ESD7371P2T5G

© Semiconductor Components Industries, LLC, 2015
May, 2015 − Rev. 5
1 Publication Order Number:
ESD9B/D
ESD9B, SZESD9B
Transient Voltage
Suppressors
Micro−Packaged Diodes for ESD Protection
The ESD9B Series is designed to protect voltage sensitive
components from ESD. Excellent clamping capability, low leakage,
and fast response time provide best in class protection on designs that
are exposed to ESD. Because of its small size, it is suited for use in
cellular phones, MP3 players, digital cameras and many other portable
applications where board space comes at a premium.
Specification Features
Low Capacitance 15 pF
Low Clamping Voltage
Small Body Outline Dimensions: 0.039x 0.024 (1.0mm x 0.60mm)
Low Body Height: 0.016 (0.4 mm)
Stand−off Voltage: 3.3 V, 5 V
Low Leakage
Response Time is < 1 ns
IEC61000−4−2 Level 4 ESD Protection
AEC−Q101 Qualified and PPAP Capable
SZ Prefix for Automotive and Other Applications Requiring Unique
Site and Control Change Requirements
This is a Pb−Free Device
Mechanical Characteristics
CASE:
Void-free, transfer-molded, thermosetting plastic
Epoxy Meets UL 94 V−0
LEAD FINISH: 100% Matte Sn (Tin)
MOUNTING POSITION: Any
QUALIFIED MAX REFLOW TEMPERATURE: 260°C
Device Meets MSL 1 Requirements
MAXIMUM RATINGS
Rating Symbol Value Unit
IEC 61000−4−2 (ESD) Contact
Air
±18
±18
kV
IEC 61000−4−4 (EFT) 40 A
Total Power Dissipation on FR−5 Board
(Note 1) @ T
A
= 25°C
Thermal Resistance, Junction−to−Ambient
°P
D
°
R
q
JA
300
400
mW
°C/W
Junction and Storage Temperature Range T
J
, T
stg
−55 to +150 °C
Lead Solder Temperature − Maximum
(10 Second Duration)
T
L
260 °C
Stresses exceeding those listed in the Maximum Ratings table may damage the
device. If any of these limits are exceeded, device functionality should not be
assumed, damage may occur and reliability may be affected.
1. FR−5 = 1.0 x 0.75 x 0.62 in.
Device Package Shipping
ORDERING INFORMATION
www.onsemi.com
For information on tape and reel specifications,
including part orientation and tape sizes, please
refer to our Tape and Reel Packaging Specification
s
Brochure, BRD8011/D.
www.onsemi.com
ESD9B3.3ST5G SOD−923
(Pb−Free)
8000/Tape & Ree
l
SOD−923
CASE 514AB
MARKING DIAGRAM
X = Specific Device Code
M Date Code
ESD9B5.0ST5G SOD−923
(Pb−Free)
8000/Tape & Ree
l
SZESD9B5.0ST5G SOD−923
(Pb−Free)
8000/Tape & Ree
l
X M
Bi−Directional TVS
I
PP
I
PP
V
I
I
R
I
T
I
T
I
R
V
RWM
V
C
V
BR
V
RWM
V
C
V
BR
ESD9B, SZESD9B
www.onsemi.com
2
ELECTRICAL CHARACTERISTICS
(T
A
= 25°C unless otherwise noted)
Symbol
Parameter
I
PP
Maximum Reverse Peak Pulse Current
V
C
Clamping Voltage @ I
PP
V
RWM
Working Peak Reverse Voltage
I
R
Maximum Reverse Leakage Current @ V
RWM
V
BR
Breakdown Voltage @ I
T
I
T
Test Current
C Capacitance @ V
R
= 0 V and f = 1.0 MHz
ELECTRICAL CHARACTERISTICS (T
A
= 25°C unless otherwise noted)
Device
Device
Marking
V
RWM
(V)
I
R
(nA)
@ V
RWM
V
BR
(V) @ I
T
(Note 2)
I
T
C (pF) V
C
V
C
(V)
Max Per 8 x 20 ms
(Note 4)
Max Max Min Max mA Typ
Per IEC61000−4−2
(Note 3)
I
PP
= 1 A I
PP
= 2 A
ESD9B3.3ST5G 2* 3.3 100 5.0 7.0 1.0 15 Figures 1 and 2
See Below
10.5 11.5
ESD9B5.0ST5G,
SZESD9B5.0ST5G
E 5.0 100 5.8 7.8 1.0 15 Figures 1 and 2
See Below
12.5 15.0
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product
performance may not be indicated by the Electrical Characteristics if operated under different conditions.
* Rotated 270°.
2. V
BR
is measured with a pulse test current I
T
at an ambient temperature of 25°C.
3. For test procedure see Figures 3 and 4 and Application Note AND8307/D.
4. Surge current waveforms per Figure 5.
Figure 1. ESD Clamping Voltage Screenshot
Positive 8 kV Contact per IEC61000−4−2
Figure 2. ESD Clamping Voltage Screenshot
Negative 8 kV Contact per IEC61000−4−2
ESD9B, SZESD9B
www.onsemi.com
3
IEC 61000−4−2 Spec.
Level
Test Volt-
age (kV)
First Peak
Current
(A)
Current at
30 ns (A)
Current at
60 ns (A)
1 2 7.5 4 2
2 4 15 8 4
3 6 22.5 12 6
4 8 30 16 8
I
peak
90%
10%
IEC61000−4−2 Waveform
100%
I @ 30 ns
I @ 60 ns
t
P
= 0.7 ns to 1 ns
Figure 3. IEC61000−4−2 Spec
Figure 4. Diagram of ESD Test Setup
50 W
50 W
Cable
TVS
Oscilloscope
ESD Gun
The following is taken from Application Note
AND8308/D − Interpretation of Datasheet Parameters
for ESD Devices.
ESD Voltage Clamping
For sensitive circuit elements it is important to limit the
voltage that an IC will be exposed to during an ESD event
to as low a voltage as possible. The ESD clamping voltage
is the voltage drop across the ESD protection diode during
an ESD event per the IEC61000−4−2 waveform. Since the
IEC61000−4−2 was written as a pass/fail spec for larger
systems such as cell phones or laptop computers it is not
clearly defined in the spec how to specify a clamping voltage
at the device level. ON Semiconductor has developed a way
to examine the entire voltage waveform across the ESD
protection diode over the time domain of an ESD pulse in the
form of an oscilloscope screenshot, which can be found on
the datasheets for all ESD protection diodes. For more
information on how ON Semiconductor creates these
screenshots and how to interpret them please refer to
AND8307/D.
Figure 5. 8 X 20 ms Pulse Waveform
100
90
80
70
60
50
40
30
20
10
0
020406080
t, TIME (ms)
% OF PEAK PULSE CURRENT
t
P
t
r
PULSE WIDTH (t
P
) IS DEFINED
AS THAT POINT WHERE THE
PEAK CURRENT DECAY = 8 ms
PEAK VALUE I
RSM
@ 8 ms
HALF VALUE I
RSM
/2 @ 20 ms

ESD7371P2T5G

Mfr. #:
Manufacturer:
ON Semiconductor
Description:
TVS Diodes / ESD Suppressors UNIDIRECTIONAL 7V ESD PR
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
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