504APMG4 DISTI # 595-SN74ABTH18504AG4	Specialty Function Logic Device w/20-Bit Univ Bus Transceiver RoHS: Compliant	0

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Availability

Stock:: Available
On Order:: 3500
Enter Quantity:

Current price of SN74ABTH18504APM is for reference only, if you want to get best price, please submit a inquiry or direct email to our sales team sales@omo-ic.com

Reference price (USD)

Quantity
Unit Price
Ext. Price

1: ~~$20.22~~; ~~$20.22~~

10: ~~$18.59~~; ~~$185.90~~

25: ~~$17.62~~; ~~$440.50~~

100: ~~$15.70~~; ~~$1 570.00~~

250: ~~$14.93~~; ~~$3 732.50~~

500: ~~$13.97~~; ~~$6 985.00~~

Due to semiconductor in short supply from 2021,below price is the Normal price before 2021.please send inquire to confirm.

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