ADIS16260/ADIS16265 Data Sheet
Rev. E | Page 4 of 20
Parameter Test Conditions/Comments Min Typ Max Unit
DAC OUTPUT 5 kΩ/100 pF to GND
Resolution 12 Bits
Relative Accuracy For Code 101 to Code 4095 4 LSB
Differential Nonlinearity 1 LSB
Gain Error ±0.5 %
Output Range 0 2.5 V
Output Impedance 2 Ω
Output Settling Time 10 µs
LOGIC INPUTS Internal 3.3 V interface
Input High Voltage, V
INH
2.0 V
Input Low Voltage, V
INL
0.8 V
Logic 1 Input Current, I
INH
V
IH
= 3.3 V ±0.2 ±10 µA
INL
IL
All Except RST
−40 −60 µA
RST The RST pin has an internal pull-up.
−1 mA
Input Capacitance, C
IN
10 pF
DIGITAL OUTPUTS Internal 3.3 V interface
Output High Voltage, V
OH
I
SOURCE
= 1.6 mA 2.4 V
Output Low Voltage, V
OL
I
SINK
= 1.6 mA 0.4 V
SLEEP TIMER
Timeout Period
3
0.5 128 sec
START-UP TIME
Initial Start-Up Time 165 ms
Sleep Mode Recovery 2.5 ms
Flash Update Time 50 ms
Flash Test Process Time Normal mode, SMPL_PRD[7:0] ≤ 0x07 18 ms
Low power mode, SMPL_PRD[7:0] ≥ 0x08
FLASH MEMORY
Endurance
4
20,000 Cycles
Data Retention
5
T
J
= 55°C 10 Years
CONVERSION RATE
Maximum Conversion Time SMPL_PRD[7:0] = 0xFF 7.75 sec
Maximum Throughput Rate SMPL_PRD[7:0] = 0x00 2048 SPS
Minimum Throughput Rate SMPL_PRD[7:0] = 0xFF 0.129 SPS
POWER SUPPLY
Operating Voltage Range, V
CC
4.75 5.0 5.25 V
Power Supply Current Low power mode, SMPL_PRD[7:0] ≥ 0x08 17 mA
Normal mode, SMPL_PRD[7:0] ≤ 0x07 41 mA
Sleep mode 350 µA
1
ADIS16260/ADIS16265 characterization data represents ±4σ to fall within the ±1% limit.
2
The maximum guaranteed measurement range is ±320°/sec. The sensor outputs will measure beyond this range, but performance is not assured.
3
Guaranteed by design.
4
Endurance is qualified as per JEDEC Standard 22, Method A117, and measured at −40°C, +25°C, +85°C, and +125°C.
5
Retention lifetime equivalent at a junction temperature (T
J
) of 55°C, as per JEDEC Standard 22, Method A117. Retention lifetime decreases with junction temperature.
