4
Integrated Silicon Solution, Inc. — www.issi.com —
1-800-379-4774
Rev. D
12/13/2007
IS62WV51216ALL, IS62WV51216BLL
DC ELECTRICAL CHARACTERISTICS (Over Operating Range)
Symbol Parameter Test Conditions VDD Min. Max. Unit
VOH Output HIGH Voltage IOH = -0.1 mA 1.65-2.2V 1.4 V
IOH = -1 mA 2.5-3.6V 2.2 V
VOL Output LOW Voltage IOL = 0.1 mA 1.65-2.2V 0.2 V
IOL = 2.1 mA 2.5-3.6V 0.4 V
VIH Input HIGH Voltage 1.65-2.2V 1.4 VDD + 0.2 V
2.5-3.6V 2.2 VDD + 0.3 V
VIL
(1)
Input LOW Voltage 1.65-2.2V 0.2 0.4 V
2.5-3.6V –0.2 0.6 V
ILI Input Leakage GND VIN VDD –1 1 µA
ILO Output Leakage GND VOUT VDD, Outputs Disabled 1 1 µA
Notes:
1. VIL (min.) = –1.0V for pulse width less than 10 ns.
ABSOLUTE MAXIMUM RATINGS
(1)
Symbol Parameter Value Unit
VTERM Terminal Voltage with Respect to GND –0.2 to VDD+0.3 V
TBIAS Temperature Under Bias –40 to +85 °C
VDD VDD Related to GND –0.2 to +3.8 V
TSTG Storage Temperature –65 to +150 °C
PT Power Dissipation 1.0 W
Note:
1. Stress greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the
device. This is a stress rating only and functional operation of the device at these or any other conditions above
those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect reliability.
Integrated Silicon Solution, Inc. — www.issi.com —
1-800-379-4774
5
Rev. D
12/13/2007
IS62WV51216ALL, IS62WV51216BLL
AC TEST CONDITIONS
Parameter 62WV51216ALL 62WV51216BLL
(Unit) (Unit)
Input Pulse Level 0.4V to VDD-0.2 0.4V to VDD-0.3V
Input Rise and Fall Times 5 ns 5ns
Input and Output Timing VREF VREF
and Reference Level
Output Load See Figures 1 and 2 See Figures 1 and 2
AC TEST LOADS
Figure 1
Figure 2
62WV51216ALL 62WV51216BLL
(1.65V - 2.2V) (2.5V - 3.6V)
R1(Ω) 3070 1029
R2(Ω) 3150 1728
VREF 0.9V 1.5V
VTM 1.8V 2.8V
CAPACITANCE
(1)
Symbol Parameter Conditions Max. Unit
CIN Input Capacitance VIN = 0V 8 pF
COUT Input/Output Capacitance VOUT = 0V 10 pF
Note:
1. Tested initially and after any design or process changes that may affect these parameters.
R1
5 pF
Including
jig and
scope
R2
OUTPUT
VTM
R1
30 pF
Including
jig and
scope
R2
OUTPUT
VTM
6
Integrated Silicon Solution, Inc. — www.issi.com —
1-800-379-4774
Rev. D
12/13/2007
IS62WV51216ALL, IS62WV51216BLL
IS62WV51216ALL, POWER SUPPLY CHARACTERISTICS
(1)
(Over Operating Range)
Symbol Parameter Test Conditions Max. Unit
70
I
CC VDD Dynamic Operating VDD = Max., Com. 20 mA
Supply Current IOUT = 0 mA, f = fMAX Ind. 25
I
CC1 Operating Supply VDD = Max., CS1 = 0.2V Com. 4 mA
Current WE = VDD – 0.2V Ind. 4
CS2 = VDD – 0.2V, f = 1MHZ
ISB1 TTL Standby Current VDD = Max., Com. 0.3 mA
(TTL Inputs) VIN = VIH or VIL Ind. 0.3
CS1 = VIH , CS2 = VIL,
f = 1 MHZ
OR
ULB Control
VDD = Max., VIN = VIH or VIL
CS1 = VIL, f = 0, UB = VIH, LB = VIH
ISB2 CMOS Standby VDD = Max., Com. 15 µA
Current (CMOS Inputs) CS1
V DD – 0.2V, Ind. 21
CS2
0.2V, typ.
(1)
3
VIN
V DD – 0.2V, or
VIN
0.2V, f = 0
OR
ULB Control VDD = Max., CS1 = VIL, CS2=VIH
VIN
V DD – 0.2V, or VIN
0.2V, f = 0;
UB / LB = VDD – 0.2V
Note:.
1. Typical values are measured at V
DD = 1.8V, TA = 25
o
C and not 100% tested.

IS62WV51216BLL-55BLI

Mfr. #:
Manufacturer:
ISSI
Description:
SRAM 8Mb 512Kx16 55ns Async SRAM
Lifecycle:
New from this manufacturer.
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