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URG2012L-101-L-T05

P1-P3P4-P4
Metal thin film chip resistors
(the highest reliability and precision)
■
URG series
◆
Part numbering system
◆
Electrical Specification
・
・
・
・
・
・
The tightest resistance tolerance: +/-0.01%
The smallest temperature coefficient of resistance: ±1ppm/
℃
Long term stability with inorganic passivation
Thin film structure enabling low noise and anti-sulfur
Industrial measurement, electrical scales
High precision sensors, medical electronics
Packaging quantity: T1(1,000pcs),
T05(500pcs), T01(100pcs)
Resistance tolerance
Series code
Size: URG1608, URG2012,
URG3216, URG5025, URG6432
Nominal resistance value (E-24: 3 digit, E-96: 4 digit,
URG3216, URG5025, URG6432: all 4 digit)
Temperature coefficient of resistance
Applications
Features
E24, E96
±1（K）
±2（L）
±1（K）
±２（L）
±1（K）
±２（L）
±1（K）
±２（L）
±1（K）
±２（L）
Temperature
coefficient
of resistance
*1
Resistance range(Ω) Resistance tolerance
Power
ratings
Type
Maximum
voltage
Resistance
value series
-55℃ ~ 155℃
*Contact us for requirements not listed in above table.
T1
T05
T01
T01
Operating
temperature
Packaging
quantity
1/16W
1/10W
1/4W
1/2W
3/4W
100≦R≦7.5k
10 0≦R≦36 k
10 0≦R≦68 k
100≦R≦150k
100≦R≦200k
100V
150V
200V
300V
300V
±0.01% (L) ±0.02% (P) ±0.05% (W) ±0.1% (B) ±0.5% (D)(ppm/°C)
URG1608
URG2012
URG3216
URG5025
URG6432
*1 Applicable TCR range -20°C ~ 125°C
11
URG 2012 L - 102 - L - T1
URG series
Thin film surface mount resistors
AEC-Q200 Compliant
◆
Reliability specification
Standard
Test items Condition (test methods (MIL-PRF-55342/JIS C5201-1)
Short time overload
Life (biased)
High temperature high humidity
Temperature shock
High temperature exposure
Resistance to soldering heat
◆
Dimensions
URG1608
URG2012
URG3216
URG5025
URG6432
0603
0805
1206
2010
2512
Type
1.60±0.20
2.00±0.20
3.20±0.20
5.00±0.20
6.40＋0.20/−0.40
Size
(inch)
L
0.80＋0.25/−0.20
1.25＋0.25/−0.20
1.60±0.25
2.50±0.25
3.20±0.25
W
0.30±0.20
0.40±0.20
0.50±0.25
0.60±0.25
0.75±0.25
a
0.40＋0.15/−0.10
0.40＋0.15/−0.10
0.40＋0.15/−0.10
0.45±0.10
0.45±0.20
t
（unit：mm）
±0.02％+0.01Ω
±0.02％+0.01Ω(R≧250Ω)
±0.05％+0.01Ω(R＜250Ω)
±0.05％+0.01Ω
±0.02％+0.01Ω
±0.05％+0.01Ω
±0.0１％+0.01Ω
2.5 x rated voltage, 5seconds
70℃, rated voltage, 90min on 30min off, 2000hours
85℃, 85%RH, 1/10 of rated power, 90min on 30min off, 1000hours
-65℃ (15min) ∼ 150℃ (15min) 100cycles
155℃, no bias, 1000hours
235±5℃, 30 seconds (reflow), (by MIL-PRF-55342)
*1
*1
*1
Rated voltage is given by E=
R x P
E= rated voltage (V), R=nominal resistance value(Ω), P=rated power(W)
If rated voltage exceeds maximum voltage /element, maximum voltage/element is the rated voltage.
12
L
W
t
aa
URG series
Thin film surface mount resistors
b
0.30±0.20
0.40±0.20
0.50±0.20
0.60±0.25
0.80±0.20
b
Resistance drift (ppm)
Test duration(h)
500
400
300
200
100
0
-100
-200
-300
-400
-500
URG3216
THB 85 ℃, 85 %, n = 20
10           100           1000         10000
250Ω 1kΩ 68kΩ
Resistance drift (ppm)
Number of cycles
200
150
100
50
0
-50
-100
-150
-200
URG2012, n = 10
Thermal Shock_-65℃ to +150℃
10           10            100          1000
250Ω 1kΩ 68kΩ
Resistance drift (ppm)
Number of cycles
200
150
100
50
0
-50
-100
-150
-200
URG3216, n = 10
Thermal Shock_ -65℃ to +150℃
250Ω 1kΩ 68kΩ
10           10            100          1000
Resistance drift (ppm)
Test duration(h)
500
400
300
200
100
0
-100
-200
-300
-400
-500
URG2012
THB 85 ℃, 85 %, n = 20
250Ω
20kΩ
1kΩ
32kΩ
10kΩ
10           100           1000         10000
Resistance drift (ppm)
Test duration(h)
500
400
300
200
100
0
-100
-200
-300
-400
-500
URG2012, n = 20
High Temperature Exposure,155℃
250Ω 1kΩ 32kΩ
10           100           1000         10000
Resistance drift (ppm)
Test duration(h)
500
400
300
200
100
0
-100
-200
-300
-400
-500
URG3216, n = 20
High Temperature Exposure,155℃
250Ω 1kΩ 68kΩ
10           100           1000         10000
Resistance drift (ppm)
Test duration(h)
1000
800
600
400
200
0
-200
-400
-600
-800
-1000
URG2012
LL70℃_0.25W, n = 20
250Ω
20kΩ
1kΩ
32kΩ
10kΩ
10           100           1000         10000
Resistance drift (ppm)
Test duration(h)
1000
800
600
400
200
0
-200
-400
-600
-800
-1000
URG3216
LL70℃_0.25W, n = 20
250Ω 1kΩ 68kΩ
110           100           1000         10000
◆
Reliability test data
○
Biased life test
○
High temperature high humidity (biased)
○
Temperature shock
○
High temperature exposure
Metal thin film chip resistors
(the highest reliability and precision)
■
URG series
13
URG series
Thin film surface mount resistors
P1-P3P4-P4

URG2012L-101-L-T05

Mfr. #:
Buy URG2012L-101-L-T05
Manufacturer:
Susumu
Description:
Thin Film Resistors - SMD 1/10W 100ohm 0.01% 2ppm
Lifecycle:
New from this manufacturer.
Delivery:
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Payment:
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