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Table 6: DC Specifications
Symbol Parameter
Test Condition Value
Unit
V
CC
(V)
T
A
= 25°C
-40 to 85°C -55 to 125°C
Min. Typ. Max. Min. Max. Min. Max.
V
IH
High Level Input
Voltage
2.0 1.5 1.5 1.5
V
3.0 to
5.5
0.7V
CC
0.7V
CC
0.7V
CC
V
IL
Low Level Input
Voltage
2.0 0.5 0.5 0.5
V
3.0 to
5.5
0.3V
CC
0.3V
CC
0.3V
CC
V
OH
High Level Output
Voltage
2.0
I
O
=-50 µA
1.9 2.0 1.9 1.9
V
3.0
I
O
=-50 µA
2.9 3.0 2.9 2.9
4.5
I
O
=-50 µA
4.4 4.5 4.4 4.4
3.0
I
O
=-4 mA
2.58 2.48 2.4
4.5
I
O
=-8 mA
3.94 3.8 3.7
V
OL
Low Level Output
Voltage
2.0
I
O
=50 µA
0.0 0.1 0.1 0.1
V
3.0
I
O
=50 µA
0.0 0.1 0.1 0.1
4.5
I
O
=50 µA
0.0 0.1 0.1 0.1
3.0
I
O
=4 mA
0.36 0.44 0.55
4.5
I
O
=8 mA
0.36 0.44 0.55
I
OZ
High Impedance
Output Leakage
Current
5.5
V
I
= V
IH
or V
IL
V
O
= V
CC
or GND
±0.25 ± 2.5 ± 2.5 µA
I
I
Input Leakage
Current
0 to
5.5
V
I
= 5.5V or GND
± 0.1 ± 1 ± 1 µA
I
CC
Quiescent Supply
Current
5.5
V
I
= V
CC
or GND
44040µA
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74VHC373
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Table 7: AC Electrical Characteristics (Input t
r
= t
f
= 3ns)
(*) Voltage range is 3.3V ± 0.3V
(**) Voltage range is 5.0V ±
0.5V
Note 1 : Parameter guaranteed by design. t
soLH
= |t
pLHm
- t
pLHn
|, t
soHL
= |t
pHLm
- t
pHLn
|
Table 8: Capacitive Characteristics
1) C
PD
is defined as the value of the IC’s internal equivalent capacitance which is calculated from the operating current consumption without
load. (Refer to Test Circuit). Average operating current can be obtained by the following equation. I
CC(opr)
= C
PD
x V
CC
x f
IN
+ I
CC
/8 (per Latch)
Symbol Parameter
Test Condition Value
Unit
V
CC
(V)
C
L
(pF)
T
A
= 25°C
-40 to 85°C -55 to 125°C
Min. Typ. Max. Min. Max. Min. Max.
t
PLH
t
PHL
Propagation Delay
Time
LE to Q
3.3
(*)
15 7.0 11.0 1.0 13.0 1.0 13.0
ns
3.3
(*)
50 9.5 14.5 1.0 16.5 1.0 16.5
5.0
(**)
15 4.9 7.2 1.0 8.5 1.0 8.5
5.0
(**)
50 6.4 9.2 1.0 10.5 1.0 10.5
t
PLH
t
PHL
Propagation Delay
Time
D to Q
3.3
(*)
15 7.3 11.4 1.0 13.5 1.0 13.5
ns
3.3
(*)
50 9.8 14.9 1.0 17.0 1.0 17.0
5.0
(**)
15 5.0 7.2 1.0 8.5 1.0 8.5
5.0
(**)
50 6.5 9.2 1.0 10.5 1.0 10.5
t
PZL
t
PZH
Output Enable
Time
3.3
(*)
15
R
L
= 1K
7.3 11.4 1.0 13.5 1.0 13.5
ns
3.3
(*)
50
R
L
= 1K
9.8 14.9 1.0 17.0 1.0 17.0
5.0
(**)
15
R
L
= 1K
5.5 8.1 1.0 9.5 1.0 9.5
ns
5.0
(**)
50
R
L
= 1K
7.0 10.1 1.0 11.5 1.0 11.5
t
PLZ
t
PHZ
Output Disable
Time
3.3
(*)
50
R
L
= 1K
9.5 13.2 1.0 15.0 1.0 15.0
ns
5.0
(**)
50
R
L
= 1K
6.5 9.2 1.0 10.5 1.0 10.5
t
w
Pulse Width (LE)
HIGH
3.3
(*)
5.0 5.0 5.0
ns
5.0
(**)
5.0 5.0 5.0
t
s
Setup Time D to LE
HIGH or LOW
3.3
(*)
4.0 4.0 4.0
ns
5.0
(**)
4.0 4.0 4.0
t
h
Setup Time D to LE
HIGH or LOW
3.3
(*)
1.0 1.0 1.0
ns
5.0
(**)
1.0 1.0 1.0
t
OSLH
t
OSHL
Output to Output
Skew time (note 1)
3.3
(*)
50 1.5 1.5 1.5
ns
5.0
(**)
50 1.0 1.0 1.0
Symbol Parameter
Test Condition Value
Unit
T
A
= 25°C
-40 to 85°C -55 to 125°C
Min. Typ. Max. Min. Max. Min. Max.
C
IN
Input Capacitance
710 10 10pF
C
OUT
Output
Capacitance
9pF
C
PD
Power Dissipation
Capacitance
(note 1)
15 pF
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Table 9: Dynamic Switching Characteristics
1) Worst case package.
2) Max number of outputs defined as (n). Data inputs are driven 0V to 5.0V, (n-1) outputs switching and one output at GND.
3) Max number of data inputs (n) switching. (n-1) switching 0V to 5.0V. Inputs under test switching: 5.0V to threshold (V
ILD
), 0V to threshold
(V
IHD
), f=1MHz.
Figure 4: Test Circuit
C
L
=15/50pF or equivalent (includes jig and probe capacitance)
R
L
= R1 = 1Kor equivalent
R
T
= Z
OUT
of pulse generator (typically 50)
Symbol Parameter
Test Condition Value
Unit
V
CC
(V)
T
A
= 25°C
-40 to 85°C -55 to 125°C
Min. Typ. Max. Min. Max. Min. Max.
V
OLP
Dynamic Low
Voltage Quiet
Output (note 1, 2)
5.0
C
L
= 50 pF
0.6 0.9
V
V
OLV
-0.9 -0.6
V
IHD
Dynamic High
Voltage Input
(note 1, 3)
5.0 3.5 V
V
ILD
Dynamic Low
Voltage Input
(note 1, 3)
5.0 1.5 V
TEST SWITCH
t
PLH
, t
PHL
Open
t
PZL
, t
PLZ
V
CC
t
PZH
, t
PHZ
GND
Obsolete Product(s) - Obsolete Product(s)

74VHC373MTR

Mfr. #:
Manufacturer:
STMicroelectronics
Description:
Latches HiRel & Standard Products
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