Mfr. #: | SN74BCT8374ANT |
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Manufacturer: | Texas Instruments |
Description: | IC SCAN TEST DEVICE W/FF 24-DIP |
Lifecycle: | New from this manufacturer. |
Datasheet: | SN74BCT8374ANT Datasheet |
Product belongs to the 74BCT series. Tube is the packaging method for this product 24-DIP (0.300", 7.62mm) Operational temperature range: 0°C ~ 70°C Through Hole mounting type Supplier device package: 24-PDIP 8 bits Scan Test Device with D-Type Edge-Triggered Flip-Flops logic type The 4.5 V ~ 5.5 V.
Image shown is a representation only. Exact specifications should be obtained from the product data sheet.
SN74BCT8374ANT Specifications
A: At what frequency does the Series?
Q: The product Series is 74BCT.
A: Is the cutoff frequency of the product Packaging?
Q: Yes, the product's Packaging is indeed Tube
A: Is the cutoff frequency of the product Package-Case?
Q: Yes, the product's Package-Case is indeed 24-DIP (0.300", 7.62mm)
A: At what frequency does the Operating-Temperature?
Q: The product Operating-Temperature is 0°C ~ 70°C.
A: At what frequency does the Mounting-Type?
Q: The product Mounting-Type is Through Hole.
A: Is the cutoff frequency of the product Supplier-Device-Package?
Q: Yes, the product's Supplier-Device-Package is indeed 24-PDIP
A: What is the Number-of-Bits of the product?
Q: The Number-of-Bits of the product is 8.
A: At what frequency does the Logic-Type?
Q: The product Logic-Type is Scan Test Device with D-Type Edge-Triggered Flip-Flops.
A: At what frequency does the Supply-Voltage?
Q: The product Supply-Voltage is 4.5 V ~ 5.5 V.