Serial ATA Flash Drive
APMxxxGNEAN-4ETM1XX
9
© 2017 Apacer Technology Inc. Rev. 1.5
Apacer memory products come with S.M.A.R.T. commands and subcommands for users to obtain information
of drive status and to predict potential drive failures. Users can take advantage of the following
commands/subcommands to monitor the health of the drive.
Code
SMART Subcommand
D0h
READ DATA
D1h
READ ATTRIBUTE THRESHOLDS
D2h
Enable/Disable Attribute Autosave
D4h
Execute Off-line Immediate
D5h
Read Log (optional)
D6h
Write Log (optional)
D8h
Enable Operations
D9h
Disable operations
Dah
Return Status
General SMART attribute structure
Byte
Description
0
ID (Hex)
1 – 2
Status flag
3
Value
4
Worst
5*-11
Raw Data
*Byte 5: LSB
SMART attribute ID list
ID (Hex)
Attribute Name
9 (0x09)
Power-on hours
12 (0x0C)
Power cycle count
163 (0xA3)
Max. erase count
164 (0xA4)
Avg. erase count
166 (0xA6)
Total later bad block count
167 (0xA7)
SSD Protect Mode (vendor specific)
168 (0xA8)
SATA PHY Error Count
175 (0xAF)
Bad Cluster Table Count
192 (0xC0)
Unexpected Power Loss Count
194 (0xC2)
Temperature
241 (0xF1)
Total sectors of write
Serial ATA Flash Drive
APMxxxGNEAN-4ETM1XX
10
© 2017 Apacer Technology Inc. Rev. 1.5
3. Flash Management
3.1 Error Correction/Detection
SM220-300B implements a hardware ECC scheme, based on the BCH algorithm. It can detect and correct up
to 40 bits error in 1K bytes.
3.2 Bad Block Management
Current production technology is unable to guarantee total reliability of NAND flash memory array. When a
flash memory device leaves factory, it comes with a minimal number of initial bad blocks during production or
out-of-factory as there is no currently known technology that produce flash chips free of bad blocks. In addition,
bad blocks may develop during program/erase cycles. When host performs program/erase command on a
block, bad block may appear in Status Register. Since bad blocks are inevitable, the solution is to keep them
in control. Apacer flash devices are programmed with ECC, block mapping technique and S.M.A.R.T to
reduce invalidity or error. Once bad blocks are detected, data in those blocks will be transferred to free blocks
and error will be corrected by designated algorithms.
3.3 Global Wear Leveling
Flash memory devices differ from Hard Disk Drives (HDDs) in terms of how blocks are utilized. For HDDs,
when a change is made to stored data, like erase or update, the controller mechanism on HDDs will perform
overwrites on blocks. Unlike HDDs, flash blocks cannot be overwritten and each P/E cycle wears down the
lifespan of blocks gradually. Repeatedly program/erase cycles performed on the same memory cells will
eventually cause some blocks to age faster than others. This would bring flash storages to their end of service
term sooner. Global wear leveling is an important mechanism that levels out the wearing of all blocks so that
the wearing-down of all blocks can be almost evenly distributed. This will increase the lifespan of SSDs.
3.4 Power Failure Management
Power Failure Management plays a crucial role when experiencing unstable power supply. Power disruption
may occur when users are storing data into the SSD. In this urgent situation, the controller would run multiple
write-to-flash cycles to store the metadata for later block rebuilding. This urgent operation requires about
several milliseconds to get it done. At the next power up, the firmware will perform a status tracking to retrieve
the mapping table and resume previously programmed NAND blocks to check if there is any incompleteness
of transmission.
3.5 ATA Secure Erase
ATA Secure Erase is an ATA disk purging command currently embedded in most of the storage drives.
Defined in ATA specifications, (ATA) Secure Erase is part of Security Feature Set that allows storage drives to
erase all user data areas. The erase process usually runs on the firmware level as most of the ATA-based
storage media currently in the market are built-in with this command. ATA Secure Erase can securely wipe out
the user data in the drive and protects it from malicious attack.
Serial ATA Flash Drive
APMxxxGNEAN-4ETM1XX
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© 2017 Apacer Technology Inc. Rev. 1.5
3.6 TRIM
TRIM is a SATA command that helps improve the read/write performance and efficiency of solid-state drives
(SSD). The command enables the host operating system to inform SSD controller which blocks contain invalid
data, mostly because of the erase commands from host. The invalid will be discarded permanently and the
SSD will retain more space for itself.
3.7 Flash Translation Layer – Page Mapping
Page mapping is an advanced flash management technology whose essence lies in the ability to gather data,
distribute the data into flash pages automatically, and then schedule the data to be evenly written. Page-level
mapping uses one page as the unit of mapping. The most important characteristic is that each logical page
can be mapped to any physical page on the flash memory device. This mapping algorithm allows different
sizes of data to be written to a block as if the data is written to a data pool and it does not need to take extra
operations to process a write command. Thus, page mapping is adopted to increase random access speed
and improve SSD lifespan, reduce block erase frequency, and achieve optimized performance and lifespan.
3.8 SATA Power Management
By complying with SATA 6.0 Gb/s specifications, the SSD supports the following SATA power saving modes:
ACTIVE: PHY ready, full power, Tx & Rx operational
PARTIAL: Reduces power, resumes in under 10 µs (microseconds)
SLUMBER: Reduces power, resumes in under 10 ms (milliseconds)
HIPM: Host-Initiated Power Management
DIPM: Device-Initiated Power Management
Note: The behaviors of power management features would depend on host/device settings.

APM128GNEAN-4ETM1G

Mfr. #:
Manufacturer:
Apacer
Description:
Solid State Drives - SSD mSATA SM220-300B MLC 128GB
Lifecycle:
New from this manufacturer.
Delivery:
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