MT41K1G8TRF-125:E

Table 3: FBGA 78-Ball Descriptions
Symbol Type Description
A15, A14, A13,
A12/BC#, A11,
A10/AP, A[9:0]
Input Address inputs: Provide the row address for ACTIVATE commands, and the column ad-
dress and auto precharge bit (A10) for READ/WRITE commands, to select one location out
of the memory array in the respective bank. A10 sampled during a PRECHARGE com-
mand determines whether the PRECHARGE applies to one bank (A10 LOW, bank selected
by BA[2:0]) or all banks (A10 HIGH). The address inputs also provide the op-code during a
LOAD MODE command. Address inputs are referenced to V
REFCA
. A12/BC#: When enabled
in the mode register (MR), A12 is sampled during READ and WRITE commands to deter-
mine whether burst chop (on-the-fly) will be performed (HIGH = burst length (BL) of 8 or
no burst chop, LOW = burst chop (BC) of 4, burst chop).
BA[2:0] Input Bank address inputs: BA[2:0] define the bank to which an ACTIVATE, READ, WRITE, or
PRECHARGE command is being applied. BA[2:0] define which mode register (MR0, MR1,
MR2, or MR3) is loaded during the LOAD MODE command. BA[2:0] are referenced to
V
REFCA
.
CK, CK# Input Clock: CK and CK# are differential clock inputs. All command, address, and control input
signals are sampled on the crossing of the positive edge of CK and the negative edge of
CK#. Output data strobe (DQS, DQS#) is referenced to the crossings of CK and CK#.
CKE[1:0] Input Clock enable: CKE enables (registered HIGH) and disables (registered LOW) internal cir-
cuitry and clocks on the DRAM. The specific circuitry that is enabled/disabled is depend-
ent upon the DDR3L SDRAM configuration and operating mode. Taking CKE LOW pro-
vides PRECHARGE power-down and SELF REFRESH operations (all banks idle) or active
power-down (row active in any bank). CKE is synchronous for power-down entry and exit
and for self refresh entry. CKE is asynchronous for self refresh exit. Input buffers (exclud-
ing CK, CK#, CKE, RESET#, and ODT) are disabled during power-down. Input buffers (ex-
cluding CKE and RESET#) are disabled during SELF REFRESH. CKE is referenced to V
REFCA
.
CS#[1:0] Input Chip select: CS# enables (registered LOW) and disables (registered HIGH) the command
decoder. All commands are masked when CS# is registered HIGH. CS# provides for exter-
nal rank selection on systems with multiple ranks. CS# is considered part of the command
code.
DM Input Input data mask: DM is an input mask signal for write data. Input data is masked when
DM is sampled HIGH, along with the input data, during a write access. Although the DM
ball is input-only, the DM loading is designed to match that of the DQ and DQS balls. DM
is referenced to V
REFDQ
. DM has an optional use as TDQS on the x8.
ODT[1:0] Input On-die termination: ODT enables (registered HIGH) and disables (registered LOW) ter-
mination resistance internal to the DDR3L SDRAM. When enabled in normal operation,
ODT is only applied to each of the following balls: DQ[7:0], DQS, DQS#, and DM for the
x8; DQ[3:0], DQS, DQS#, and DM for the x4. The ODT input is ignored if disabled via the
LOAD MODE command. ODT is referenced to V
REFCA
.
RAS#, CAS#, WE# Input Command inputs: RAS#, CAS#, and WE# (along with CS#) define the command being
entered and are referenced to V
REFCA
.
RESET# Input Reset: RESET# is an active LOW CMOS input referenced to V
SS
. The RESET# input receiver
is a CMOS input defined as a rail-to-rail signal with DC HIGH 0.8 × V
DDQ
and DC LOW
0.2 × V
DDQ
. RESET# assertion and desertion are asynchronous.
DQ[3:0] I/O Data input/output: Bidirectional data bus for x4 configuration. DQ[3:0] are referenced
to V
REFDQ
.
8Gb: x4, x8 TwinDie DDR3L SDRAM
Ball Assignments and Descriptions
PDF: 09005aef84787542
DDR3L_8Gb_x4_x8_2CS_TwinDie.pdf - Rev. F 05/13 EN
4
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2011 Micron Technology, Inc. All rights reserved.
Table 3: FBGA 78-Ball Descriptions (Continued)
Symbol Type Description
DQ[7:0] I/O Data input/output: Bidirectional data bus for x8 configuration. DQ[7:0] are referenced
to V
REFDQ
.
DQS, DQS# I/O Data strobe: DQS and DQS# are differential data strobes: Output with read data; edge
aligned with read data; input with write data; center-aligned with write data.
TDQS, TDQS# I/O Termination data strobe: Applies to the x8 configuration only. When TDQS is enabled,
DM is disabled, and the TDQS and TDQS# balls provide termination resistance.
V
DD
Supply Power supply: 1.35V (1.283V to 1.45V operational; compatible with 1.5V operation)
V
DDQ
Supply DQ power supply: 1.35V (1.283V to 1.45V operational; compatible with 1.5V opera-
tion). Isolated on the device for improved noise immunity.
V
REFCA
Supply Reference voltage for control, command, and address: V
REFCA
must be maintained
at all times (including self refresh) for proper device operation.
V
REFDQ
Supply Reference voltage for data: V
REFDQ
must be maintained at all times (including self re-
fresh) for proper device operation.
V
SS
Supply Ground.
V
SSQ
Supply DQ ground: Isolated on the device for improved noise immunity.
ZQ[1:0] Reference External reference ball for output drive calibration: This ball is tied to an external
240Ω resistor (RZQ), which is tied to V
SSQ
.
NC No connect: These balls should be left unconnected (the ball has no connection to the
DRAM or to other balls).
NF No function: When configured as a x4 device, these balls are NF. When configured as a
x8 device, these balls are defined as TDQS#, DQ[7:4].
8Gb: x4, x8 TwinDie DDR3L SDRAM
Ball Assignments and Descriptions
PDF: 09005aef84787542
DDR3L_8Gb_x4_x8_2CS_TwinDie.pdf - Rev. F 05/13 EN
5
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2011 Micron Technology, Inc. All rights reserved.
Functional Description
The TwinDie DDR3L SDRAM is a high-speed, CMOS dynamic random access memory
device internally configured as two 8-bank DDR3L SDRAM devices.
Although each die is tested individually within the dual-die package, some TwinDie test
results may vary from a like die tested within a monolithic die package.
The DDR3L SDRAM uses a double data rate architecture to achieve high-speed opera-
tion. The double data rate architecture is an 8n-prefetch architecture with an interface
designed to transfer two data words per clock cycle at the I/O balls. A single read or
write access consists of a single 8n-bit-wide, one-clock-cycle data transfer at the inter-
nal DRAM core and eight corresponding n-bit-wide, one-half-clock-cycle data transfers
at the I/O balls.
The differential data strobe (DQS, DQS#) is transmitted externally, along with data, for
use in data capture at the DDR3L SDRAM input receiver. DQS is center-aligned with da-
ta for WRITEs. The read data is transmitted by the DDR3L SDRAM and edge-aligned to
the data strobes.
Read and write accesses to the DDR3L SDRAM are burst-oriented. Accesses start at a
selected location and continue for a programmed number of locations in a program-
med sequence. Accesses begin with the registration of an ACTIVATE command, which is
then followed by a READ or WRITE command. The address bits registered coincident
with the ACTIVATE command are used to select the bank and row to be accessed. The
address bits (including CSn#, BAn, and An) registered coincident with the READ or
WRITE command are used to select the rank, bank, and starting column location for the
burst access.
This data sheet provides a general description, package dimensions, and the package
ballout. Refer to the Micron monolithic DDR3L data sheet for complete information re-
garding individual die initialization, register definition, command descriptions, and die
operation.
Industrial Temperature
The industrial temperature (IT) option, if offered, requires that the case temperature
not exceed –40°C or 95°C. JEDEC specifications require the refresh rate to double when
T
C
exceeds 85°C; this also requires use of the high-temperature self refresh option. Addi-
tionally, ODT resistance, I
DD
values, some IDD specifications and the input/output im-
pedance must be derated when T
C
is < 0°C or > 95°C. See the DDR3 monolithic data
sheet for details.
8Gb: x4, x8 TwinDie DDR3L SDRAM
Functional Description
PDF: 09005aef84787542
DDR3L_8Gb_x4_x8_2CS_TwinDie.pdf - Rev. F 05/13 EN
6
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2011 Micron Technology, Inc. All rights reserved.

MT41K1G8TRF-125:E

Mfr. #:
Manufacturer:
Micron
Description:
IC DRAM 8G PARALLEL 78FBGA
Lifecycle:
New from this manufacturer.
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