Two-Wire High Precision Linear Hall-Effect Sensor IC
With Pulse Width Modulated Output Current
A1357
7
Allegro MicroSystems, LLC
115 Northeast Cutoff
Worcester, Massachusetts 01615-0036 U.S.A.
1.508.853.5000; www.allegromicro.com
Characteristic Definitions
Power-On Time When the supply is ramped to its operating
voltage, the device requires a finite time to power its internal
components before supplying a valid PWM output duty-cycle.
Power-On Time, t
PO
, is defined as the time it takes for the output
voltage to settle within ±10% of its steady state value after the
power supply has reached its minimum specified operating volt-
age, V
CC
(min). (See figure 1.)
Propagation Delay Traveling time of signal from input Hall
plate to output stage of device. (See figure 2.)
Response Time The time interval, t
RESPONSE
, between
a) when the applied magnetic field reaches 90% of its final value,
and b) when the sensor IC reaches 90% of its output correspond-
ing to the applied magnetic field. (See figure 2.)
PWM
OUT
Rise Time The time, t
r
, elapsed between 10% and
90% of the rising signal value when output current switches from
low to high states.
PWM
OUT
Fall Time The time, t
f
, elapsed between 90% and
10% of the falling signal value when output current switches
from high to low states.
Quiescent Current Duty Cycle In the quiescent state (no
significant magnetic field: B = 0 G), the Quiescent Current Duty
Cycle, D
(Q)
, equals a specific programmed duty cycle throughout
the entire operating ranges of V
CC
and ambient temperature, T
A
.
Guaranteed Quiescent Current Duty Cycle Range The
Quiescent Current Duty Cycle, D
(Q)
, can be programmed around
its nominal value of 50% D, within the Guaranteed Quiescent
Duty Cycle Range limits: D
(Q)
(min) and D
(Q)
(max). The available
guaranteed programming range for D
(Q)
falls within the distribu-
tions of the minimum and the maximum programming code for
setting D
(Q)
. (See figure 3.)
Average Quiescent Current Duty Cycle Step Size The
Average Quiescent Current Duty Cycle Step Size, Step
D(Q)
, for a
single device is determined using the following calculation:
D
(Q)
(max)
D
(Q)
(min)
2
n
–1
Step
D(Q)
=
,
(1)
where:
n is the number of available programming bits in the trim range,
2
n
1 is the value of programming steps in the range,
D
(Q)
(max) is the maximum reached quiescent duty cycle, and
D
(Q)
(min) is minimum reached quiescent duty cycle.
Figure 1. Definition of Power-On Time
Figure 2. Definitions of Propagation Delay and Response Time
Figure 3. Definition of Guaranteed Quiescent Voltage Output Range
Guaranteed D
(Q)
Programming
Range
D
(Q)
(min) D
(Q)
(max)
Max Code D
(Q)
Distribution
Min Code D
(Q)
Distribution
Initial D
(Q)
Distribution
Time
Time
V
CC
(min)
t
PO
First valid duty cycle
V
CC
I
CC
Time
B-field
Icc
Propagation
Delay
1ms
A
B
ADC
BDC
ADC DC corresponds to the A field
BDC DC corresponds to the B field
C
Response
Time
0.9 ×
C
CDC
CDC – DC corresponds to the 0.9
×
C field
Two-Wire High Precision Linear Hall-Effect Sensor IC
With Pulse Width Modulated Output Current
A1357
8
Allegro MicroSystems, LLC
115 Northeast Cutoff
Worcester, Massachusetts 01615-0036 U.S.A.
1.508.853.5000; www.allegromicro.com
Quiescent Current Duty Cycle Output Programming
Resolution The programming resolution for any device is half
of its programming step size. Therefore, the typical programming
resolution will be:
Err
PGD(Q)
(typ)
=
0.5 × Step
D(Q)
(typ)
.
(2)
Quiescent Duty Cycle Output Drift through Tempera-
ture Range Due to internal component tolerances and thermal
considerations, the Quiescent Duty Cycle Temperature Coef-
ficient, D
TC(Q)
, may drift from its nominal value over the operat-
ing ambient temperature, T
A
. For purposes of specification, the
Quiescent Duty Cycle Output Drift Through Temperature Range,
D
(Q)
(% D), is defined as:
D
(Q)(TA)
D
(Q)(25°C)
D
(Q)
=
,
(3)
where D
(Q)(TA)
is the quiescent duty cycle measured at T
A
and
D
(Q)(25°C)
is the quiescent duty cycle measured at 25°C.
Sensitivity The presence of a south polarity magnetic field,
perpendicular to the branded surface of the package face,
increases the current duty cycle from its quiescent value toward
the maximum duty cycle limit. The amount of the current duty
cycle increase is proportional to the magnitude of the magnetic
field applied. Conversely, the application of a north polarity
field decreases the current duty cycle from its quiescent value.
This proportionality is specified as the magnetic Sensitiv-
ity, Sens ((% D)/G), of the device, and it is defined for bipolar
devices as:
D
(BPOS)
D
(BNEG)
BPOS – BNEG
Sens
=
,
(4)
and for unipolar devices as:
D
(BPOS)
D
(Q)
BPOS
Sens
=
,
(5)
where BPOS and BNEG are two magnetic fields with opposite
polarities.
Guaranteed Sensitivity Range The magnetic Sensitivity can
be programmed from its initial value, Sens
init
, to a value within
the Guaranteed Sensitivity Range limits: Sens
Range
(min) and
Sens
Range
(max).
Average Sensitivity Step Size Refer to the Average Qui-
escent Current Duty Cycle Step Size section for a conceptual
explanation.
Sensitivity Programming Resolution Refer to the Quies-
cent Current Duty Cycle Programming Resolution section for a
conceptual explanation.
Carrier Frequency Target The PWM
OUT
signal Carrier
Frequency Programming Range, f
PWM
, can be programmed to its
typical value of 1 kHz.
Average Carrier Frequency Step Size Refer to the Average
Quiescent Current Duty Cycle Step Size section for a conceptual
explanation.
Carrier Frequency Programming Resolution Refer to the
Quiescent Durrent Duty Cycle Programming Resolution section
for a conceptual explanation.
Sensitivity Temperature Coefficient Device sensitiv-
ity changes as temperature changes, with respect to its pro-
grammed Sensitivity Temperature Coefficient, Sens
TC
. Sens
TC
is programmed at 150°C, and calculated relative to the nominal
sensitivity programming temperature of 25°C. Sens
TC
(%/°C) is
defined as:
Sens
T2
– Sens
T1
Sens
T1
T2–T1
1
Sens
TC
=
×
100%
,
(6)
where T1 is the nominal Sens programming temperature of 25°C,
and T2 is the programming temperature of 150°C. The expected
value of Sens through the full ambient temperature range,
Sens
EXPECTED(TA)
, is defined as:
Sens
T1
× [100% +Sens
TC
(T
A
T1)]
Sens
EXPECTED(TA)
=
.
100 %
(7)
Sens
EXPECTED (TA)
should be calculated using the actual measured
values of Sens
T1
and Sens
TC
rather than programming target
values.
Sensitivity Drift Through Temperature Range Second
order Sensitivity Temperature Coefficient effects cause the mag-
netic Sensitivity, Sens, to drift from its expected value through
the operating ambient temperature range, T
A
. For purposes of
specification, the Sensitivity Drift Through Temperature Range,
Sens
TC
, is defined as:
Sens
TA
– Sens
EXPECTED(TA)
Sens
EXPECTED(TA)
Sens
TC
=
×
100%
.
(8)
Sensitivity Drift Due to Package Hysteresis Package
stress and relaxation can cause the device Sensitivity at T
A
=
25°C to change during and after temperature cycling.
Two-Wire High Precision Linear Hall-Effect Sensor IC
With Pulse Width Modulated Output Current
A1357
9
Allegro MicroSystems, LLC
115 Northeast Cutoff
Worcester, Massachusetts 01615-0036 U.S.A.
1.508.853.5000; www.allegromicro.com
For purposes of specification, the Sensitivity Drift Due to Pack-
age Hysteresis, Sens
PKG
, is defined as:
Sens
(25°C)2
– Sens
(25°C)1
Sens
(25°C)1
Sens
PKG
=
×
100%
,
(9)
where Sens
(25°C)1
is the programmed value of sensitivity at T
A
=
25°C, and Sens
(25°C)2
is the value of sensitivity at T
A
= 25°C,
after temperature cycling T
A
up to 150°C, down to –40°C, and
back to up 25°C.
Linearity Sensitivity Error The A1357 is designed to provide
a linear current output in response to a ramping applied magnetic
field. Consider two magnetic fields, B1 and B2. Ideally, the sen-
sitivity of a device is the same for both fields, for a given supply
voltage and temperature. Linearity error is present when there is a
difference between the sensitivities measured at B1 and B2.
Linearity Sensitivity Error is calculated separately for the positive
(Lin
ERRPOS
) and negative (Lin
ERRNEG
) applied magnetic fields.
Linearity error (%) is measured and defined as:
Sens
BPOS2
Sens
BPOS1
Sens
BNEG2
Sens
BNEG1
1–
Lin
ERRPOS
=
×
100%
,
1–
Lin
ERRNEG
=
×
100%
,
(10)
where:
|D
(Bx)
D
(Q)
|
B
x
Sens
Bx
=
.
(11)
and B
POSx
and B
NEGx
are positive and negative magnetic fields,
with respect to the quiescent current duty cycle such that B
POS2
=
2 × B
POS1
and B
NEG2
= 2 × B
NEG1
.
Then:
Lin
ERR
max(
Lin
ERRPOS
, Lin
ERRNEG
)
=
.
(12)
Note that unipolar devices only have positive linearity error
(Lin
ERRPOS
).
Symmetry Sensitivity Error The magnetic sensitivity of the
A1357 device is constant for any two applied magnetic fields of
equal magnitude and opposite polarities. Symmetry Sensitivity
Error, Sym
ERR
(%), is measured and defined as:
Sens
BPOS
Sens
BNEG
1–
Sym
ERR
=
×
100%
,
(13)
where Sens
Bx
is as defined in equation 11, and BPOS and BNEG
are positive and negative magnetic fields such that |BPOS| =
|BNEG|. Note that the Symmetry Sensitivity Error specification is
valid only for bipolar devices.
Duty Cycle Jitter The duty cycle of the PWM
OUT
output may
vary slightly over time despite the presence of a constant applied
magnetic field and a constant Carrier Frequency, f
PWM
, for the
PWM
OUT
signal. This phenomenon is known as jitter, and is
defined as:
Jitter
PWM
=
,
3 S
D
Bi
±
1
n
n
i=1
(14)
where D
B1
,…, D
Bn
are the sampled duty cycles in a constant
applied magnetic field, B, measured over 1000 PWM clock peri-
ods, and Jitter
PWM
is given in % D.

A1357LKB-T

Mfr. #:
Manufacturer:
Description:
SENSOR HALL EFFECT PWM 3SIP
Lifecycle:
New from this manufacturer.
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