NX3L2T66 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2013. All rights reserved.
Product data sheet Rev. 7 — 8 February 2013 10 of 21
NXP Semiconductors
NX3L2T66
Dual low-ohmic single-pole single-throw analog switch
12.1 Waveform and test circuits
Measurement points are given in Table 10.
Logic level: V
OH
is the typical output voltage level that occurs with the output load.
Fig 16. Enable and disable times
001aah376
nY output
OFF to HIGH
HIGH to OFF
nE input
V
I
V
OH
GND
GND
V
M
t
en
t
dis
V
X
V
X
switch
enabled
switch
disabled
switch
disabled
Table 10. Measurement points
Supply voltage Input Output
V
CC
V
M
V
X
1.4 V to 4.3 V 0.5V
CC
0.9V
OH
Test data is given in Table 11.
Definitions test circuit:
R
L
= Load resistance.
C
L
= Load capacitance including jig and probe capacitance.
V
EXT
= External voltage for measuring switching times.
Fig 17. Test circuit for measuring switching times
001aaj224
nE
nY/nZ nZ/nY
R
L
C
L
V
CC
V
EXT
= 1.5 V
V
I
V
V
O
G
Table 11. Test data
Supply voltage Input Load
V
CC
V
I
t
r
, t
f
C
L
R
L
1.4 V to 4.3 V V
CC
2.5ns 35pF 50
NX3L2T66 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2013. All rights reserved.
Product data sheet Rev. 7 — 8 February 2013 11 of 21
NXP Semiconductors
NX3L2T66
Dual low-ohmic single-pole single-throw analog switch
12.2 Additional dynamic characteristics
[1] f
i
is biased at 0.5V
CC
.
12.3 Test circuits
Table 12. Additional dynamic characteristics
At recommended operating conditions; voltages are referenced to GND (ground = 0 V); V
I
= GND or V
CC
(unless otherwise
specified); t
r
= t
f

2.5 ns.
Symbol Parameter Conditions T
amb
= 25 C Unit
Min Typ Max
THD total harmonic
distortion
f
i
=20Hzto20 kHz; R
L
=32; see Figure 18
[1]
V
CC
=1.4V; V
I
= 1 V (p-p) - 0.15 - %
V
CC
=1.65V; V
I
= 1.2 V (p-p) - 0.10 - %
V
CC
=2.3V; V
I
= 1.5 V (p-p) - 0.02 - %
V
CC
=2.7V; V
I
= 2 V (p-p) - 0.02 - %
V
CC
=4.3V; V
I
= 2 V (p-p) - 0.02 - %
f
(3dB)
3 dB frequency
response
R
L
=50; see Figure 19
[1]
V
CC
= 1.4 V to 4.3 V - 60 - MHz
iso
isolation (OFF-state) f
i
= 100 kHz; R
L
=50; see Figure 20
[1]
V
CC
= 1.4 V to 4.3 V - 90 - dB
V
ct
crosstalk voltage between digital inputs and switch;
f
i
= 1 MHz; C
L
= 50 pF; R
L
=50; see Figure 21
V
CC
= 1.4 V to 3.6 V - 0.2 - V
V
CC
= 3.6 V to 4.3 V - 0.2 - V
Xtalk crosstalk between switches;
f
i
= 100 kHz; R
L
=50;seeFigure 22
[1]
V
CC
= 1.4 V to 4.3 V - 90 - dB
Q
inj
charge injection f
i
= 1 MHz; C
L
= 0.1 nF; R
L
=1 M; V
gen
=0V;
R
gen
=0; see Figure 23
V
CC
= 1.5 V - 3 - pC
V
CC
= 1.8 V - 3 - pC
V
CC
=2.5V - 3 - pC
V
CC
=3.3V - 3 - pC
V
CC
=4.3V - 6 - pC
Fig 18. Test circuit for measuring total harmonic distortion
001aaj225
V
IH
V
CC
0.5V
CC
nZ/nYnY/nZ
nE
f
i
R
L
D
NX3L2T66 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2013. All rights reserved.
Product data sheet Rev. 7 — 8 February 2013 12 of 21
NXP Semiconductors
NX3L2T66
Dual low-ohmic single-pole single-throw analog switch
Adjust f
i
voltage to obtain 0 dBm level at output. Increase f
i
frequency until dB meter reads 3dB.
Fig 19. Test circuit for measuring the frequency response when channel is in ON-state
001aaj226
V
IH
V
CC
0.5V
CC
nZ/nYnY/nZ
nE
f
i
R
L
dB
Adjust f
i
voltage to obtain 0 dBm level at input.
Fig 20. Test circuit for measuring isolation (OFF-state)
001aaj227
V
IL
V
CC
0.5V
CC
nZ/nYnY/nZ
nE
f
i
R
L
0.5V
CC
R
L
dB

NX3L2T66GT,115

Mfr. #:
Manufacturer:
NXP Semiconductors
Description:
Analog Switch ICs DUAL LO-OHMIC SINGLE POLE/THROW ANALOG SW
Lifecycle:
New from this manufacturer.
Delivery:
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