MAX4667/MAX4668/MAX4669
2.5
Ω
, Dual, SPST,
CMOS Analog Switches
_______________________________________________________________________________________ 5
Note 2: The algebraic convention, where the most negative value is a minimum and the most positive value a maximum, is used in
this data sheet.
Note 3: Guaranteed by design.
Note 4: ∆R
ON
= R
ON(MAX)
- R
ON(MIN).
Note 5: Flatness is defined as the difference between the maximum and minimum values of on-resistance as measured over the
specified analog signal range.
Note 6: Leakage parameters are 100% tested at maximum-rated hot temperature and guaranteed by correlation at +25°C.
Note 7: Off-isolation = 20log
10
[V
COM
/ (V
NC
or V
NO
)], V
COM
= output, V
NC
or V
NO
= input to off switch.
Note 8: Between any two switches.
Note 9: Leakage testing at single supply is guaranteed by testing with dual supplies.
ELECTRICAL CHARACTERISTICS—Single Supply (continued)
(V+ = +12V, V- = 0, V
L
= +5V, V
IN_H
= +2.4V, V
IN_L
= +0.8V, T
A
= T
MIN
to T
MAX
, unless otherwise noted. Typical values are at
T
A
= +25°C.) (Note 2)
V
IN
= 0 or 5V
T
A
= +25°C
-0.5 0.001 0.5
I+Positive Supply Current
T
A
= +25°C
f = 1MHz, Figure 6, T
A
= +25°C
R
L
= 50Ω, C
L
= 5pF, f = 1MHz, Figure 5
T
A
= T
MIN
to T
MAX
-5 5
V
COM
= 10V
T
A
= +25°C
f = 1MHz, Figure 6, T
A
= +25°C
CONDITIONS
V4.5 36.0Power-Supply Range
pF
dB
f = 1MHz, Figure 7, T
A
= +25°C pF185C
COM
On-Capacitance
µA
µA
µA
105C
COM
COM Off-Capacitance
-0.5 0.001 0.5
I
L
Logic Supply Current
pF105C
OFF
NC or NO Capacitance
-66V
CT
Crosstalk (Note 8)
ns10
Break-Before-Make Time Delay
(MAX4669)
-0.5 0.001 0.5
I
GND
Ground Current
200 400
100 200
UNITSMIN TYP MAXSYMBOLPARAMETER
V
IN
= 0 or 5V
V
IN
= 0 or 5V
T
A
= T
MIN
to T
MAX
-5 5
T
A
= T
MIN
to T
MAX
-5 5
ns
500
t
ON
Turn-On Time (Note 3)
V
COM_
= 10V,
Figure 2
ns
300
t
OFF
Turn-Off Time (Note 3)
V
COM_
= 10V,
Figure 2
T
A
= +25°C
T
A
= T
MIN
to T
MAX
T
A
= +25°C
T
A
= T
MIN
to T
MAX
C
L
= 1.0nF, V
GEN
= 0, R
GEN
= 0, Figure 3 pC50QCharge Injection
POWER SUPPLY
SWITCH DYNAMIC CHARACTERISTICS