Electrical Characteristics – AC and DC Output Measurement Levels
Single-Ended Outputs
Table 7: Single-Ended Output Levels
Parameter Symbol DDR4-1600 to DDR4-3200 Unit
DC output high measurement level (for IV curve linearity) V
OH(DC)
1.1 × V
DDQ
V
DC output mid measurement level (for IV curve linearity) V
OM(DC)
0.8 × V
DDQ
V
DC output low measurement level (for IV curve linearity) V
OL(DC)
0.5 × V
DDQ
V
AC output high measurement level (for output slew rate) V
OH(AC)
(0.7 + 0.15) × V
DDQ
V
AC output low measurement level (for output slew rate) V
OL(AC)
(0.7 - 0.15) × V
DDQ
V
Note:
1. The swing of ±0.15 × V
DDQ
is based on approximately 50% of the static single-ended
output peak-to-peak swing with a driver impedance of RZQ/7 and an effective test load
of 50Ω to V
TT
= V
DDQ
.
Using the same reference load used for timing measurements, output slew rate for fall-
ing and rising edges is defined and measured between V
OL(AC)
and V
OH(AC)
for single-
ended signals.
Table 8: Single-Ended Output Slew Rate Definition
Description
Measured
Defined byFrom To
Single-ended output slew rate for rising edge V
OL(AC)
V
OH(AC)
[V
OH(AC)
- V
OL(AC)
]/ΔTR
se
Single-ended output slew rate for falling edge V
OH(AC)
V
OL(AC)
[V
OH(AC)
- V
OL(AC)
]/ΔTF
se
Figure 6: Single-ended Output Slew Rate Definition
TR
se
TF
se
V
OH(AC)
V
OL(AC)
Single-Ended Output Voltage (DQ)
16Gb: x4, x8 TwinDie DDR4 SDRAM
Electrical Characteristics – AC and DC Output Measurement
Levels
PDF: 09005aef85fd40a1
DDR4_16Gb_x4_x8_2CS_TwinDie.pdf - Rev. D 12/16 EN
12
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