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SN74LVTH182652APM

SN74LVTH182652APM
Mfr. #:
SN74LVTH182652APM
Description:
Specialty Function Logic 10-Bit Bus Interface F-F W/3-State Otpt
Lifecycle:
New from this manufacturer.
Datasheet:
SN74LVTH182652APM Datasheet
Delivery:
DHL FedEx Ups TNT EMS
Payment:
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ECAD Model:
More Information:
SN74LVTH182652APM more Information SN74LVTH182652APM Product Details
Product Attribute
Attribute Value
Manufacturer:
Texas Instruments
Product Category:
Specialty Function Logic
RoHS:
Y
Series:
SN74LVTH182652A
Operating Supply Voltage:
2.7 V to 3.6 V
Minimum Operating Temperature:
- 40 C
Maximum Operating Temperature:
+ 85 C
Package / Case:
LQFP-64
Packaging:
Tray
Function:
Scan Test Device with Bus Transceiver / Register
Number of Circuits:
2
Operating Temperature Range:
- 40 C to + 85 C
Brand:
Texas Instruments
Mounting Style:
SMD/SMT
Moisture Sensitive:
Yes
Product Type:
Specialty Function Logic
Propagation Delay Time:
8.2 ns
Factory Pack Quantity:
160
Subcategory:
Logic ICs
Tradename:
SCOPE
Unit Weight:
0.012088 oz
Tags
SN74LVTH182, SN74LVTH18, SN74LVTH1, SN74LVTH, SN74LVT, SN74LV, SN74L, SN74, SN7
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We guarantee 100% customer satisfaction.

Quality Guarantees

We provide 90-360 days warranty.

If the items you received were not in perfect quality, we would be responsible for your refund or replacement, but the items must be returned in their original condition.
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Email: info@omo-ic.com

Step1: Vacuum Packaging with PL
Step1:
Vacuum Packaging with PL
Step2: Anti-Static Bag
Step2:
Anti-Static Bag
Step3: Packaging Boxes
Step3:
Packaging Boxes
    N***h
    N***h
    RU

    39 days

    2019-05-28
    M***a
    M***a
    LK

    Products seem to be of good quality as described,  shipment and delivery commendable, This product is highly recommended. "The duration for delivery was approximately 26 days"

    2019-05-29
    W***s
    W***s
    LB

    order not received

    2019-06-28
*** Stop Electro
Boundary Scan Reg Bus Transceiver, LVT Series, 2-Func, 9-Bit, True Output, BICMOS, PQFP64
***as Instruments
3.3-V ABT Scan Test Devices With 18-Bit Transceivers And egisters 64-LQFP -40 to 85
***ark
Specialty Logic IC; Logic Family:LVT; Supply Voltage Min:2.7V; Supply Voltage Max:3.6V; Package/Case:64-LQFP; No. of Pins:64; Operating Temperature Range:-40°C to +85°C; Input Type:TTL/CMOS; Leaded Process Compatible:Yes ;RoHS Compliant: Yes
***XS
The 'LVTH18652A and 'LVTH182652A scan test devices with 18-bit bus transceivers and registers are members of the Texas Instruments (TI) SCOPE testability integrated-circuit family. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.
***AS INST
Additionally, these devices are designed specifically for low-voltage (3.3-V) VCC operation, but with the capability to provide a TTL interface to a 5-V system environment.
***AS INST
In the normal mode, these devices are 18-bit bus transceivers and registers that allow for multiplexed transmission of data directly from the input bus or from the internal registers. They can be used either as two 9-bit transceivers or one 18-bit transceiver. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self test on the boundary-test cells. Activating the TAP in the normal mode does not affect the functional operation of the SCOPE bus transceivers and registers.
***XS
Data flow in each direction is controlled by clock (CLKAB and CLKBA), select (SAB and SBA), and output-enable (OEAB and OEBA\) inputs. For A-to-B data flow, data on the A bus is clocked into the associated registers on the low-to-high transition of CLKAB. When SAB is low, real-time A data is selected for presentation to the B bus (transparent mode). When SAB is high, stored A data is selected for presentation to the B bus (registered mode). When OEAB is high, the B outputs are active. When OEAB is low, the B outputs are in the high-impedance state.
***AS INSTRUM
Control for B-to-A data flow is similar to that for A-to-B data flow but uses CLKBA, SBA, and OEBA\ inputs. Since the OEBA\ input is active-low, the A outputs are active when OEBA\ is low and are in the high-impedance state when OEBA\ is high. Figure 1 illustrates the four fundamental bus-management functions that can be performed with the 'LVTH18652A and 'LVTH182652A.
***AS INSTRU
In the test mode, the normal operation of the SCOPE bus transceivers and registers is inhibited, and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry performs boundary-scan test operations according to the protocol described in IEEE Std 1149.1-1990.
***as Instruments (TI)
Four dedicated test pins are used to observe and control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface.
***AS USD
Active bus-hold circuitry is provided to hold unused or floating data inputs at a valid logic level.
***AS INSTRUMENTS INCORPORATED
The B-port outputs of 'LVTH182652A, which are designed to source or sink up to 12 mA, include equivalent 25- series resistors to reduce overshoot and undershoot.
***AS USD
The SN54LVTH18652A and SN54LVTH182652A are characterized for operation over the full military temperature range of -55°C to 125°C. The SN74LVTH18652A and SN74LVTH182652A are characterized for operation from -40°C to 85°C.
Logic Solutions
OMO Electronic Logic Solutions offers a full spectrum of logic functions and technologies from the mature to the advanced, including bipolar, BiCMOS, and CMOS. TI's process technologies offer the logic performance and features required for modern logic designs, while maintaining support for more traditional logic products.Learn More
Part # Description Stock Price
SN74LVTH182652APM
DISTI # 296-14323-ND		IC SCAN TEST DEVICE ABT 64-LQFP
RoHS: Compliant
Min Qty: 1
Container: Tray		299In Stock
  • 640:$12.3090
  • 160:$13.8371
  • 25:$15.7048
  • 10:$16.3840
  • 1:$17.8300
SN74LVTH182652APM
DISTI # 26885593		Bus XCVR Dual 18-CH 3-ST 64-Pin LQFP Tray
RoHS: Compliant		320
  • 160:$15.3700
SN74LVTH182652APM
DISTI # SN74LVTH182652APM		Bus XCVR Dual 18-CH 3-ST 64-Pin LQFP Tray - Trays (Alt: SN74LVTH182652APM)
RoHS: Compliant
Min Qty: 160
Container: Tray		Americas - 0
  • 160:$14.0900
  • 320:$13.7900
  • 640:$13.1900
  • 960:$12.8900
  • 1600:$12.6900
SN74LVTH182652APM3.3-V ABT Scan Test Devices With 18-Bit Transceivers And Registers3520
  • 1000:$9.6500
  • 750:$9.6800
  • 500:$10.7800
  • 250:$11.7200
  • 100:$12.3100
  • 25:$14.0900
  • 10:$14.6000
  • 1:$15.7100
SN74LVTH182652APM
DISTI # 595-SN74LVTH182652AP		Specialty Function Logic 10-Bit Bus Interface F-F W/3-State Otpt
RoHS: Compliant		0
  • 160:$13.8400
  • 320:$13.1600
  • 640:$12.3100
SN74LVTH182652APMBoundary Scan Reg Bus Transceiver, LVT Series, 2-Func, 9-Bit, True Output, BICMOS, PQFP64
RoHS: Compliant		1242
  • 1000:$11.1700
  • 500:$11.7600
  • 100:$12.2400
  • 25:$12.7700
  • 1:$13.7500
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SN74LVTH2245PWR

Mfr.#: SN74LVTH2245PWR

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Availability
Stock:
Available
On Order:
4500
Enter Quantity:
Current price of SN74LVTH182652APM is for reference only, if you want to get best price, please submit a inquiry or direct email to our sales team sales@omo-ic.com
Reference price (USD)
Quantity
Unit Price
Ext. Price
160
$13.84
$2 214.40
320
$13.16
$4 211.20
640
$12.31
$7 878.40
Due to semiconductor in short supply from 2021,below price is the Normal price before 2021.please send inquire to confirm.
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