AD5040/AD5060
Rev. A | Page 13 of 24
04767-050
CH3 2.00V CH2 50mV M1.00ms CH3 1.36V
2
C2
30mV p-p
C3
4.96V p-p
C3 FALL
s
NO VALID
EDGE
C3 RISE
946.2μs
3
T
T
2.1
1.0
1.1
1.2
1.3
1.4
1.5
1.6
1.7
1.8
1.9
2.0
–10
μ
s 9.96
μ
s8
μ
s6
μ
s4
μ
s2
μ
s0–2
μ
s–4
μ
s–6
μ
s–8
μ
s
04767-052
V
DD
= 5.5V
V
REF
= 4.096V
10% TO 90% RISE TIME = 0.688
μ
s
SLEW RATE = 1.16V/
μ
s
DAC
OUTPUT
1.04V
2.04V
Figure 34. Glitch upon Exiting Hardware Power-Down to Zero Scale
Figure 37. Typical Output Slew Rate
0.0010
0.0008
0.0006
0.0004
0.0002
0
–0.0002
–0.0004
–0.0006
–0.0008
–25 –20 –15 –10 –5 0 5 10 15 20 25 30
04767-051
Δ
VOLTAGE (V)
CURRENT (mA)
CODE = MID-SCALE
V
DD
= 5V, V
REF
= 4.096V
V
DD
= 3V, V
REF
= 2.5V
V
DD
= 5.5V
V
DD
= 3V
16
14
0
2
4
6
8
10
12
0.83 MORE0.910.900.890.880.870.860.850.84
04767-075
FREQUENCY
BIN
Figure 35. Typical Output Load Regulation
Figure 38. I
DD
Histogram V
DD
= 3.0 V
0.10
–0.10
–0.08
–0.06
–0.04
–0.02
0
0.02
0.04
0.06
0.08
–25 –20 –15 –10 –5 0 5 10 15 20 25 30
04767-063
Δ
V
OUT
(V)
I
OUT
(mA)
CODE = MIDSCALE
V
DD
= 5V, V
REF
= 4.096V
V
DD
= 3V, V
REF
= 2.5V
V
DD
= 3V, V
REF
= 2.5V
V
DD
= 5V, V
REF
= 4.096V
14
0
2
4
6
8
10
12
1.00 1.01 1.02 1.03 1.04 1.05 1.06 1.07 1.08 1.09 1.10 1.11MORE
04767-076
FREQUENCY
BIN
Figure 36. Typical Current Limiting Plot
Figure 39. I
DD
Histogram V
DD
= 5.0 V
AD5040/AD5060
Rev. A | Page 14 of 24
TERMINOLOGY
Relative Accuracy
For the DAC, relative accuracy or integral nonlinearity (INL) is
a measure of the maximum deviation, in LSBs, from a straight
line passing through the endpoints of the DAC transfer
function. A typical AD5060 INL vs. code plot is shown in
Figure 4.
Differential Nonlinearity (DNL)
Differential nonlinearity is the difference between the measured
change and the ideal 1 LSB change between any two adjacent
codes. A specified differential nonlinearity of ±1 LSB maximum
ensures monotonicity. This DAC is guaranteed monotonic by
design. A typical AD5060 DNL vs. code plot is shown in Figure 5.
Offset Error
Offset error is a measure of the output error when zero code
(0x0000) is loaded to the DAC register. Ideally, the output
should be 0 V. The zero-code error is always positive in the
AD5040/AD5060 because the output of the DAC cannot go
below 0 V. This is due to a combination of the offset errors in
the DAC and output amplifier. Zero-code error is expressed
in mV.
Full-Scale Error
Full-scale error is a measure of the output error when full-scale
code (0xFFFF AD5060, 0x3FFF AD5040) is loaded to the DAC
register. Ideally, the output should be V
DD
− 1 LSB. Full-scale
error is expressed in percent of full-scale range.
Gain Error
This is a measure of the span error of the DAC. It is the devia-
tion in slope of the DAC transfer characteristic from ideal,
expressed as a percent of the full-scale range.
Tota l Un a dju ste d E rr or (T UE )
Total unadjusted error is a measure of the output error taking
all the various errors into account. A typical AD5060 TUE vs.
code plot is shown in Figure 6.
Offset Error Drift
This is a measure of the change in zero-code error with a
change in temperature. It is expressed in µV/°C.
Gain Error Drift
This is a measure of the change in gain error with changes in
temperature. It is expressed in (ppm of full-scale range)/°C.
Digital-to-Analog Glitch Impulse
Digital-to-analog glitch impulse is the impulse injected into the
analog output when the input code in the DAC register changes
state. It is normally specified as the area of the glitch in nV-s
and is measured when the digital input code is changed by
1 LSB at the worst case code 53786; see Figure 23 and Figure 24.
The expanded view in Figure 23 shows the glitch generated
following completion of the calibration routine; Figure 24
zooms in on this glitch.
Digital Feedthrough
Digital feedthrough is a measure of the impulse injected into
the analog output of the DAC from the digital inputs of the
DAC, but is measured when the DAC output is not updated. It
is specified in nV-s and measured with a full-scale code change
on the data bus—that is, from all 0s to all 1s, and vice versa.
AD5040/AD5060
Rev. A | Page 15 of 24
THEORY OF OPERATION
The AD5040/AD5060 are single 14-/16-bit, serial input, voltage
output DACs. The parts operate from supply voltages of 2.7 V
to 5.5 V. Data is written to the AD5060 in a 24-bit word format,
and to the AD5040 in a 16-bit word format, via a 3-wire serial
interface.
Both the AD5040 and AD5060 incorporate a power-on reset
circuit that ensures the DAC output powers up to a known out-
put state (midscale or zero-scale, see the Ordering Guide). The
devices also have a software power-down mode that reduces the
typical current consumption to less than 1 µa.
DAC ARCHITECTURE
The DAC architecture of the AD5060 consists of two matched
DAC sections. A simplified circuit diagram is shown in
Figure 40. The 4 MSBs of the 16-bit data-word are decoded to
drive 15 switches, E1 to E15. Each of these switches connects
1 of 15 matched resistors to either DACGND or the V
REF
buffer
output.
The remaining 12 bits of the data-word drive switches
S0 to S11 of a 12-bit voltage mode R-2R ladder network.
2R
04767-027
S0
V
REF
2R
S1
2R
S11
2R
E1
2R
E2
2R
E15
2R
V
OUT
12-BIT R-2R LADDER FOUR MSBs DECODED INTO
15 EQUAL SEGMENTS
Figure 40. AD5060 DAC Ladder Structure
REFERENCE BUFFER
The AD5040 andAD5060 operate with an external reference.
The reference input (V
REF
) has an input range of 2 V to
V
DD
− 50 mV. This input voltage is then used to provide a
buffered reference for the DAC core.
SERIAL INTERFACE
The AD5060/AD5040 have a 3-wire serial interface (
SYNC
,
SCLK, and DIN), which is compatible with SPI, QSPI, and
MICROWIRE interface standards, as well as most DSPs.
shows a timing diagram of a typical AD5060 write
sequence.
Figure 2
The write sequence begins by bringing the
SYNC
line low. For
the AD5060, data from the DIN line is clocked into the 24-bit
shift register on the falling edge of SCLK. The serial clock
frequency can be as high as 30 MHz, making these parts
compatible with high speed DSPs. On the 24th falling clock
edge, the last data bit is clocked in and the programmed
function is executed (that is, a change in the DAC output or a
change in the mode of operation).
At this stage, the
SYNC
line can be kept low or be brought
high. In either case, it must be brought high for a minimum of
12 ns before the next write sequence so that a falling edge of
SYNC
can initiate the next write sequence. Because the
SYNC
buffer draws more current when V
IH
= 1.8 V than it does when
V
IH
= 0.8 V,
SYNC
should be idled low between write sequences
for an even lower power operation of the part. As previously
indicated, however, it must be brought high again just before
the next write sequence. The AD5040 requires 16 clock periods
to update the input shift register. On the 16th falling clock edge,
the last data bit is clocked in and the programmed function is
executed (that is, a change in the DAC output or a change in the
mode of operation).
Input Shift Register
The AD5060 input shift register is 24 bits wide; see Figure 41.
PD1 and PD0 are control bits that control the operating mode
of the part—normal mode or any one of three power-down
modes (see the Power-Down Modes section for more detail).
The next 16 bits are the data bits. These are transferred to the
DAC register on the 24th falling edge of SCLK.
DATA BITS
DB15 (MSB) DB0 (LSB)
D15 D14 D13 D12 D11 D10 D9 D8 D7 D6 D5 D4 D3 D2 D1 D0
NORMAL OPERATION
1kΩ TO GND
100kΩ TO GND
3-STATE
POWER-DOWN MODES
0
0
1
1
0
1
0
1
04767-028
0 0 0 0 0 0 PD1 PD0
Figure 41. AD5060 Input Register Content

EVAL-AD5060EBZ

Mfr. #:
Manufacturer:
Analog Devices Inc.
Description:
Data Conversion IC Development Tools EVAL BRD - AD5060
Lifecycle:
New from this manufacturer.
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