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74FCT16374ETPVG8

P1-P3P4-P6P7-P7
1
IDT54/74FCT16374AT/CT/ET
FAST CMOS 16-BIT REGISTER (3-STATE)
MILITARY AND INDUSTRIAL TEMPERATURE RANGES
SEPTEMBER 2009
IDT54/74FCT16374AT/CT/ET
MILITARY AND INDUSTRIAL TEMPERATURE RANGES
FAST CMOS 16-BIT
REGISTER (3-STATE)
FEATURES:
• 0.5 MICRON CMOS Technology
• High-speed, low-power CMOS replacement for ABT functions
• Typical tSK(o) (Output Skew) < 250ps
• Low input and output leakage
≤≤
≤≤
≤1µA (max.)
• ESD > 2000V per MIL-STD-883, Method 3015; > 200V using
machine model (C = 200pF, R = 0)
•VCC = 5V ±10%
• High drive outputs (–32mA IOH, 64mA IOL)
• Power off disable outputs permit “live insertion”
• Typical VOLP (Output Ground Bounce) < 1.0V at VCC = 5V,
TA = 25°C
• Available in the following packages:
– Industrial: SSOP, TSSOP
– Military: CERPACK
FUNCTIONAL BLOCK DIAGRAM
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
© 2009 Integrated Device Technology, Inc. DSC-5452/7
DESCRIPTION:
The FCT16374T 16-bit edge-triggered D-type register is built using
advanced dual metal CMOS technology. These high-speed, low-power
registers are ideal for use as buffer registers for data synchronization and
storage. The Output Enable (xOE) and clock (xCLK) controls are organized
to operate each device as two 8-bit registers or one 16-bit register with
common clock. Flow-through organization of signal pins simplifies layout. All
inputs are designed with hysteresis for improved noise margin.
The FCT16374T is ideally suited for driving high-capacitance loads and
low-impedance backplanes. The output buffers are designed with power off
disable capability to allow "live insertion" of boards when used as backplane
drivers.
2
O
1
2
OE
2
CLK
2
D
1
TO SEVEN OTHER CHANNELS
C
D
1
OE
1
CLK
1
O
1
1
D
1
TO SEVEN OTHER CHANNELS
C
D
2
MILITARY AND INDUSTRIAL TEMPERATURE RANGES
IDT54/74FCT16374AT/CT/ET
FAST CMOS 16-BIT REGISTER (3-STATE)
PIN CONFIGURATION
Symbol Description Max Unit
VTERM
(2)
Terminal Voltage with Respect to GND –0.5 to 7 V
VTERM
(3)
Terminal Voltage with Respect to GND –0.5 to VCC+0.5 V
TSTG Storage Temperature –65 to +150 ° C
I
OUT DC Output Current –60 to +120 mA
ABSOLUTE MAXIMUM RATINGS
(1)
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause
permanent damage to the device. This is a stress rating only and functional operation
of the device at these or any other conditions above those indicated in the operational
sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect reliability.
2. All device terminals except FCT162XXX Output and I/O terminals.
3. Outputs and I/O terminals for FCT162XXX.
Symbol Parameter
(1)
Conditions Typ. Max. Unit
CIN Input Capacitance VIN = 0V 3.5 6 pF
C
OUT Output Capacitance VOUT = 0V 3.5 8 pF
CAPACITANCE (TA = +25°C, f = 1.0MHz)
NOTE:
1. This parameter is measured at characterization but not tested.
Pin Names Description
x D x Data Inputs
xCLK Clock Inputs
xOx 3-State Outputs
xOE 3-State Output Enable Input (Active LOW)
PIN DESCRIPTION
Inputs Outputs
Function xDx xCLK xOE xOx
ZXL H Z
XH H Z
Load L ↑ LL
Register H ↑ LH
L ↑ HZ
H ↑ HZ
FUNCTION TABLE
(1)
NOTE:
1. H = HIGH voltage level
L = LOW voltage level
X = Don’t care
Z = High-impedance
↑ = LOW-to-HIGH transition
SSOP/ TSSOP/ CERPACK
TOP VIEW
1O1
GND
1O3
VCC
1
OE
GND
2O2
GND
V
CC
GND
1O2
1
O4
1
O5
1
O6
1
O7
1
O8
2
O1
2
O3
2
O4
2
O5
2
O7
2
O8
2
O6
2
OE
1CLK
1D1
1
D2
GND
1D3
1
D4
VCC
1
D5
1
D6
1
D7
1
D8
2
D1
2
D2
2
D3
2
D4
VCC
2
D5
2
D7
2
D8
2
D6
2
CLK
GND
GND
GND
39
29
30
31
32
33
34
35
36
37
38
25
26
27
28
48
47
41
42
43
44
45
46
40
1
2
3
4
5
6
7
8
9
10
12
13
14
15
16
17
18
19
20
11
21
22
23
24
3
IDT54/74FCT16374AT/CT/ET
FAST CMOS 16-BIT REGISTER (3-STATE)
MILITARY AND INDUSTRIAL TEMPERATURE RANGES
Symbol Parameter Test Conditions
(1)
Min. Typ.
(2)
Max. Unit
IO Output Drive Current VCC = Max., VO = 2.5V
(3)
–50 — –180 mA
VOH Output HIGH Voltage VCC = Min. IOH = –3mA 2.5 3.5 — V
V
IN = VIH or VIL IOH = –12mA MIL 2.4 3.5 — V
IOH = –15mA IND
I
OH = –24mA MIL 2 3 — V
IOL = –32mA IND
(4)
VOL Output LOW Voltage VCC = Min. IOL = 48mA MIL — 0.2 0.55 V
VIN = VIH or VIL IOL = 64mA IND
I
OFF Input/Output Power Off Leakage
(5)
VCC = 0V, VIN = or VO ≤ 4.5V — — ±1 μA
Symbol Parameter Test Conditions
(1)
Min. Typ.
(2)
Max. Unit
VIH Input HIGH Level Guaranteed Logic HIGH Level 2 — — V
VIL Input LOW Level Guaranteed Logic LOW Level — — 0.8 V
IIH Input HIGH Current (Input pins)
(5)
VCC = Max. VI = VCC ——±1µA
Input HIGH Current (I/O pins)
(5)
——±1
IIL Input LOW Current (Input pins)
(5)
VI = GND — — ±1
Input LOW Current (I/O pins)
(5)
——±1
IOZH High Impedance Output Current VCC = Max. VO = 2.7V — — ±1 µA
IOZL (3-State Output pins)
(5)
VO = 0.5V — — ±1
VIK Clamp Diode Voltage VCC = Min., IIN = –18mA — –0.7 –1.2 V
IOS Short Circuit Current VCC = Max., VO = GND
(3)
–80 –140 –250 mA
VH Input Hysteresis — — 100 — mV
ICCL Quiescent Power Supply Current VCC = Max — 5 500 µA
I
CCH VIN = GND or VCC
ICCZ
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified:
Industrial: TA = –40°C to +85°C, VCC = 5.0V ±10%; Military: TA = –55°C to +125°C, VCC = 5.0V ±10%
NOTES:
1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at VCC = 5.0V, +25°C ambient.
3. Not more than one output should be shorted at one time. Duration of the test should not exceed one second.
4. Duration of the condition can not exceed one second.
5. This test limit for this parameter is ±5µA at TA = –55°C.
OUTPUT DRIVE CHARACTERISTICS
P1-P3P4-P6P7-P7

74FCT16374ETPVG8

Mfr. #:
Buy 74FCT16374ETPVG8
Manufacturer:
IDT
Description:
Registers 16-Bit Register
Lifecycle:
New from this manufacturer.
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