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Reliability Report 1SC0450E2A0
Scope
The goal of this document is to explain reliability tests done on 1SC0450E2A0 family. Following drivers are
covered by this family:
- 1SC0450E2A0-45
- 1SC0450E2A0-65
Serial Environmental Load
Serial stress: all the tests in the table below are done on the same samples
IEC 60068-2-6:2007-12: Frequency range: 5Hz to 200Hz
Cross-over frequency: 8.4Hz
Displacement amplitude below cross-over frequency: ±3.5mm
Acceleration amplitude above cross-over frequency: 1g
Sweep rate: 1.0 Okt/min
Test duration per axis: 20 sweeps (X, Y and Z)
DUT not powered
IEC 60068-2-27:2008-02: Pulse shape: Half-sine
Peak acceleration: 15g
Corresponding duration of the nominal pulse: 6ms
Number of shocks in each of the six directions: 100
Axis: X, Y and Z (pos. and neg.)
DUT not powered
IEC 60068-2-1:2007-03: Test: Ae
Temperature: -40°C
Duration: 96h
DUT powered
IEC 60068-2-2:2007-07: Test:Be
Temperature: 85°C
Duration: 96h
DUT powered
IEC 60068-2-14:2009-01: Test: Nb
Cycles: 2
Start temperature: 20°C
Low temperature: -40°C
High temperature: 85°C
Rate of change: 10K/min
Exposure time at lower/upper temperature: 30min
DUT powered
IEC 60068-2-78:2012-10: Temperature: 40°C
Relative humidity: 93%
Duration of test: 96h
DUT not powered
