ISL6610ACRZ-T

7
FN6395.0
November 22, 2006
the bootstrap capacitor when exposed to excessively large
negative voltage swing at the PHASE node. Typically, such
large negative excursions occur in high current applications
that use D
2
-PAK and D-PAK MOSFETs or excessive layout
parasitic inductance. The following equation helps select a
proper bootstrap capacitor size:
where Q
G1
is the amount of gate charge per upper MOSFET
at V
GS1
gate-source voltage and N
Q1
is the number of
control MOSFETs. The ΔV
BOOT_CAP
term is defined as the
allowable droop in the rail of the upper gate drive.
As an example, suppose two HAT2168 FETs are chosen as
the upper MOSFETs. The gate charge, Q
G
, from the data
sheet is 12nC at 5V (V
GS
) gate-source voltage. Then the
Q
GATE
is calculated to be 26.4nC at 5.5V PVCC level. We
will assume a 100mV droop in drive voltage over the PWM
cycle. We find that a bootstrap capacitance of at least
0.264μF is required. The next larger standard value
capacitance is 0.33µF. A good quality ceramic capacitor is
recommended.
Power Dissipation
Package power dissipation is mainly a function of the
switching frequency (F
SW
), the output drive impedance, the
external gate resistance, and the selected MOSFET’s
internal gate resistance and total gate charge. Calculating
the power dissipation in the driver for a desired application is
critical to ensure safe operation. Exceeding the maximum
allowable power dissipation level will push the IC beyond the
maximum recommended operating junction temperature of
+125°C. The maximum allowable IC power dissipation for
the SO14 package is approximately 1W at room
temperature, while the power dissipation capacity in the
QFN packages, with an exposed heat escape pad, is around
2W. See Layout Considerations paragraph for thermal
transfer improvement suggestions. When designing the
driver into an application, it is recommended that the
following calculation is used to ensure safe operation at the
desired frequency for the selected MOSFETs. The total gate
drive power losses due to the gate charge of MOSFETs and
the driver’s internal circuitry and their corresponding average
driver current can be estimated with Equations 2 and 3,
respectively,
where the gate charge (Q
G1
and Q
G2
) is defined at a
particular gate to source voltage (V
GS1
and V
GS2
) in the
corresponding MOSFET datasheet; I
Q
is the driver’s total
quiescent current with no load at both drive outputs and can
be negligible; N
Q1
and N
Q2
are number of upper and lower
MOSFETs, respectively. The factor 2 is the number of active
channels. The I
Q
V
CC
product is the quiescent power of the
driver without capacitive load and is typically negligible.
The total gate drive power losses are dissipated among the
resistive components along the transition path. The drive
resistance dissipates a portion of the total gate drive power
losses, the rest will be dissipated by the external gate
resistors (R
G1
and R
G2
, should be a short to avoid
interfering with the operation shoot-through protection
circuitry) and the internal gate resistors (R
GI1
and R
GI2
) of
MOSFETs. Figures 3 and 4 show the typical upper and lower
gate drives turn-on transition path. The power dissipation on
the driver can be roughly estimated as:
C
BOOT_CAP
Q
GATE
ΔV
BOOT_CAP
--------------------------------------
Q
GATE
Q
G1
PVCC
V
GS1
------------------------------------
N
Q1
=
(EQ. 1)
50nC
20nC
FIGURE 2. BOOTSTRAP CAPACITANCE vs BOOT RIPPLE
VOLTAGE
ΔV
BOOT
(V)
C
BOOT_CAP
(µF)
1.6
1.4
1.2
1.0
0.8
0.6
0.4
0.2
0.0
0.30.0 0.1 0.2 0.4 0.5 0.6 0.90.7 0.8 1.0
Q
GATE
= 100nC
1.8
2.0
(EQ. 2)
P
Qg_Q1
Q
G1
PVCC
2
V
GS1
---------------------------------------
F
SW
N
Q1
=
P
Qg_Q2
Q
G2
PVCC
2
V
GS2
---------------------------------------
F
SW
N
Q2
=
P
Qg_TOT
2P
Qg_Q1
P
Qg_Q2
+() I
Q
VCC+=
(EQ. 3)
I
DR
2
Q
G1
N
Q1
V
GS1
----------------------------- -
Q
G2
N
Q2
V
GS2
----------------------------- -
+
⎝⎠
⎜⎟
⎛⎞
F
SW
I
Q
+=
(EQ. 4)
P
DR_UP
R
HI1
R
HI1
R
EXT1
+
--------------------------------------
R
LO1
R
LO1
R
EXT1
+
----------------------------------------
+
⎝⎠
⎜⎟
⎛⎞
P
Qg_Q1
2
---------------------
=
P
DR_LOW
R
HI2
R
HI2
R
EXT2
+
--------------------------------------
R
LO2
R
LO2
R
EXT2
+
----------------------------------------
+
⎝⎠
⎜⎟
⎛⎞
P
Qg_Q2
2
---------------------
=
R
EXT2
R
G1
R
GI1
N
Q1
-------------
+=
R
EXT2
R
G2
R
GI2
N
Q2
-------------
+=
P
DR
2P
DR_UP
P
DR_LOW
+() I
Q
VCC+=
ISL6610, ISL6610A
8
FN6395.0
November 22, 2006
Application Information
MOSFET and Driver Selection
The parasitic inductances of the PCB and of the power
devices’ packaging (both upper and lower MOSFETs) can
cause serious ringing, exceeding absolute maximum rating
of the devices. The negative ringing at the edges of the
PHASE node could increase the bootstrap capacitor voltage
through the internal bootstrap diode, and in some cases, it
may overstress the upper MOSFET driver. Careful layout,
proper selection of MOSFETs and packaging, as well as the
proper driver can go a long way toward minimizing such
unwanted stress.
The selection of D
2
-PAK, or D-PAK packaged MOSFETs, is
a much better match (for the reasons discussed) for the
ISL6610A with a phase resistor, as shown in Figure 5. Low-
profile MOSFETs, such as Direct FETs and multi-SOURCE
leads devices (SO-8, LFPAK, PowerPAK), have low parasitic
lead inductances and can be driven by either ISL6610 or
ISL6610A (assuming proper layout design). The ISL6610,
missing the 3Ω integrated BOOT resistor, typically yields
slightly higher efficiency than the ISL6610A.
Layout Considerations
A good layout helps reduce the ringing on the switching
node (PHASE) and significantly lower the stress applied to
the output drives. The following advice is meant to lead to an
optimized layout and performance:
Keep decoupling loops (VCC-GND, PVCC-PGND and
BOOT-PHASE) short and wide, at least 25 mils. Avoid
using vias on decoupling components other than their
ground terminals, which should be on a copper plane with
at least two vias.
Minimize trace inductance, especially on low-impedance
lines. All power traces (UGATE, PHASE, LGATE, PGND,
PVCC, VCC, GND) should be short and wide, at least 25
mils. Try to place power traces on a single layer,
otherwise, two vias on interconnection are preferred
where possible. For no connection (NC) pins on the QFN
part, connect it to the adjacent net (LGATE2/PHASE2) can
reduce trace inductance.
Shorten all gate drive loops (UGATE-PHASE and LGATE-
PGND) and route them closely spaced.
Minimize the inductance of the PHASE node. Ideally, the
source of the upper and the drain of the lower MOSFET
should be as close as thermally allowable.
Minimize the current loop of the output and input power
trains. Short the source connection of the lower MOSFET
to ground as close to the transistor pin as feasible. Input
capacitors (especially ceramic decoupling) should be
placed as close to the drain of upper and source of lower
MOSFETs as possible.
Avoid routing relatively high impedance nodes (such as
PWM and ENABLE lines) close to high dV/dt UGATE and
PHASE nodes.
In addition, connecting the thermal pad of the QFN package
to the power ground through multiple vias, or placing a low
noise copper plane (such as power ground) underneath the
SOIC part is recommended. This is to improve heat
dissipation and allow the part to achieve its full thermal
potential.
Upper MOSFET Self Turn-On Effects At Startup
Should the driver have insufficient bias voltage applied, its
outputs are floating. If the input bus is energized at a high
dV/dt rate while the driver outputs are floating, due to the
self-coupling via the internal C
GD
of the MOSFET, the
UGATE could momentarily rise up to a level greater than the
threshold voltage of the MOSFET. This could potentially turn
on the upper switch and result in damaging inrush energy.
FIGURE 3. TYPICAL UPPER-GATE DRIVE TURN-ON PATH
FIGURE 4. TYPICAL LOWER-GATE DRIVE TURN-ON PATH
FIGURE 5. PHASE RESISTOR TO MINIMIZE SERIOUS
NEGATIVE PHASE SPIKE
Q1
D
S
G
R
GI1
R
G1
BOOT
R
HI1
C
DS
C
GS
C
GD
R
LO1
PHASE
PVCC
UGATE
PVCC
Q2
D
S
G
R
GI2
R
G2
R
HI2
C
DS
C
GS
C
GD
R
LO2
GND
LGATE
Q1
D
S
G
R
PH
=1-2Ω
BOOT
R
HI1
R
LO1
PHASE
PVCC
UGATE
ISL6610, ISL6610A
9
FN6395.0
November 22, 2006
Therefore, if such a situation (when input bus powered up
before the bias of the controller and driver is ready) could
conceivably be encountered, it is a common practice to
place a resistor (R
UGPH
) across the gate and source of the
upper MOSFET to suppress the Miller coupling effect. The
value of the resistor depends mainly on the input voltage’s
rate of rise, the C
GD
/C
GS
ratio, as well as the gate-source
threshold of the upper MOSFET. A higher dV/dt, a lower
C
DS
/C
GS
ratio, and a lower gate-source threshold upper
FET will require a smaller resistor to diminish the effect of
the internal capacitive coupling. For most applications, the
integrated 20kΩ typically sufficient, not affecting normal
performance and efficiency.
The coupling effect can be roughly estimated with the
following equations, which assume a fixed linear input ramp
and neglect the clamping effect of the body diode of the
upper drive and the bootstrap capacitor. Other parasitic
components such as lead inductances and PCB
capacitances are also not taken into account. These
equations are provided for guidance purpose only.
Therefore, the actual coupling effect should be examined
using a very high impedance (10MΩ or greater) probe to
ensure a safe design margin.
V
GS_MILLER
dV
dt
-------
RC
rss
1e
V
DS
dV
dt
-------
RC
iss
----------------------------------
⎝⎠
⎜⎟
⎜⎟
⎜⎟
⎜⎟
⎛⎞
⋅⋅=
RR
UGPH
R
GI
+=
C
rss
C
GD
=
C
iss
C
GD
C
G
S
+=
(EQ. 5
)
FIGURE 6. GATE TO SOURCE RESISTOR TO REDUCE
UPPER MOSFET MILLER COUPLING
VIN
Q
UPPER
D
S
G
R
GI
R
UGPH
BOOT
DU
C
DS
C
GS
C
GD
DL
PHASE
VCC
ISL6610, ISL6610A
C
BOOT
UGATE
ISL6610, ISL6610A

ISL6610ACRZ-T

Mfr. #:
Manufacturer:
Renesas / Intersil
Description:
Gate Drivers DL 5V DRVRS W/BOOTS DESKTOP COMPTING 4X4
Lifecycle:
New from this manufacturer.
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