◆
Reliability test data
◆
Derating Curve
○
Biased life test
○
High temperature high humidity (biased)
○
Temperature shock
○
High temperature exposure
◆
Reliability specification
Test items
Life (biased)
High temperature high humidity
Temperature shock
High temperature exposure
Resistance to soldering heat
70℃, rated voltage, 90min on 30min off, 1000hours
85℃, 85%RH, 1/10 of rated power, 90min on 30min off, 1000hours
-55℃ (30min) ∼ 125℃ (30min) 1000cycles
155℃, no bias, 1000hours
260±5℃, 10 seconds (reflow)
±（0.5％+0.05Ω）
±（0.25％+0.05Ω）
±（0.25％+0.05Ω）
±（0.25％+0.05Ω）
±（0.25％+0.05Ω）
±（0.25％+0.01Ω）
±（0.1％+0.01Ω）
±（0.1％+0.01Ω）
±（0.1％+0.01Ω）
±（0.1％+0.01Ω）
≦47Ω ≧47Ω
Standard
Ratio to rated power (％)
Resistance drift（%）
Test duration(h)
0.12
0.10
0.08
0.06
0.04
0.02
0.00
-0.02
-0.04
-0.06
-0.08
-0.10
-0.12
Load Life @ 70℃ at
Rated Power 1.0W n = 4
HRG3216：10kΩ
10 100 1000 10000
Resistance drift（%）
Test duration(h)
0.12
0.10
0.08
0.06
0.04
0.02
0.00
-0.02
-0.04
-0.06
-0.08
-0.10
-0.12
Temperature Humidity Bias
0.1W n = 25
HRG3216：10kΩ
10 100 1000 10000
Resistance drift（%）
Test duration(h)
0.12
0.10
0.08
0.06
0.04
0.02
0.00
-0.02
-0.04
-0.06
-0.08
-0.10
-0.12
Thermal Shock
-55℃ - +125℃ n = 25
HRG3216：10kΩ
10 100 1000 10000
Resistance drift（%）
Test duration(h)
0.12
0.10
0.08
0.06
0.04
0.02
0.00
-0.02
-0.04
-0.06
-0.08
-0.10
-0.12
High Temperature Exposure
at 155℃ with no power n = 25
HRG3216：10kΩ
10 100 1000 10000
-55 0 50 70 100 155
Ambient temperature (℃)
100
50
0
*
1
*1 Rated voltage is given by E=
R x P
E= rated voltage (V), R=nominal resistance value(Ω), P=rated power(W)
If rated voltage exceeds maximum voltage /element, maximum voltage/element is the rated voltage.
Condition (test methods (JIS C5201-1)
28
HRG series
Thin film surface mount resistors
