AD1376/AD1377
Rev. D | Page 4 of 12
AD1376JD/AD1377JD AD1376KD/AD1377KD
Model Min Typ Max Min Typ Max Unit
DRIFT
6
Gain ±15 ±5 ±15 ppm/°C
Offset
Unipolar ±2 ±4 ±2 ±4 ppm of FSR/°C
Bipolar ±10 ±3 ±10 ppm of FSR/°C
Linearity ±2 ±3 ±0.3 ±2 ppm of FSR/°C
Guaranteed No Missing Code
Temperature Range 0 to 70 (13 Bits) 0 to 70 (14 Bits) °C
DIGITAL OUTPUT
1
(All Codes Complementary)
Parallel Output Codes
7
Unipolar CSB CSB
Bipolar COB, CTC
8
COB, CTC
8
Output Drive 5 5 LSTTL Loads
Status
Logic 1 During
Conversion
Logic 1 During
Conversion
Status Output Drive 5 5 LSTTL Loads
Internal Clock
9
Clock Output Drive 5 5 LSTTL Loads
Frequency 1040/1750 1040/1750 kHz
TEMPERATURE RANGE
Specification 0 to 70 0 to 70 °C
Operating −25 to +85 −25 to +85 °C
Storage −55 to +125 −55 to +125 °C
1
Logic 0 = 0.8 V max; Logic 1 = 2.0 V min for inputs. For digital outputs, Logic 0 = 0.4 V max. Logic 1 = 2.4 V min.
2
Tested on ±10 V and 0 V to +10 V ranges.
3
Adjustable to zero.
4
Full-scale range.
5
Conversion time may be shortened with “short cycle” set for lower resolution.
6
Guaranteed but not 100% production tested.
7
CSB–Complementary Straight Binary. COB–Complementary Offset Binary. CTC–Complementary Twos Complement.
8
CTC coding obtained by inverting MSB (Pin 1).
9
With Pin 23, clock rate controls tied to digital ground.
AD1376/AD1377
Rev. D | Page 5 of 12
ABSOLUTE MAXIMUM RATINGS
Table 2.
Parameter Rating
Supply Voltage ±18 V
Logic Supply Voltage +7 V
Analog Inputs (Pin 24 and Pin 25) ±25 V
Analog Ground to Digital Ground ±0.3 V
Digital Inputs −0.3 V to V
DD
+ 0.3 V
Junction Temperature 175°C
Storage Temperature 150°C
Lead Temperature (10 sec) 300°C
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those listed in the operational sections
of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the
human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
AD1376/AD1377
Rev. D | Page 6 of 12
DESCRIPTION OF OPERATION
0.0135
0.0080
0.0195
0.0120
0
–0.0120
–0.0195
0.0060
0.0030
0
–0.0030
–0.0060
–0.0080
–0.0135
025 70
00699-002
TEMPERATURE (°C)
LINEARITY ERROR (% FSR)
AD1376/AD1377KD
±2ppm/°C,
±0.003%, @ 25°C
AD1376/AD1377JD
±3ppm/°C,
±0.006%, @ 25°C
Figure 2. Linearity Error vs. Temperature
0.100
AD1376
0.001
0.003
0.006
0.010
5 10152
00699-003
CONVERSION TIME (µs)
LINEARITY AND DIFFERENTIAL LINEARITY
ERROR (% OF FSR)
0
SHORT CYCLED TO 12 BITS
1/2LSB 12-BIT
1/2LSB 13-BIT
1/2LSB 14-BIT
SHORT CYCLED TO 13 BITS
SHORT CYCLED TO 14 BITS
Figure 3. AD1376 Nonlinearity vs. Conversion Time
0.100
0.038
–0.038
0
–0.068
0.068
0
–0.100
0605040302010
00699-004
70
GAIN DRIFT ERROR (% FSR)
Figure 4. Gain Drift Error vs. Temperature
On receipt of a CONVERT START command, the AD1376/
AD1377 convert the voltage at the analog input into an
equivalent 16-bit binary number. This conversion is
accomplished as follows: the 16-bit successive approximation
register (SAR) has its 16-bit outputs connected both to the
device bit output pins and to the corresponding bit inputs of the
feedback DAC. The analog input is successively compared to
the feedback DAC output, one hit at a time (MSB first, LSB
last). The decision to keep or reject each bit is then made at the
completion of each bit comparison period, depending on the
state of the comparator at that time.
GAIN ADJUSTMENT
The gain adjustment circuit consists of a 100 ppm/°C poten-
tiometer connected across ±V
S
with its slider connected
through a 300 kΩ resistor to Pin 29 (GAIN ADJ) as shown in
Figure 5.
If no external trim adjustment is desired, Pin 27
(COMPARATOR IN) and Pin 29 can be left open.
00699-005
AD1376/AD1377
29
0.01µF
300k
+15V
10k
TO
100k
100ppm/°C
–15V
Figure 5. Gain Adjustment Circuit (±0.2% FSR)
ZERO OFFSET ADJUSTMENT
The zero offset adjustment circuit consists of a 100 ppm/°C
potentiometer connected across ±V
S
with its slider connected
through a 1.8 MΩ resistor to Pin 27 for all ranges. As shown in
Figure 6, the tolerance of this fixed resistor is not critical; a carbon
composition type is generally adequate. Using a carbon compo-
sition resistor having a −1200 ppm/°C temperature coefficient
contributes a worst-case offset temperature coefficient of 32 LSB
14
× 61 ppm/LSB
14
× 1200 ppm/°C = 2.3 ppm/°C of FSR, if the offset
adjustment potentiometer is set at either end of its adjustment
range. Since the maximum offset adjustment required is typically
no more than ±16 LSB
14
, use of a carbon composition offset
summing resistor typically contributes no more than 1 ppm/°C of
FSR offset temperature coefficient.
00699-006
AD1376/AD1377
27
1.8M
+15V
10k
TO
100k
–15V
Figure 6. Zero Offset Adjustment Circuit (±0.3% FSR)
An alternate offset adjustment circuit, which contributes a
negligible offset temperature coefficient if metal film resistors
(temperature coefficient <100 ppm/°C) are used, is shown in
Figure 7.
00699-007
AD1376/AD1377
27
22k M.F.
180kM.F.
180kM.F.
+15V
10k
TO
100k
OFFSET
ADJ
–15V
Figure 7. Low Temperature Coefficient Zero Adjustment Circuit

AD1377KD

Mfr. #:
Manufacturer:
Analog Devices Inc.
Description:
Analog to Digital Converters - ADC IC 16-BIT
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
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