74HCT08BQ-Q100,115

74HC_HCT08_Q100 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2012. All rights reserved.
Product data sheet Rev. 1 — 16 July 2012 6 of 14
NXP Semiconductors
74HC08-Q100; 74HCT08-Q100
Quad 2-input AND gate
[1] t
pd
is the same as t
PHL
and t
PLH
.
[2] t
t
is the same as t
THL
and t
TLH
.
[3] C
PD
is used to determine the dynamic power dissipation (P
D
in W):
P
D
=C
PD
V
CC
2
f
i
N+ (C
L
V
CC
2
f
o
) where:
f
i
= input frequency in MHz;
f
o
= output frequency in MHz;
C
L
= output load capacitance in pF;
V
CC
= supply voltage in V;
N = number of inputs switching;
(C
L
V
CC
2
f
o
) = sum of outputs.
11. Waveforms
C
PD
power dissipation
capacitance
per package; V
I
=GNDtoV
CC
[3]
-10- - -pF
74HCT08-Q100
t
pd
propagation delay nA, nB to nY; see Figure 6
[1]
V
CC
= 4.5 V - 14 24 30 36 ns
V
CC
= 5.0 V; C
L
=15pF - 11 - - - ns
t
t
transition time V
CC
= 4.5 V; see Figure 6
[2]
- 7 15 19 22 ns
C
PD
power dissipation
capacitance
per package;
V
I
=GNDtoV
CC
1.5 V
[3]
-20- - -pF
Table 7. Dynamic characteristics
GND = 0 V; C
L
= 50 pF; for load circuit see Figure 7.
Symbol Parameter Conditions 25 C 40 C to +125 C Unit
Min Typ Max Max
(85 C)
Max
(125 C)
Measurement points are given in Table 9.
V
OL
and V
OH
are typical voltage output levels that occur with the output load.
Fig 6. Input to output propagation delays
*1'
9
2+
9
2/
Q<RXWSXW
DDD
9
,
W
3+/
W
7+/
W
7/+
W
3/+
9
<
9
0
9
0
9
;
Q$Q%LQSXW
Table 8. Measurement points
Type Input Output
V
M
V
M
V
X
V
Y
74HC08-Q100 0.5V
CC
0.5V
CC
0.1V
CC
0.9V
CC
74HCT08-Q100 1.3 V 1.3 V 0.1V
CC
0.9V
CC
74HC_HCT08_Q100 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2012. All rights reserved.
Product data sheet Rev. 1 — 16 July 2012 7 of 14
NXP Semiconductors
74HC08-Q100; 74HCT08-Q100
Quad 2-input AND gate
Test data is given in Table 9.
Definitions test circuit:
R
T
= termination resistance should be equal to output impedance Z
o
of the pulse generator.
C
L
= load capacitance including jig and probe capacitance.
Fig 7. Load circuitry for measuring switching times
001aah768
t
W
t
W
t
r
t
r
t
f
V
M
V
I
negative
pulse
GND
V
I
positive
pulse
GND
10 %
90 %
90 %
10 %
V
M
V
M
V
M
t
f
V
CC
DUT
R
T
V
I
V
O
C
L
G
Table 9. Test data
Type Input Load Test
V
I
t
r
, t
f
C
L
74HC08-Q100 V
CC
6.0 ns 15 pF, 50 pF t
PLH
, t
PHL
74HCT08-Q100 3.0 V 6.0 ns 15 pF, 50 pF t
PLH
, t
PHL
74HC_HCT08_Q100 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2012. All rights reserved.
Product data sheet Rev. 1 — 16 July 2012 8 of 14
NXP Semiconductors
74HC08-Q100; 74HCT08-Q100
Quad 2-input AND gate
12. Package outline
Fig 8. Package outline SOT108-1 (SO14)
UNIT
A
max.
A
1
A
2
A
3
b
p
cD
(1)
E
(1)
(1)
eH
E
LL
p
QZywv θ
REFERENCES
OUTLINE
VERSION
EUROPEAN
PROJECTION
ISSUE DATE
IEC JEDEC JEITA
mm
inches
1.75
0.25
0.10
1.45
1.25
0.25
0.49
0.36
0.25
0.19
8.75
8.55
4.0
3.8
1.27
6.2
5.8
0.7
0.6
0.7
0.3
8
0
o
o
0.25 0.1
DIMENSIONS (inch dimensions are derived from the original mm dimensions)
Note
1. Plastic or metal protrusions of 0.15 mm (0.006 inch) maximum per side are not included.
1.0
0.4
SOT108-1
X
w M
θ
A
A
1
A
2
b
p
D
H
E
L
p
Q
detail X
E
Z
e
c
L
v M
A
(A )
3
A
7
8
1
14
y
076E06 MS-012
pin 1 index
0.069
0.010
0.004
0.057
0.049
0.01
0.019
0.014
0.0100
0.0075
0.35
0.34
0.16
0.15
0.05
1.05
0.041
0.244
0.228
0.028
0.024
0.028
0.012
0.01
0.25
0.01 0.004
0.039
0.016
99-12-27
03-02-19
0 2.5 5 mm
scale
SO14: plastic small outline package; 14 leads; body width 3.9 mm
SOT108-1

74HCT08BQ-Q100,115

Mfr. #:
Manufacturer:
Nexperia
Description:
Logic Gates 74HCT08BQ-Q100/DHVQFN14/REEL 7
Lifecycle:
New from this manufacturer.
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