©2013 Silicon Storage Technology, Inc. DS-20005014B 11/2013
4
16 Mbit Multi-Purpose Flash Plus
SST39WF1601 / SST39WF1602
Data Sheet
Block Diagram
Figure 2: Pin assignments for 48-ball TFBGA
Figure 3: Pin assignments for 48-ball WFBGA
A13
A9
WE#
NC
A7
A3
A12
A8
RST#
WP#
A17
A4
A14
A10
NC
A18
A6
A2
A15
A11
A19
NC
A5
A1
A16
DQ7
DQ5
DQ2
DQ0
A0
NC
DQ14
DQ12
DQ10
DQ8
CE#
DQ15
DQ13
V
DD
DQ11
DQ9
OE#
V
SS
DQ6
DQ4
DQ3
DQ1
V
SS
1297 48-tfbga B3K P1.1
TOP VIEW (balls facing down)
6
5
4
3
2
1
ABCDEFGH
A2
A1
A0
CE#
V
SS
A4
A3
A5
DQ8
OE#
DQ0
A6
A7
A18
DQ10
DQ9
DQ1
A17
WP#
A19
DQ2
NC
DQ3
NC
V
DD
WE#
DQ12
RST#
NC
NC
DQ13
A9
A10
A8
DQ4
DQ5
DQ14
A11
A13
A12
DQ11
DQ6
DQ15
A14
A15
A16
DQ7
V
SS
TOP VIEW (balls facing down)
AB C D E F G H J K L
6
5
4
3
2
1
1297 48-wfbga MBQ P02.0
SST39WF160x
©2013 Silicon Storage Technology, Inc. DS-20005014B 11/2013
5
16 Mbit Multi-Purpose Flash Plus
SST39WF1601 / SST39WF1602
Data Sheet
Table 1: Pin Description
Symbol Pin Name Functions
A
MS
1
-A
0
Address Inputs To provide memory addresses.
During Sector-Erase A
MS
-A
11
address lines will select the sector.
During Block-Erase A
MS
-A
15
address lines will select the block.
DQ
15
-DQ
0
Data Input/output To output data during Read cycles and receive input data during Write cycles.
Data is internally latched during a Write cycle.
The outputs are in tri-state when OE# or CE# is high.
WP# Write Protect To protect the top/bottom boot block from Erase/Program operation when
grounded.
RST# Reset To reset and return the device to Read mode.
CE# Chip Enable To activate the device when CE# is low.
OE# Output Enable To gate the data output buffers.
WE# Write Enable To control the Write operations.
V
DD
Power Supply To provide power supply voltage: 1.65-1.95V
V
SS
Ground
NC No Connection Unconnected pins.
T1.0 20005014
1. A
MS
= Most significant address
A
MS
=A
19
for SST39WF1601/1602
©2013 Silicon Storage Technology, Inc. DS-20005014B 11/2013
6
16 Mbit Multi-Purpose Flash Plus
SST39WF1601 / SST39WF1602
Data Sheet
Device Operation
Commands are used to initiate the memory operation functions of the device. Commands are written
to the device using standard microprocessor write sequences. A command is written by asserting WE#
low while keeping CE# low. The address bus is latched on the falling edge of WE# or CE#, whichever
occurs last. The data bus is latched on the rising edge of WE# or CE#, whichever occurs first.
The SST39WF1601/1602 also have the Auto Low Power mode which puts the device in a near
standby mode after data has been accessed with a valid Read operation. This reduces the I
DD
active
read current from typically 9 mA to typically 5 µA. The Auto Low Power mode reduces the typical I
DD
active read current to the range of 2 mA/MHz of Read cycle time. The device exits the Auto Low Power
mode with any address transition or control signal transition used to initiate another Read cycle, with
no access time penalty. Note that the device does not enter Auto-Low Power mode after power-up with
CE# held steadily low, until the first address transition or CE# is driven high.
Read
The Read operation of the SST39WF1601/1602 is controlled by CE# and OE#, both have to be low for
the system to obtain data from the outputs. CE# is used for device selection. When CE# is high, the
chip is deselected and only standby power is consumed. OE# is the output control and is used to gate
data from the output pins. The data bus is in high impedance state when either CE# or OE# is high.
Refer to the Read cycle timing diagram for further details (Figure 4).
Word-Program Operation
The SST39WF1601/1602 are programmed on a word-by-word basis. Before programming, the sector
where the word exists must be fully erased. The Program operation is accomplished in three steps.
The first step is the three-byte load sequence for Software Data Protection. The second step is to load
word address and word data. During the Word-Program operation, the addresses are latched on the
falling edge of either CE# or WE#, whichever occurs last. The data is latched on the rising edge of
either CE# or WE#, whichever occurs first. The third step is the internal Program operation which is ini-
tiated after the rising edge of the fourth WE# or CE#, whichever occurs first. The Program operation,
once initiated, will be completed within 40 µs. See Figures 5 and 6 for WE# and CE# controlled Pro-
gram operation timing diagrams and Figure 20 for flowcharts. During the Program operation, the only
valid reads are Data# Polling and Toggle Bit. During the internal Program operation, the host is free to
perform additional tasks. Any commands issued during the internal Program operation are ignored.
During the command sequence, WP# should be statically held high or low.
Sector/Block-Erase Operation
The Sector- (or Block-) Erase operation allows the system to erase the device on a sector-by-sector (or
block-by-block) basis. The SST39WF1601/1602 offer both Sector-Erase and Block-Erase modes. The
sector architecture is based on uniform sector size of 2 KWord. The Block-Erase mode is based on
uniform block size of 32 KWord. The Sector-Erase operation is initiated by executing a six-byte com-
mand sequence with Sector-Erase command (30H) and sector address (SA) in the last bus cycle. The
Block-Erase operation is initiated by executing a six-byte command sequence with Block-Erase com-
mand (50H) and block address (BA) in the last bus cycle. The sector or block address is latched on the
falling edge of the sixth WE# pulse, while the command (30H or 50H) is latched on the rising edge of
the sixth WE# pulse. The internal Erase operation begins after the sixth WE# pulse. The End-of-Erase
operation can be determined using either Data# Polling or Toggle Bit methods. See Figures 10 and 11
for timing waveforms and Figure 24 for the flowchart. Any commands issued during the Sector- or

SST39WF1601-70-4I-MAQE-T

Mfr. #:
Manufacturer:
Microchip Technology
Description:
NOR Flash 1.65V to 1.95V 16Mbit Multi-Prps Fl
Lifecycle:
New from this manufacturer.
Delivery:
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