SN74ABTH182502APM

SN74ABTH182502APM
Mfr. #:
SN74ABTH182502APM
Description:
Specialty Function Logic Device w/18-Bit Univ Bus Transceiver
Lifecycle:
New from this manufacturer.
Datasheet:
SN74ABTH182502APM Datasheet
Delivery:
DHL FedEx Ups TNT EMS
Payment:
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ECAD Model:
More Information:
SN74ABTH182502APM more Information SN74ABTH182502APM Product Details
Product Attribute
Attribute Value
Manufacturer:
Texas Instruments
Product Category:
Specialty Function Logic
RoHS:
Y
Series:
SN74ABTH182502A
Operating Supply Voltage:
5 V
Minimum Operating Temperature:
- 40 C
Maximum Operating Temperature:
+ 85 C
Package / Case:
LQFP-64
Packaging:
Tray
Function:
Scan Test Device with Universal Bus Transceiver
Number of Circuits:
2
Operating Temperature Range:
- 40 C to + 85 C
Brand:
Texas Instruments
Mounting Style:
SMD/SMT
Moisture Sensitive:
Yes
Product Type:
Specialty Function Logic
Propagation Delay Time:
5.8 ns
Factory Pack Quantity:
160
Subcategory:
Logic ICs
Tradename:
SCOPE
Unit Weight:
0.012088 oz
Tags
SN74ABTH1825, SN74ABTH182, SN74ABTH18, SN74ABTH1, SN74ABTH, SN74AB, SN74A, SN74, SN7
Service Guarantees

We guarantee 100% customer satisfaction.

Quality Guarantees

We provide 90-360 days warranty.

If the items you received were not in perfect quality, we would be responsible for your refund or replacement, but the items must be returned in their original condition.
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we buy and manage excess electronic components, including excess inventory identified for disposal.
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Step1: Vacuum Packaging with PL
Step1:
Vacuum Packaging with PL
Step2: Anti-Static Bag
Step2:
Anti-Static Bag
Step3: Packaging Boxes
Step3:
Packaging Boxes
    E**h
    E**h
    RU

    Instead of 50 pcs received 49 pcs, as with many, it is the norm for the seller. The goods were only tracked by china.

    2019-07-01
    P***n
    P***n
    BA

    thank you

    2019-07-04
    V***o
    V***o
    KZ

    Tested. Ok. Thanks.

    2019-01-26
*** Stop Electro
Boundary Scan Reg Bus Transceiver, ABT Series, 2-Func, 9-Bit, True Output, BICMOS, PQFP64
***as Instruments
Scan Test Devices With 18-Bit Universal Bus Transceivers 64-LQFP -40 to 85
***inecomponents.com
Bus XCVR Dual 18-CH 3-ST 64-Pin LQFP Tray
***DA Technology Co., Ltd.
Product Description Demo for Development.
***i-Key Marketplace
SN74ABTH182502A SCAN TEST DEVICE
***AS INSRUMENTS
The 'ABTH18502A and 'ABTH182502A scan test devices with 18-bit universal bus transceivers are members of the Texas Instruments SCOPE testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.
***AS INSTRUMENTS INC
In the normal mode, these devices are 18-bit universal bus transceivers that combine D-type latches and D-type flip-flops to allow data flow in transparent, latched, or clocked modes. They can be used either as two 9-bit transceivers or one 18-bit transceiver. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self test on the boundary-test cells. Activating the TAP in the normal mode does not affect the functional operation of the SCOPE universal bus transceivers.
***AS INSTRUMEN
Data flow in each direction is controlled by output-enable ( and ), latch-enable (LEAB and LEBA), and clock (CLKAB and CLKBA) inputs. For A-to-B data flow, the device operates in the transparent mode when LEAB is high. When LEAB is low, the A-bus data is latched while CLKAB is held at a static low or high logic level. Otherwise, if LEAB is low, A-bus data is stored on a low-to-high transition of CLKAB. When is low, the B outputs are active. When is high, the B outputs are in the high-impedance state. B-to-A data flow is similar to A-to-B data flow but uses the , LEBA, and CLKBA inputs.
***AS INSTRUMENTS INCORPORATED
In the test mode, the normal operation of the SCOPE universal bus transceivers is inhibited and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry performs boundary-scan test operations according to the protocol described in IEEE Standard 1149.1-1990.
***OMO Electronic
 
***AS INSRUMENT
Four dedicated test pins observe and control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface.
***INS
Improved scan efficiency is accomplished through the adoption of a one boundary-scan cell (BSC) per I/O pin architecture. This architecture is implemented in such a way as to capture the most pertinent test data. A PSA/COUNT instruction also is included to ease the testing of memories and other circuits where a binary count addressing scheme is useful.
***AS INSTRUM
Active bus-hold circuitry holds unused or floating data inputs at a valid logic level.
***
The B-port outputs of 'ABTH182502A, which are designed to source or sink up to 12 mA, include 25- series resistors to reduce overshoot and undershoot.
***AS INST
The SN54ABTH18502A and SN54ABTH182502A are characterized for operation over the full military temperature range of -55°C to 125°C. The SN74ABTH18502A and SN74ABTH182502A are characterized for operation from -40°C to 85°C.
***AS INST
 
***TEXAS
 
***AS INSTR
A-to-B data flow is shown. B-to-A data flow is similar but uses OEBA\, LEBA, and CLKBA.
***AS INSTRU
Output level before the indicated steady-state input conditions were established
Logic Solutions
OMO Electronic Logic Solutions offers a full spectrum of logic functions and technologies from the mature to the advanced, including bipolar, BiCMOS, and CMOS. TI's process technologies offer the logic performance and features required for modern logic designs, while maintaining support for more traditional logic products.Learn More
Part # Description Stock Price
SN74ABTH182502APM
DISTI # V39:1801_07325455
Bus XCVR Dual 18-CH 3-ST 64-Pin LQFP Tray
RoHS: Compliant
38
  • 100:$10.8240
  • 10:$11.4650
  • 1:$12.7390
SN74ABTH182502APM
DISTI # 296-4131-ND
IC SCAN TEST UNIV TXRX 64LQFP
RoHS: Compliant
Min Qty: 1
Container: Tray
230In Stock
  • 640:$13.9606
  • 160:$15.6936
  • 25:$17.8120
  • 10:$18.5820
  • 1:$20.2200
SN74ABTH182502APM
DISTI # 29459424
Bus XCVR Dual 18-CH 3-ST 64-Pin LQFP Tray
RoHS: Compliant
4480
  • 160:$12.7390
SN74ABTH182502APM
DISTI # 27510000
Bus XCVR Dual 18-CH 3-ST 64-Pin LQFP Tray
RoHS: Compliant
2
  • 1:$12.7390
SN74ABTH182502APM
DISTI # SN74ABTH182502APM
Bus XCVR Dual 18-CH 3-ST 64-Pin LQFP Tray - Trays (Alt: SN74ABTH182502APM)
RoHS: Compliant
Min Qty: 1
Container: Tray
Americas - 0
  • 1:$19.5900
  • 10:$17.9900
  • 25:$17.2900
  • 50:$17.1900
  • 100:$15.4900
  • 500:$13.9900
  • 1000:$13.4900
SN74ABTH182502APMScan Test Devices With 18-Bit Universal Bus Transceivers4800
  • 1000:$10.9400
  • 750:$10.9800
  • 500:$12.2300
  • 250:$13.2900
  • 100:$13.9600
  • 25:$15.9800
  • 10:$16.5600
  • 1:$17.8100
SN74ABTH182502APM
DISTI # 595-SN74ABTH182502AP
Specialty Function Logic Device w/18-Bit Univ Bus Transceiver
RoHS: Compliant
0
  • 160:$15.7000
  • 320:$14.9300
SN74ABTH182502APMBoundary Scan Reg Bus Transceiver, ABT Series, 2-Func, 9-Bit, True Output, BICMOS, PQFP64
RoHS: Compliant
20373
  • 1000:$12.6700
  • 500:$13.3400
  • 100:$13.8900
  • 25:$14.4800
  • 1:$15.6000
SN74ABTH182502APM
DISTI # C1S746201940892
Bus XCVR Dual 18-CH 3-ST 64-Pin LQFP Tray
RoHS: Compliant
2
  • 1:$12.7390
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Availability
Stock:
Available
On Order:
4500
Enter Quantity:
Current price of SN74ABTH182502APM is for reference only, if you want to get best price, please submit a inquiry or direct email to our sales team sales@omo-ic.com
Reference price (USD)
Quantity
Unit Price
Ext. Price
160
$15.70
$2 512.00
320
$14.93
$4 777.60
640
$13.97
$8 940.80
Due to semiconductor in short supply from 2021,below price is the Normal price before 2021.please send inquire to confirm.
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