SN74BCT8374ADWR

Mfr. #: SN74BCT8374ADWR
Manufacturer: Texas Instruments
Description: IC SCAN TEST DEVICE W/FF 24-SOIC
Lifecycle: New from this manufacturer.
Datasheet: SN74BCT8374ADWR Datasheet
Due to semiconductor in short supply from 2021,below price is the Normal price before 2021.please send inquire to confirm.
Product Details
1680 In Stock
Can ship immediately
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