Philips Semiconductors Product specification
74F04Hex inverter
October 4, 1990
3
ABSOLUTE MAXIMUM RATINGS
(Operation beyond the limit set forth in this table may impair the useful life of the device.
Unless otherwise noted these limits are over the operating free air temperature range.)
SYMBOL
PARAMETER RATING UNIT
V
CC
Supply voltage –0.5 to +7.0 V
V
IN
Input voltage –0.5 to +7.0 V
I
IN
Input current –30 to +5 mA
V
OUT
Voltage applied to output in high output state –0.5 to V
CC
V
I
OUT
Current applied to output in low output state 40 mA
T
amb
Operating free air temperature range Commercial range 0 to +70 °C
Industrial range –40 to +85 °C
T
stg
Storage temperature range –65 to +150 °C
RECOMMENDED OPERATING CONDITIONS
SYMBOL PARAMETER LIMITS UNIT
MIN NOM MAX
V
CC
Supply voltage 4.5 5.0 5.5 V
V
IH
High-level input voltage 2.0 V
V
IL
Low-level input voltage 0.8 V
I
Ik
Input clamp current –18 mA
I
OH
High-level output current –1 mA
I
OL
Low-level output current 20 mA
T
amb
Operating free air temperature range Commercial range 0 +70 °C
Industrial range –40 +85 °C
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER TEST CONDITIONS
1
LIMITS UNIT
MIN TYP
2
MAX
V
OH
High-level output voltage V
CC
= MIN, V
IL
= MAX ±10%V
CC
2.5 V
V
IH
= MIN, I
OH
= MAX ±5%V
CC
2.7 3.4 V
V
OL
Low-level output voltage V
CC
= MIN, V
IL
= MAX ±10%V
CC
0.30 0.50 V
V
IH
= MIN, I
Ol
= MAX ±5%V
CC
0.30 0.50 V
V
IK
Input clamp voltage V
CC
= MIN, I
I
= I
IK
-0.73 -1.2 V
I
I
Input current at maximum input
voltage
V
CC
= MAX, V
I
= 7.0V 100 µA
I
IH
High-level input current V
CC
= MAX, V
I
= 2.7V 20 µA
I
IL
Low-level input current V
CC
= MAX, V
I
= 0.5V -0.6 mA
I
OS
Short-circuit output current
3
V
CC
= MAX -60 -150 mA
I
CC
Supply current (total) I
CCH
V
CC
= MAX V
IN
= GND 2.8 4.2 mA
I
CCL
V
CC
= MAX V
IN
= 4.5V 10.2 15.3 mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V
CC
= 5V, T
amb
= 25°C.
3. Not more than one output should be shorted at a time. For testing I
OS
, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I
OS
tests should be performed last.
