SN74ABTH182646APM

SN74ABTH182646APM
Mfr. #:
SN74ABTH182646APM
Description:
Specialty Function Logic Device w/18-Bit Trnscvr & Register
Lifecycle:
New from this manufacturer.
Datasheet:
SN74ABTH182646APM Datasheet
Delivery:
DHL FedEx Ups TNT EMS
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ECAD Model:
More Information:
SN74ABTH182646APM more Information SN74ABTH182646APM Product Details
Product Attribute
Attribute Value
Manufacturer:
Texas Instruments
Product Category:
Specialty Function Logic
RoHS:
Y
Series:
SN74ABTH182646A
Operating Supply Voltage:
5 V
Minimum Operating Temperature:
- 40 C
Maximum Operating Temperature:
+ 85 C
Package / Case:
LQFP-64
Packaging:
Tray
Function:
Scan Test Device with Bus Transceiver / Register
Number of Circuits:
2
Operating Temperature Range:
- 40 C to + 85 C
Brand:
Texas Instruments
Mounting Style:
SMD/SMT
Moisture Sensitive:
Yes
Product Type:
Specialty Function Logic
Propagation Delay Time:
7 ns
Factory Pack Quantity:
160
Subcategory:
Logic ICs
Tradename:
SCOPE
Unit Weight:
0.012088 oz
Tags
SN74ABTH1826, SN74ABTH182, SN74ABTH18, SN74ABTH1, SN74ABTH, SN74AB, SN74A, SN74, SN7
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We provide 90-360 days warranty.

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Step1: Vacuum Packaging with PL
Step1:
Vacuum Packaging with PL
Step2: Anti-Static Bag
Step2:
Anti-Static Bag
Step3: Packaging Boxes
Step3:
Packaging Boxes
    A***k
    A***k
    PL

    all ok.

    2019-04-20
    D***v
    D***v
    RU

    Cool thing for this money

    2019-02-05
    A***v
    A***v
    US

    Order received in excellent condition, packed well. Corresponds to the description. Thank you very much to the seller! Five stars. I recommend. Order received in excellent condition, packed well. Fits the description. Thank you very much to the seller! Five stars. Recommend.

    2019-05-14
***as Instruments
Scan Test Devices With 18-Bit Transceivers And egisters 64-LQFP -40 to 85
***ical
Scan Test Device -40C to 85C 64-Pin LQFP Tray
***et
Bus XCVR Dual 18-CH 3-ST 64-Pin LQFP Tray
***INS
The 'ABTH18646A and 'ABTH182646A scan test devices with 18-bit bus transceivers and registers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.
***AS INSRUMENTS
In the normal mode, these devices are 18-bit bus transceivers and registers that allow for multiplexed transmission of data directly from the input bus or from the internal registers. They can be used either as two 9-bit transceivers or one 18-bit transceiver. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self test on the boundary-test cells. Activating the TAP in the normal mode does not affect the functional operation of the SCOPETM bus transceivers and registers.
***as Instruments Inc.
Transceiver function is controlled by output-enable () and direction (DIR) inputs. When is low, the transceiver is active and operates in the A-to-B direction when DIR is high or in the B-to-A direction when DIR is low. When is high, both the A and B outputs are in the high-impedance state, effectively isolating both buses.
***AS INSTUMENTS
Data flow is controlled by clock (CLKAB and CLKBA) and select (SAB and SBA) inputs. Data on the A bus is clocked into the associated registers on the low-to-high transition of CLKAB. When SAB is low, real-time A data is selected for presentation to the B bus (transparent mode). When SAB is high, stored A data is selected for presentation to the B bus (registered mode). The function of the CLKBA and SBA inputs mirrors that of CLKAB and SAB, respectively. Figure 1 shows the four fundamental bus-management functions that are performed with the 'ABTH18646A and 'ABTH182646A.
***AS INSTRU
 
***
In the test mode, the normal operation of the SCOPETM bus transceivers and registers is inhibited, and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry performs boundary-scan test operations according to the protocol described in IEEE Standard 1149.1-1990.
***AS INSTR
Four dedicated test pins observe and control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface.
***
Improved scan efficiency is accomplished through the adoption of a one boundary-scan cell (BSC) per I/O pin architecture. This architecture is implemented in such a way as to capture the most pertinent test data. A PSA/COUNT instruction also is included to ease the testing of memories and other circuits where a binary count addressing scheme is useful.
***AS INST
Active bus-hold circuitry holds unused or floating data inputs at a valid logic level.
***AS INSTRU
The B-port outputs of 'ABTH182646A, which are designed to source or sink up to 12 mA, include 25- series resistors to reduce overshoot and undershoot.
***XS
The SN54ABTH18646A and SN54ABTH182646A are characterized for operation over the full military temperature range of -55°C to 125°C. The SN74ABTH18646A and SN74ABTH182646A are characterized for operation from -40°C to 85°C.
***ASI
 
***TEXAS
 
***as Instr.
The data-output functions can be enabled or disabled by various signals at and DIR. Data-input functions are always enabled; i.e., data at the bus pins is stored on every low-to-high transition of the clock inputs.
Logic Solutions
OMO Electronic Logic Solutions offers a full spectrum of logic functions and technologies from the mature to the advanced, including bipolar, BiCMOS, and CMOS. TI's process technologies offer the logic performance and features required for modern logic designs, while maintaining support for more traditional logic products.Learn More
Part # Description Stock Price
SN74ABTH182646APM
DISTI # 29457866
Bus XCVR Dual 18-CH 3-ST 64-Pin LQFP Tray
RoHS: Compliant
640
  • 500:$13.2348
  • 160:$14.3038
SN74ABTH182646APM
DISTI # 296-4133-ND
IC SCAN-TEST-DEV/TXRX 64-LQFP
RoHS: Compliant
Min Qty: 1
Container: Tray
291In Stock
  • 640:$14.4293
  • 160:$15.8931
  • 25:$17.7752
  • 10:$18.6120
  • 1:$20.1800
SN74ABTH182646APM
DISTI # SN74ABTH182646APM
Bus XCVR Dual 18-CH 3-ST 64-Pin LQFP Tray - Trays (Alt: SN74ABTH182646APM)
RoHS: Compliant
Min Qty: 1
Container: Tray
Americas - 0
  • 1:$19.4900
  • 10:$17.9900
  • 25:$17.1900
  • 50:$17.1900
  • 100:$15.5900
  • 500:$14.2900
  • 1000:$13.8900
SN74ABTH182646APM
DISTI # SN74ABTH182646APM
Bus XCVR Dual 18-CH 3-ST 64-Pin LQFP Tray (Alt: SN74ABTH182646APM)
RoHS: Compliant
Min Qty: 1
Container: Tray
Europe - 0
  • 1:€16.5900
  • 10:€15.6900
  • 25:€14.9900
  • 50:€14.2900
  • 100:€13.5900
  • 500:€13.0900
  • 1000:€12.4900
SN74ABTH182646APMScan Test Devices With 18-Bit Transceivers And Registers3520
  • 1000:$11.8800
  • 750:$11.9200
  • 500:$13.2800
  • 250:$14.4300
  • 100:$15.1600
  • 25:$17.3600
  • 10:$17.9800
  • 1:$19.3400
SN74ABTH182646APMBoundary Scan Reg Bus Transceiver, ABT Series, 2-Func, 9-Bit, True Output, BICMOS, PQFP64
RoHS: Compliant
2876
  • 1000:$13.7600
  • 500:$14.4900
  • 100:$15.0800
  • 25:$15.7300
  • 1:$16.9400
SN74ABTH182646APM
DISTI # 595-SN74ABTH182646AP
Specialty Function Logic Device w/18-Bit Trnscvr & Register
RoHS: Compliant
0
  • 160:$15.9000
  • 320:$15.1700
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Latches D Type
Availability
Stock:
Available
On Order:
3000
Enter Quantity:
Current price of SN74ABTH182646APM is for reference only, if you want to get best price, please submit a inquiry or direct email to our sales team sales@omo-ic.com
Reference price (USD)
Quantity
Unit Price
Ext. Price
160
$15.90
$2 544.00
320
$15.17
$4 854.40
640
$14.43
$9 235.20
Due to semiconductor in short supply from 2021,below price is the Normal price before 2021.please send inquire to confirm.
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