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74LV4051N,112

P1-P3P4-P6P7-P9P10-P12P13-P15P16-P18P19-P21P22-P24P25-P27
74LV4051 All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2014. All rights reserved.
Product data sheet Rev. 5 — 17 September 2014 16 of 27
NXP Semiconductors
74LV4051
8-channel analog multiplexer/demultiplexer
10.2.1 Test circuits
V
CC
= 3.0 V; GND = 0 V; V
EE
=-3.0V; R
L
=50;
R
SOURCE
=1k.
Fig 16. Test circuit for measuring frequency response Fig 17. Typical frequency response
dB
001aak420
GND
f
i
2R
L
2R
L
C
L
GND = V
EE
S0 to S2
E
Z
V
IH
or V
IL
V
CC
V
CC
Yn
0.1 μF
001aak361
0
5
(dB)
−5
f (kHz)
10 10
6
10
5
10
2
10
4
10
3
V
CC
= 3.0 V; GND = 0 V; V
EE
=-3.0V; R
L
=50;
R
SOURCE
=1k.
Fig 18. Test circuit for measuring isolation (OFF-state) Fig 19. Typical isolation (OFF-state) as function of
frequency
dB
001aak421
V
CC
f
i
2R
L
2R
L
C
L
GND = V
EE
S0 to S2
E
Z
V
IH
or V
IL
V
CC
V
CC
Yn
0.1 μF
001aak360
−50
0
(dB)
−100
f (kHz)
10 10
6
10
5
10
2
10
4
10
3
74LV4051 All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2014. All rights reserved.
Product data sheet Rev. 5 — 17 September 2014 17 of 27
NXP Semiconductors
74LV4051
8-channel analog multiplexer/demultiplexer
Fig 20. Test circuit for measuring total harmonic distortion
D
001aak422
GND
f
i
2R
L
2R
L
C
L
GND = V
EE
S0 to S2
E
Z
V
IH
or V
IL
V
CC
V
CC
Yn
10 μF
a. Test circuit
b. Input and output pulse definitions
V
I
may be connected to Sn or E.
Fig 21. Test circuit for measuring crosstalk voltage between digital inputs and switch
001aak423
V
IH
or V
IL
V
CC
GND = V
EE
S0 to S2
E
Z
V
CC
V
CC
Yn
G
V
2R
L
2R
L
2R
L
2R
L
C
L
V
O
DDM
RQ
9
2
9
FW
RIIRII
ORJLF
LQSXW6Q(
74LV4051 All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2014. All rights reserved.
Product data sheet Rev. 5 — 17 September 2014 18 of 27
NXP Semiconductors
74LV4051
8-channel analog multiplexer/demultiplexer
a. Switch closed condition
b. Switch open condition
Fig 22. Test circuit for measuring crosstalk between switches
001aak434
GND
V
O
2R
L
2R
L
C
L
R
L
2R
L
GND = V
EE
S0 to S2
E
Z
Y0
V
IH
or V
IL
V
CC
V
CC
2R
L
V
CC
Yn
V
I
0.1 μF
dB
001aak435
GND
V
I
2R
L
2R
L
R
L
2R
L
GND = V
EE
S0 to S2
E
Z
Y0
V
IH
or V
IL
V
CC
V
CC
2R
L
V
CC
2R
L
V
CC
Yn
V
O
C
L
dB
P1-P3P4-P6P7-P9P10-P12P13-P15P16-P18P19-P21P22-P24P25-P27

74LV4051N,112

Mfr. #:
Buy 74LV4051N,112
Manufacturer:
NXP Semiconductors
Description:
Multiplexer Switch ICs 8-CHANNEL MUX/DEMUX
Lifecycle:
New from this manufacturer.
Delivery:
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