MC74ACT132N

© Semiconductor Components Industries, LLC, 2015
January, 2015 − Rev. 8
1 Publication Order Number:
MC74AC132/D
MC74AC132, MC74ACT132
Quad 2-Input NAND Schmitt
Trigger
High−Performance Silicon−Gate CMOS
The MC74AC/74ACT132 contains four 2−input NAND gates
which are capable of transforming slowly changing input signals into
sharply defined, jitter−free output signals. In addition, they have
greater noise margin than conventional NAND gates.
Each circuit contains a 2−input Schmitt trigger. The Schmitt trigger
uses positive feedback to effectively speed−up slow input transitions,
and provide different input threshold voltages for positive and
negative-going transitions. This hysteresis between the positive−going
and negative−going input threshold is determined by resistor ratios
and is essentially insensitive to temperature and supply voltage
variations.
Features
Schmitt Trigger Inputs
Outputs Source/Sink 24 mA
ACT132 Has TTL Compatible Inputs
These are Pb−Free Devices
1314 12 11 10 9 8
21 34567
GND
V
CC
Figure 1. Pinout; 14−Lead Packages Conductors
(Top View)
FUNCTION TABLE
Inputs Output
A B Y
L L H
L H H
H L H
H H L
H = HIGH Voltage Level L = LOW Voltage Level
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See detailed ordering and shipping information in the package
dimensions section on page 5 of this data sheet.
ORDERING INFORMATION
MARKING
DIAGRAM
xxx = AC or ACT
A = Assembly Location
WL = Wafer Lot
Y = Year
WW = Work Week
G = Pb−Free Package
SOIC−14
D SUFFIX
CASE 751A
1
14
xxx132G
AWLYWW
1
14
MC74AC132, MC74ACT132
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2
MAXIMUM RATINGS
Symbol Parameter Value Unit
V
CC
DC Supply Voltage *0.5 to )7.0 V
V
I
DC Input Voltage *0.5 v V
I
v V
CC
)0.5 V
V
O
DC Output Voltage (Note 1) *0.5 v V
O
v V
CC
)0.5 V
I
IK
DC Input Diode Current $20 mA
I
OK
DC Output Diode Current $50 mA
I
O
DC Output Sink/Source Current $50 mA
I
CC
DC Supply Current per Output Pin $50 mA
I
GND
DC Ground Current per Output Pin $50 mA
T
STG
Storage Temperature Range *65 to )150 °C
T
L
Lead temperature, 1 mm from Case for 10 Seconds 260 °C
T
J
Junction temperature under Bias )150 °C
q
JA
Thermal Resistance (Note 2) 125 °C/W
P
D
Power Dissipation in Still Air at 85°C 125 mW
MSL Moisture Sensitivity Level 1
F
R
Flammability Rating Oxygen Index: 30% − 35% UL 94 V−0 @ 0.125 in
V
ESD
ESD Withstand Voltage Human Body Model (Note 3)
Machine Model (Note 4)
Charged Device Model (Note 5)
> 2000
> 200
> 1000
V
I
Latch−Up
Latch−Up Performance Above V
CC
and Below GND at 85°C (Note 6) $100 mA
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
1. I
O
absolute maximum rating must be observed.
2. The package thermal impedance is calculated in accordance with JESD51−7.
3. Tested to EIA/JESD22−A114−A.
4. Tested to EIA/JESD22−A115−A.
5. Tested to JESD22−C101−A.
6. Tested to EIA/JESD78.
RECOMMENDED OPERATING CONDITIONS
Symbol Parameter Min Typ Max Unit
V
CC
Supply Voltage
AC 2.0 5.0 6.0
V
ACT 4.5 5.0 5.5
V
in
, V
out
DC Input Voltage, Output Voltage (Ref. to GND) 0 V
CC
V
t
r
, t
f
Input Rise and Fall Time (Note 1)
AC Devices except Schmitt Inputs
V
CC
@ 3.0 V 150
V
CC
@ 4.5 V 40 ns/V
V
CC
@ 5.5 V 25
t
r
, t
f
Input Rise and Fall Time (Note 2)
ACT Devices except Schmitt Inputs
V
CC
@ 4.5 V 10
ns/V
V
CC
@ 5.5 V 8.0
T
J
Junction Temperature (PDIP) 140 °C
T
A
Operating Ambient Temperature Range −40 25 85 °C
I
OH
Output Current − High −24 mA
I
OL
Output Current − Low 24 mA
Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond
the Recommended Operating Ranges limits may affect device reliability.
1. V
in
from 30% to 70% V
CC
; see individual Data Sheets for devices that differ from the typical input rise and fall times.
2. V
in
from 0.8 V to 2.0 V; see individual Data Sheets for devices that differ from the typical input rise and fall times.
MC74AC132, MC74ACT132
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3
DC CHARACTERISTICS
Symbol Parameter
V
CC
(V)
74AC 74AC
Unit Conditions
T
A
= +25°C
T
A
=
−40°C to
+85°C
Typ Guaranteed Limits
V
OH
Minimum High Level
Output Voltage
3.0 2.99 2.9 2.9
I
OUT
= −50 mA
4.5 4.49 4.4 4.4 V
5.5 5.49 5.4 5.4
V
*V
IN
= V
IL
or V
IH
3.0 2.56 2.46 −12 mA
4.5 3.86 3.76 I
OH
−24 mA
5.5 4.86 4.76 −24 mA
V
OL
Maximum Low Level
Output Voltage
3.0 0.002 0.1 0.1
I
OUT
= 50 mA
4.5 0.001 0.1 0.1 V
5.5 0.001 0.1 0.1
V
*V
IN
= V
IL
or V
IH
3.0 0.36 0.44 12 mA
4.5 0.36 0.44 I
OL
24 mA
5.5 0.36 0.44 24 mA
I
IN
Maximum Input
Leakage Current
5.5 ±0.1 ±1.0
mA
V
I
= V
CC
, GND
I
OLD
†Minimum Dynamic
Output Current
5.5 75 mA V
OLD
= 1.65 V Max
I
OHD
5.5 −75 mA V
OHD
= 3.85 V Min
I
CC
Maximum Quiescent
Supply Current
5.5
4.0 40
mA
V
IN
= V
CC
or GND
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product
performance may not be indicated by the Electrical Characteristics if operated under different conditions.
*All outputs loaded; thresholds on input associated with output under test.
Maximum test duration 2.0 ms, one output loaded at a time.
NOTE: I
IN
and I
CC
@ 3.0 V are guaranteed to be less than or equal to the respective limit @ 5.5 V V
CC
.
AC CHARACTERISTICS
Symbol Parameter
V
CC
*
(V)
74AC 74AC
Unit
Fig.
No.
T
A
= +25°C
C
L
= 50 pF
T
A
= −40°C
to +85°C
C
L
= 50 pF
Min Typ Max Min Max
t
PLH
Propagation Delay
3.3 2.0 13.0 1.5 14.0
ns 3−5
5.0 2.0 9.0 1.5 10.0
t
PHL
Propagation Delay
3.3 2.0 13.5 1.5 15.0
ns 3−5
5.0 2.0 9.0 1.5 10.0
*Voltage Range 3.3 V is 3.3 V ±0.3 V.
Voltage Range 5.0 V is 5.0 V ±0.5 V.

MC74ACT132N

Mfr. #:
Manufacturer:
ON Semiconductor
Description:
IC GATE NAND 4CH 2-INP 14DIP
Lifecycle:
New from this manufacturer.
Delivery:
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