74AUP2G3404 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2012. All rights reserved.
Product data sheet Rev. 1 — 22 August 2012 9 of 19
NXP Semiconductors
74AUP2G3404
Low-power buffer and inverter
[1] All typical values are measured at nominal V
CC
.
[2] t
pd
is the same as t
PLH
and t
PHL
.
[3] All specified values are the average typical values over all stated loads.
[4] C
PD
is used to determine the dynamic power dissipation (P
D
in W).
P
D
=C
PD
V
CC
2
f
i
N+(C
L
V
CC
2
f
o
) where:
f
i
= input frequency in MHz;
f
o
= output frequency in MHz;
C
L
= load capacitance in pF;
V
CC
= supply voltage in V;
N = number of inputs switching;
(C
L
V
CC
2
f
o
) = sum of the outputs.
12. Waveforms
C
L
= 5 pF, 10 pF, 15 pF and 30 pF
C
PD
power
dissipation
capacitance
f
i
= 1 MHz; V
I
= GND to V
CC
[3]
[4]
V
CC
= 0.8 V - 2.5 - - - - pF
V
CC
= 1.1 V to 1.3 V - 2.7 - - - - pF
V
CC
= 1.4 V to 1.6 V - 2.8 - - - - pF
V
CC
= 1.65 V to 1.95 V - 3.0 - - - - pF
V
CC
= 2.3 V to 2.7 V - 3.5 - - - - pF
V
CC
= 3.0 V to 3.6 V - 4.0 - - - - pF
Table 9. Dynamic characteristics
…continued
Voltages are referenced to GND (ground = 0 V); for test circuit see Figure 8.
Symbol Parameter Conditions 25 C 40 C to +125 C Unit
Min Typ
[1]
Max Min Max
(85 C)
Max
(125 C)
Measurement points are given in Table 10.
Logic levels: V
OL
and V
OH
are typical output voltage levels that occur with the output load.
Fig 7. The data input 1A to output 1Y and input 2A to output 2Y propagation delays
Table 10. Measurement points
Supply voltage Output Input
V
CC
V
M
V
M
V
I
t
r
= t
f
0.8 V to 3.6 V 0.5 V
CC
0.5 V
CC
V
CC
3.0 ns
74AUP2G3404 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2012. All rights reserved.
Product data sheet Rev. 1 — 22 August 2012 10 of 19
NXP Semiconductors
74AUP2G3404
Low-power buffer and inverter
[1] For measuring enable and disable times, R
L
= 5 k. For measuring propagation delays, set-up and hold times, and pulse width,
R
L
=1M.
Test data is given in Table 11
.
Definitions for test circuit:
R
L
= Load resistance.
C
L
= Load capacitance including jig and probe capacitance.
R
T
= Termination resistance should be equal to the output impedance Z
o
of the pulse generator.
V
EXT
= External voltage for measuring switching times.
Fig 8. Test circuit for measuring switching times
001aac521
DUT
R
T
V
I
V
O
V
EXT
V
CC
R
L
5 kΩ
C
L
G
Table 11. Test data
Supply voltage Load V
EXT
V
CC
C
L
R
L
[1]
t
PLH
, t
PHL
t
PZH
, t
PHZ
t
PZL
, t
PLZ
0.8 V to 3.6 V 5 pF, 10 pF, 15 pF and 30 pF 5 k or 1 M open GND 2 V
CC
74AUP2G3404 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2012. All rights reserved.
Product data sheet Rev. 1 — 22 August 2012 11 of 19
NXP Semiconductors
74AUP2G3404
Low-power buffer and inverter
13. Package outline
Fig 9. Package outline SOT363 (SC-88)
REFERENCES
OUTLINE
VERSION
EUROPEAN
PROJECTION
ISSUE DATE
IEC JEDEC JEITA
SOT363 SC-88
wBM
b
p
D
e
1
e
pin 1
index
A
A
1
L
p
Q
detail X
H
E
E
v M
A
AB
y
0 1 2 mm
scale
c
X
132
456
Plastic surface-mounted package; 6 leads SOT363
UNIT
A
1
max
b
p
cD
E
e
1
H
E
L
p
Qywv
mm
0.1
0.30
0.20
2.2
1.8
0.25
0.10
1.35
1.15
0.65
e
1.3
2.2
2.0
0.2 0.10.2
DIMENSIONS (mm are the original dimensions)
0.45
0.15
0.25
0.15
A
1.1
0.8
04-11-08
06-03-16

74AUP2G3404GN,125

Mfr. #:
Manufacturer:
Nexperia
Description:
Buffers & Line Drivers 74AUP2G3404GN/X2SON6/REEL 7" Q
Lifecycle:
New from this manufacturer.
Delivery:
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