MC100EPT622
http://onsemi.com
3
Table 2. ATTRIBUTES
Characteristics Value
Internal Input Pulldown Resistor N/A
Internal Input Pullup Resistor N/A
ESD Protection Human Body Model
Machine Model
Charged Device Model
> 2 kV
> 150 V
> 2 kV
Moisture Sensitivity, Indefinite Time Out of Drypack Pb Pkg Pb−Free Pkg
LQFP−32
QFN−32
Level 2
N/A
Level 2
Level 1
Flammability Rating Oxygen Index: 28 to 34 UL 94 V−0 @ 0.125 in
Transistor Count 596 Devices
Meets or exceeds JEDEC Spec EIA/JESD78 IC Latchup Test
Table 3. MAXIMUM RATINGS
Symbol Parameter Condition 1 Condition 2 Rating Unit
V
CC
Power Supply V
EE
= 0 V 5 V
V
I
Input Voltage V
EE
= 0 V V
I
V
CC
5 to 0 V
I
out
Output Current Continuous
Surge
50
100
mA
mA
T
A
Operating Temperature Range −40 to +85 °C
T
stg
Storage Temperature Range −65 to +150 °C
q
JA
Thermal Resistance (Junction−to−Ambient) 0 lfpm
500 lfpm
32 LQFP
32 LQFP
80
55
°C/W
°C/W
q
JC
Thermal Resistance (Junction−to−Case) Standard Board 32 LQFP 12 to 17 °C/W
q
JA
Thermal Resistance (Junction−to−Ambient) 0 lfpm
500 lfpm
QFN−32
QFN−32
31
27
°C/W
°C/W
q
JC
Thermal Resistance (Junction−to−Case) 2S2P QFN−32 12 °C/W
T
sol
Wave Solder Pb
Pb−Free
265
265
°C
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
Table 4. TTL INPUT DC CHARACTERISTICS V
CC
= 3.3 V, GND= 0.0 V, T
A
= −40°C to 85°C
Symbol
Characteristic Condition Min Typ Max Unit
I
IH
Input HIGH Current V
IN
= 2.7 V 25
mA
I
IHH
Input HIGH Current MAX V
IN
= V
CC
100
mA
I
IL
Input LOW Current V
IN
= 0.5 V −0.6 mA
V
IK
Input Clamp Voltage I
IN
= −18 mA −1.2 −0.9 V
V
IH
Input HIGH Voltage 2.0 V
V
IL
Input LOW Voltage 0.8 V
NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit
board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared
operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit
values are applied individually under normal operating conditions and not valid simultaneously.
