74HC3GU04 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2013. All rights reserved.
Product data sheet Rev. 5 — 2 October 2013 10 of 17
NXP Semiconductors 74HC3GU04
Triple unbuffered inverter
Test data is given in Table 11 and Table 12.
C1 = 47 pF (typical).
C2 = 22 pF (typical).
R1 = 1 M to 10 M (typical).
R2 optimum value depends on the frequency and required stability against changes in V
CC
or average minimum I
CC
(I
CC
=2mA at V
CC
= 3.0 V and f = 1 MHz)
Fig 14. Crystal oscillator application
mna053
U04
out
R2
R1
C1 C2
Table 11. External components for resonator (f < 1 MHz)
Frequency R1 R2 C1 C2
10 kHz to 15.9 kHz 2.2 M 220 k 56 pF 20 pF
16 kHz to 24.9 kHz 2.2 M 220 k 56 pF 10 pF
25 kHz to 54.9 kHz 2.2 M 100 k 56 pF 10 pF
55 kHz to 129.9 kHz 2.2 M 100 k 47 pF 5 pF
130 kHz to 199.9 kHz 2.2 M 47 k 47 pF 5 pF
200 kHz to 349.9 kHz 2.2 M 47 k 47 pF 5 pF
350 kHz to 600 kHz 2.2 M 47 k 47 pF 5 pF
Table 12. Optimum value for R2
Frequency R2 Optimum
3 kHz 2.0 k minimum required I
CC
8.0 k minimum influence due to change in V
CC
6 kHz 1.0 k minimum required I
CC
4.7 k minimum influence by V
CC
10 kHz 0.5 k minimum required I
CC
2.0 k minimum influence by V
CC
14 kHz 0.5 k minimum required I
CC
2.0 k minimum influence by V
CC
> 14 kHz replace R2 by C3 = 35 pF (typical)
