TJA1057 All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2017. All rights reserved.
Product data sheet Rev. 6 — 24 August 2017 14 of 25
NXP Semiconductors
TJA1057
High-speed CAN transceiver
13. Test information
13.1 Quality information
This product has been qualified in accordance with the Automotive Electronics Council
(AEC) standard Q100 Rev-G - Failure mechanism based stress test qualification for
integrated circuits, and is suitable for use in automotive applications.
(1) The V
IO
pin is internally connected to pin V
CC
in the non-V
IO
product variants TJA1057(G)T(K).
Fig 7. CAN transceiver timing test circuit
(1) The V
IO
pin is internally connected to pin V
CC
in the non-V
IO
product variants TJA1057(G)T(K).
Fig 8. Test circuit for measuring transceiver driver symmetry
7-$
*1'
9
&&
9
,2
6
Q))
7;'
5;'
S)
&$1/
&$1+
5
/
ȍ
&
/
7;'
5;'
*1'
&
63/,7
Q)
9
&&
9
,2
Q)