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AP-UM004GT31EG-2MST

P1-P3P4-P6P7-P9P10-P12P13-P15P16-P18P19-P21P22-P24P25-P25
USB-Disk Module
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AP-UMxxxxXXXXX-XXXXXT
9
© 2014 Apacer Technology, Inc. Rev. 2.2
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4.1 Capacity Specifications
The USB-Disk Module product family is available as below table matrix.
Table 4-1: Capacity Specification
Density Total Bytes
256MB 254,509,056
512 MB 512,458,752
1GB 1,029,406,720
2GB 2,061,205,504
4GB 4,120,920,064
8GB 8,248,131,584
16GB 16,030,662,656
32GB 32,061,292,544
Notes: the number of total bytes may vary depending on the file system in use.
4.2 Performance Specifications
Table 4-2: Performance Specifications
Capacity
Performance
256 MB 512 MB 1 GB 2 GB 4 GB 8 GB 16 GB 32 GB
Sustained read
(MB/s)
31 31 32 34 28 32 34 31
Sustained write
(MB/s)
10 15 19 19 21 15 22 21
Note: results may vary in real world platforms or flash configurations.
4.3 Environmental Specifications
Environmental specification of the USB-Disk Module (UDM) product family which follows the MIL-STD-
810F standards is available as shown in Table 4-3.
Table 4-3: Environmental Specifications
Operation 0°C to 70°C (Std.); -40°C to 85°C (Ext. Temp.)
Temperature
Storage -40°C to 85°C
Vibration
Sine wave 10 Hz to 500 Hz, 50 m/s
2
, 3 axes (IEC 68-2-6, non-operating)
Shock
Half sine wave 50G, 6 axes, 18 times (IEC 68-2-27, non-operating)
EMC
FCC, CE
USB-Disk Module
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҈҈
҈Plus
AP-UMxxxxXXXXX-XXXXXT
10
© 2014 Apacer Technology, Inc. Rev. 2.2
4.4 MTBF
Mean Time Between Failures (MTBF) is predicted based on reliability data for the individual components
in this device. The measurement assumes that device failure rate can be generated by the sum of failure
rates in each component and a steady state failure rate can be predicated as equal to or greater than
4.20 x 10
6
hours.
Notes about the MTBF:
The MTBF is predicated and calculated based on “Bellcore Analysis Method 1”.
USB-Disk Module
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҈҈
҈Plus
AP-UMxxxxXXXXX-XXXXXT
11
© 2014 Apacer Technology, Inc. Rev. 2.2
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Caution: Absolute Maximum Stress Ratings – Applied conditions greater than those listed under
“Absolute Maximum Stress Ratings” may cause permanent damage to the device. This is a stress rating
only and functional operation of the device at these conditions or conditions greater than those defined in
the operational sections of this data sheet is not implied. Exposure to absolute maximum stress rating
conditions may affect device reliability.
Table 5-1: Operating Range
Range Ambient Temperature Voltage
Standard 0°C to 70°C
Extended Temperature -40°C to 85°C
4.5-5.5V
Table 5-2: Absolute maximum power pin stress ratings
Parameter Symbol Min Max Unit
Power Supply Input VDD- VSS -0.3 5.5 V
Voltage on any pin except VDD with respect to GND VIN –ss – 0.3 VDD +0.3 V
5.1 AC Characteristics
Table 5-3: AC Characteristics Full Speed
Parameter Symbol Min Typ Max Unit
Rise Time T
FR
4
20 ns
Fall Time T
FF
4
20 ns
Differential Rise and
Fall Time Matching
T
FRFM
90 111.11 %
Driver Output
Resistance
Z
DRV
28
44
Table 5-4: AC Characteristics High Speed
Parameter Symbol Min Typ Max Unit
Rise Time (10%~90%) T
HSR
500
ps
Fall Time (10%~90%) T
HSF
500
ps
Driver Output
Resistance
Z
HSDRV
40.5
49.5
P1-P3P4-P6P7-P9P10-P12P13-P15P16-P18P19-P21P22-P24P25-P25

AP-UM004GT31EG-2MST

Mfr. #:
Buy AP-UM004GT31EG-2MST
Manufacturer:
Apacer
Description:
Managed NAND USB D-Module SLC 90D M-SCRW Non-REM LP4GB
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
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