74AUP2G79 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2013. All rights reserved.
Product data sheet Rev. 8 — 24 January 2013 12 of 25
NXP Semiconductors
74AUP2G79
Low-power dual D-type flip-flop; positive-edge trigger
[1] All typical values are measured at nominal V
CC
.
[2] t
pd
is the same as t
PLH
and t
PHL
.
[3] C
PD
is used to determine the dynamic power dissipation (P
D
in W).
P
D
=C
PD
V
CC
2
f
i
N+(C
L
V
CC
2
f
o
) where:
f
i
= input frequency in MHz;
f
o
= output frequency in MHz;
C
L
= output load capacitance in pF;
V
CC
= supply voltage in V;
N = number of inputs switching;
(C
L
V
CC
2
f
o
) = sum of the outputs.
12. Waveforms
C
PD
power
dissipation
capacitance
f = 1 MHz;
V
I
=GNDtoV
CC
[3]
V
CC
= 0.8 V - 1.6 - - - - - pF
V
CC
= 1.1 V to 1.3 V - 1.7 - - - - - pF
V
CC
= 1.4 V to 1.6 V - 1.8 - - - - - pF
V
CC
= 1.65 V to 1.95 V - 1.9 - - - - - pF
V
CC
= 2.3 V to 2.7 V - 2.3 - - - - - pF
V
CC
= 3.0 V to 3.6 V - 2.7 - - - - - pF
Table 8. Dynamic characteristics
…continued
Voltages are referenced to GND (ground = 0 V); for test circuit see Figure 10.
Symbol Parameter Conditions 25 C 40 C to +85 C 40 C to +125 C Unit
Min Typ
[1]
Max Min Max Min Max
Measurement points are given in Table 9.
Logic levels: V
OL
and V
OH
are typical output voltage levels that occur with the output load.
Fig 8. The clock input (nCP) to output (nQ) propagation delays
001aaf271
nCP input
nQ output
t
PHL
t
PLH
V
M
V
M
V
OH
V
I
GND
nD input
V
I
GND
V
OL
V
M
V
M
74AUP2G79 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2013. All rights reserved.
Product data sheet Rev. 8 — 24 January 2013 13 of 25
NXP Semiconductors
74AUP2G79
Low-power dual D-type flip-flop; positive-edge trigger
Measurement points are given in Table 9.
Logic levels: V
OL
and V
OH
are typical output voltage levels that occur with the output load.
The shaded areas indicate when the input is permitted to change for predictable output performance.
Fig 9. The clock input (nCP) to output (nQ) propagation delays, nCP clock pulse width, nD to nCP set-up times,
nCP to nD hold times and the nCP maximum frequency
001aaf272
t
h
t
su
t
h
t
PHL
t
W
t
PLH
t
su
1/f
max
V
M
V
M
V
M
V
I
GND
V
I
GND
nCP input
nD input
V
OH
V
OL
nQ output
Table 9. Measurement points
Supply voltage Output Input
V
CC
V
M
V
M
V
I
t
r
= t
f
0.8 V to 3.6 V 0.5 V
CC
0.5 V
CC
V
CC
3.0 ns
74AUP2G79 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2013. All rights reserved.
Product data sheet Rev. 8 — 24 January 2013 14 of 25
NXP Semiconductors
74AUP2G79
Low-power dual D-type flip-flop; positive-edge trigger
[1] For measuring enable and disable times R
L
= 5 k.
For measuring propagation delays, set-up and hold times and pulse width R
L
= 1 M.
Test data is given in Table 10
.
Definitions for test circuit:
R
L
= Load resistance.
C
L
= Load capacitance including jig and probe capacitance.
R
T
= Termination resistance should be equal to the output impedance Z
o
of the pulse generator.
V
EXT
= External voltage for measuring switching times.
Fig 10. Test circuit for measuring switching times
001aac521
DUT
R
T
V
I
V
O
V
EXT
V
CC
R
L
5 kΩ
C
L
G
Table 10. Test data
Supply voltage Load V
EXT
V
CC
C
L
R
L
[1]
t
PLH
, t
PHL
t
PZH
, t
PHZ
t
PZL
, t
PLZ
0.8 V to 3.6 V 5 pF, 10 pF, 15 pF and 30 pF 5 k or 1 M open GND 2 V
CC

74AUP2G79GS,115

Mfr. #:
Manufacturer:
Nexperia
Description:
Flip Flops 3.6V 14.2ns XSON8
Lifecycle:
New from this manufacturer.
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