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SST25VF010A-33-4C-SAE-T

P1-P3P4-P6P7-P9P10-P12P13-P15P16-P18P19-P21P22-P24P25-P27P28-P28
©2011 Silicon Storage Technology, Inc. S725081A 10/11
22
1 Mbit SPI Serial Flash
SST25VF010A
Data Sheet
A
Microchip Technology Company
Figure 16:Serial Input Timing Diagram
Figure 17:Serial Output Timing Diagram
Figure 18:Hold Timing Diagram
HIGH-Z
HIGH-Z
CE#
SO
SI
SCK
MSB
LSB
T
DS
T
DH
T
CHH
T
CES
T
CEH
T
CHS
T
SCKR
T
SCKF
T
CPH
1265 F16.0
1265 F17.0
CE#
SI
SO
SCK
MSB
T
CLZ
T
V
T
SCKH
T
CHZ
T
OH
T
SCKL
LSB
T
HZ
T
LZ
T
HHH
T
HLS
T
HLH
T
HHS
1265 F18.0
HOLD#
CE#
SCK
SO
SI
©2011 Silicon Storage Technology, Inc. S725081A 10/11
23
1 Mbit SPI Serial Flash
SST25VF010A
Data Sheet
A
Microchip Technology Company
Figure 19:Power-up Timing Diagram
Time
V
DD
Min
V
DD
Max
V
DD
Device fully accessible
T
PU-READ
T
PU-WRITE
Chip selection is not allowed.
All commands are rejected by the device.
1265 F19.0
©2011 Silicon Storage Technology, Inc. S725081A 10/11
24
1 Mbit SPI Serial Flash
SST25VF010A
Data Sheet
A
Microchip Technology Company
Figure 20:AC Input/Output Reference Waveforms
Figure 21:A Test Load Example
1265 F20.0
REFERENCE POINTS OUTPUTINPUT
V
HT
V
LT
V
HT
V
LT
V
IHT
V
ILT
AC test inputs are driven at V
IHT
(0.9V
DD
) for a logic “1” and V
ILT
(0.1V
DD
) for a logic “0”. Mea-
surement reference points for inputs and outputs are V
HT
(0.7V
DD
) and V
LT
(0.3V
DD
). Input
rise and fall times (10% 90%) are <5 ns.
Note: V
HT
-V
HIGH
Test
V
LT
-V
LOW
Test
V
IHT
-V
INPUT
HIGH Test
V
ILT
-V
INPUT
LOW Test
1265 F21.0
TO TESTER
TO DUT
C
L
P1-P3P4-P6P7-P9P10-P12P13-P15P16-P18P19-P21P22-P24P25-P27P28-P28

SST25VF010A-33-4C-SAE-T

Mfr. #:
Buy SST25VF010A-33-4C-SAE-T
Manufacturer:
Microchip Technology
Description:
NOR Flash 1M (128Kx8) 33MHz 2.7-3.6V Commercial
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
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