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NLSX5014MUTAG

P1-P3P4-P6P7-P9P10-P12P13-P14
NLSX5014
www.onsemi.com
4
MAXIMUM RATINGS
Symbol Parameter Value Condition Unit
V
CC
High−side DC Supply Voltage −0.5 to +5.5 V
V
L
Low−side DC Supply Voltage −0.5 to +5.5 V
I/O V
CC
V
CC
−Referenced DC Input/Output Voltage −0.5 to +5.5 V
I/O V
L
V
L
−Referenced DC Input/Output Voltage −0.5 to +5.5 V
V
I
Enable Control Pin DC Input Voltage −0.5 to +5.5 V
I
IK
DC Input Diode Current −50 V
I
< GND mA
I
OK
DC Output Diode Current −50 V
O
< GND mA
I
CC
DC Supply Current Through V
CC
$100 mA
I
L
DC Supply Current Through V
L
$100 mA
I
GND
DC Ground Current Through Ground Pin $100 mA
T
STG
Storage Temperature −65 to +150 °C
ESD Rating Machine Model
Human Body Model
Charged Device Model
LU Pass
400
7000
2000
100
V
V
V
mA
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
RECOMMENDED OPERATING CONDITIONS
Symbol Parameter Min Max Unit
V
CC
High−side Positive DC Supply Voltage 0.9 4.5 V
V
L
Low−side Positive DC Supply Voltage 0.9 4.5 V
V
I
Enable Control Pin Voltage GND 4.5 V
V
IO
Bus Input/Output Voltage I/O V
CC
I/O V
L
GND
GND
4.5
4.5
V
T
A
Operating Temperature Range −55 +125 °C
Dt/DV Input Transition Rise or Rate
V
I
, V
IO
from 30% to 70% of V
CC
; V
CC
= 3.3 V $ 0.3 V
0 10 ns
Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond the
Recommended Operating Ranges limits may affect device reliability.
NLSX5014
www.onsemi.com
5
DC ELECTRICAL CHARACTERISTICS
Symbol Parameter
Test Conditions
(Note 1)
V
CC
(V)
(Note 2)
V
L
(V)
(Note 3)
−405C to +855C −555C to +1255C
Unit
Min
Typ
(Note 4)
Max Min Max
V
IHC
I/O V
CC
Input HIGH Voltage 0.9 – 4.5 0.9 – 4.5 2/3 *
V
CC
− − 2/3 *
V
CC
− V
V
ILC
I/O V
CC
Input LOW Voltage 0.9 – 4.5 0.9 – 4.5 − − 1/3 *
V
CC
− 1/3 *
V
CC
V
V
IHL
I/O V
L
Input HIGH Voltage 0.9 – 4.5 0.9 – 4.5 2/3 *
V
L
− − 2/3 * V
L
− V
V
ILL
I/O V
L
Input LOW Voltage 0.9 – 4.5 0.9 – 4.5 − − 1/3 *
V
L
− 1/3 * V
L
V
V
IH
Control Pin Input HIGH Volt-
age
T
A
= +25°C 1.2 – 4.5 1.2 – 4.5 2/3 *
V
L
− − 2/3 * V
L
− V
V
IL
Control Pin Input LOW Volt-
age
T
A
= +25°C 1.2 – 4.5 1.2 – 4.5 − − 1/3 *
V
L
− 1/3 * V
L
V
V
IH
Control Pin Input HIGH Volt-
age
T
A
= +25°C V
CC
< 1.2 V
L
< 1.2 V
L
− − V
L
− V
V
IL
Control Pin Input LOW Volt-
age
T
A
= +25°C V
CC
< 1.2 V
L
< 1.2 − − 0 − 0 V
V
OHC
I/O V
CC
Output HIGH Volt-
age
I/O V
CC
source
current = 20 mA
0.9 – 4.5 0.9 – 4.5 0.9 *
V
CC
− − 0.9 *
V
CC
− V
V
OLC
I/O V
CC
Output LOW Voltage I/O V
CC
sink
current = 20 mA
0.9 – 4.5 0.9 – 4.5 − − 0.2 − 0.2 V
V
OHL
I/O V
L
Output HIGH Voltage I/O V
L
source
current = 20 mA
0.9 – 4.5 0.9 – 4.5 0.9 *
V
L
− − 0.9 * V
L
− V
V
OLL
I/O V
L
Output LOW Voltage I/O V
L
sink current
= 20 mA
0.9 – 4.5 0.9 – 4.5 − − 0.2 − 0.2 V
I
QVCC
V
CC
Supply Current EN = V
L
, I
O
= 0 A,
(I/O V
CC
= 0 V or
V
CC
, I/O V
L
= float)
or
(I/O V
CC
= float, I/O
V
L
= 0 V or V
L
)
0.9 – 4.5 0.9 – 4.5 − − 1 − 2.5 mA
I
QVL
V
L
Supply Current 0.9 – 4.5 0.9 – 4.5 − − 1 − 2.5 mA
I
TS−VCC
V
CC
Tristate Output Mode
Supply Current
T
A
= +25°C,
EN = 0 V
(I/O V
CC
= 0 V or
V
CC
, I/O V
L
= float)
or
(I/O V
CC
= float, I/O
V
L
= 0 V or V
L
)
0.9 – 4.5 0.9 – 4.5 − − 0.5 − 1.5 mA
I
TS−VL
V
L
Tristate Output Mode
Supply Current
0.9 – 4.5 0.9 – 4.5 − − 0.5 − 1.5 mA
I
OZ
I/O Tristate Output Mode
Leakage Current
T
A
= +25°C,
EN = 0V
0.9 – 4.5 0.9 – 4.5 − − ±1 − ±1.5 mA
I
I
Control Pin Input Current T
A
= +25°C 0.9 – 4.5 0.9 – 4.5 − − ±1 − ±1 mA
I
OFF
Power Off Leakage Current I/O V
CC
= 0 to 4.5V, 0 0 − − 1 − 1.5 mA
I/O V
L
= 0 to 4.5 V 0.9 – 4.5 0 − − 1 − 1.5
0 0.9 – 4.5 − − 1 − 1.5
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product
performance may not be indicated by the Electrical Characteristics if operated under different conditions.
1. Normal test conditions are V
I
= 0 V, C
IOVCC
≤ 15 pF and C
IOVL
≤ 15 pF, unless otherwise specified.
2. V
CC
is the supply voltage associated with the I/O V
CC
port, and V
CC
ranges from +0.9 V to 4.5 V under normal operating conditions.
3. V
L
is the supply voltage associated with the I/O V
L
port, and V
L
ranges from +0.9 V to 4.5 V under normal operating conditions.
4. Typical values are for V
CC
= +2.8 V, V
L
= +1.8 V and T
A
= +25°C. All units are production tested at T
A
= +25°C. Limits over the operating
temperature range are guaranteed by design.
NLSX5014
www.onsemi.com
6
TIMING CHARACTERISTICS
Symbol Parameter
Test Conditions
(Note 5)
V
CC
(V)
(Note 6)
V
L
(V)
(Note 7)
−555C to +1255C
Unit
Min
Typ
(Note 8)
Max
t
R−VCC
I/O V
CC
Rise Time C
IOVCC
= 15 pF 0.9 – 4.5 0.9 – 4.5 − − 8.5 nS
1.8 – 4.5 1.8 – 4.5 − − 3.5
t
F−VCC
I/O V
CC
Fall Time C
IOVCC
= 15 pF 0.9 – 4.5 0.9 – 4.5 − − 8.5 nS
1.8 – 4.5 1.8 – 4.5 − − 3.5
t
R−VL
I/O V
L
Rise Time C
IOVL
= 15 pF 0.9 – 4.5 0.9 – 4.5 − − 8.5 nS
1.8 – 4.5 1.8 – 4.5 − − 3.5
t
F−VL
I/O V
L
Fall Time C
IOVL
= 15 pF 0.9 – 4.5 0.9 – 4.5 − − 8.5 nS
1.8 – 4.5 1.8 – 4.5 − − 3.5
Z
OVCC
I/O V
CC
One−Shot
Output Impedance
(Note 9) 0.9
1.8
4.5
0.9 – 4.5 −
−
−
37
20
6.0
−
−
−
W
Z
OVL
I/O V
L
One−Shot Out-
put Impedance
(Note 9) 0.9
1.8
4.5
0.9 – 4.5 −
−
−
37
20
6.0
−
−
−
W
t
PD_VL−VCC
Propagation Delay
(Driving I/O V
CC
)
C
IOVCC
= 15 pF 0.9 – 4.5 0.9 – 4.5 − − 35 nS
1.8 – 4.5 1.8 – 4.5 − − 10
C
IOVCC
= 30 pF 0.9 – 4.5 0.9 – 4.5 − − 35
1.8 – 4.5 1.8 – 4.5 − − 10
C
IOVCC
= 50 pF 1.0 – 4.5 1.0 – 4.5 − − 37
1.8 – 4.5 1.8 – 4.5 − − 11
C
IOVCC
= 100 pF 1.2 – 4.5 1.2 – 4.5 − − 40
1.8 – 4.5 1.8 – 4.5 − − 13
t
PD_VCC−VL
Propagation Delay
(Driving I/O V
L
)
C
IOVL
= 15 pF 0.9 – 4.5 0.9 – 4.5 − − 35 nS
1.8 – 4.5 1.8 – 4.5 − − 10
C
IOVL
= 30 pF 0.9 – 4.5 0.9 – 4.5 − − 35
1.8 – 4.5 1.8 – 4.5 − − 10
C
IOVL
= 50 pF 1.0 – 4.5 1.0 – 4.5 − − 37
1.8 – 4.5 1.8 – 4.5 − − 11
C
IOVL
= 100 pF 1.2 – 4.5 1.2 – 4.5 − − 40
1.8 – 4.5 1.8 – 4.5 − − 13
t
SK
Channel−to−Channel
Skew
C
IOVCC
= 15 pF, C
IOVL
= 15 pF
(Note 9)
0.9 – 4.5 0.9 – 4.5 − − 0.15 nS
I
IN_PEAK
Input Driver Maximum
Peak Current
EN = V
L
;
I/O_V
CC
= 1 MHz Square Wave,
Amplitude = V
CC
, or
I/O_V
L
= 1 MHz Square Wave,
Amplitude = V
L
(Note 9)
0.9 – 4.5 0.9 – 4.5 − − 5.0 mA
5. Normal test conditions are V
I
= 0 V, C
IOVCC
≤ 15 pF and C
IOVL
≤ 15 pF, unless otherwise specified.
6. V
CC
is the supply voltage associated with the I/O V
CC
port, and V
CC
ranges from +0.9 V to 4.5 V under normal operating conditions.
7. V
L
is the supply voltage associated with the I/O V
L
port, and V
L
ranges from +0.9 V to 4.5 V under normal operating conditions.
8. Typical values are for V
CC
= +2.8 V, V
L
= +1.8 V and T
A
= +25°C. All units are production tested at T
A
= +25°C. Limits over the operating
temperature range are guaranteed by design.
9. Guaranteed by design.
P1-P3P4-P6P7-P9P10-P12P13-P14

NLSX5014MUTAG

Mfr. #:
Buy NLSX5014MUTAG
Manufacturer:
ON Semiconductor
Description:
Translation - Voltage Levels 4 BIT 140 MBPS TRNSLATOR
Lifecycle:
New from this manufacturer.
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