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FXTC-HE73PR-18 MHZ

P1-P3P4-P6P7-P9P10-P11
Model: FXTC-HE73 Series
Preliminary
Page 4 of 4
© 2012 FOX ELECTRONICS | ISO9001:2008 Certified
Doc #100909
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If 30% to 70% times are used, Rise and Fall times change to 1.5 nS from 0.75 to 250MHz
If 20% to 80% times are used, Rise and Fall times change to 2 nS from 0.75 to 150MHz
Output Wave Characteristics
Parameters
Symbol
Condition
Maximum Value
(unless otherwise noted)
Output LOW Voltage V
OL
15pF Load - All frequencies
0.75 to 150 MHz
150+ to 250 MHz
10% V
DD
20% V
DD
Output HIGH Voltage V
OH
15pF Load - All frequencies
0.75 to 150 MHz
150+ to 250 MHz
90% V
DD
MIN
80% V
DD
MIN
Output Symmetry
(See Drawing
Below)
15pF Load - All frequencies
@ 50% V
DD
Level
45% ~ 55%
Output Enable
(PIN # 2)
Voltage V
IH
≥ 70% V
DD
Output Disable
(PIN # 2)
Voltage V
IL
≤ 30% V
DD
Cycle Rise Time (See Drawing Below) T
R
15pF Load - All frequencies
0.75 to 150 MHz
150+ to 250 MHz
3 nS
(10%~90%)
3 nS
(
20%~80%
)
Cycle Fall Time
(See Drawing Below) T
F
15pF Load - All frequencies
0.75 to 150 MHz
150+ to 250 MHz
3 nS
(90%~10%)
3 nS
(
80%~20%
)
20% to 80%
10% to 90%
0V to V
Rise Time
10% - 90%
90% - 10%
Fall Time
Times
80 - 20
50% V
On Time
Off Time
1/2 Period
Period
Ideally, Symmetry should be 50/50 -- Other expressions are 45/55 or 55/45
1/2 Period
Rise Time / Fall Time Measurements
Oscillator Symmetry
70 - 30
Times
30% to 70%
DD
DD
Model: FXTC-HE73 Series
Preliminary
Page 5 of 5
© 2012 FOX ELECTRONICS | ISO9001:2008 Certified
Doc #100909
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Phase Noise was measured on an Agilent 5052A Phase Noise Measurement System; measured directly into 50 ohm input; V
DD
= 3.3V.
15.36MHz only to 5MHz offset due to Equipment Limitation.
Jitter is frequency dependent. Below are typical measured values at select frequencies.
Phase Jitter is integrated from Agilent 5052A Phase Noise Measurement System; measured directly into 50 ohm input; V
DD
= 3.3V.
TIE was measured on LeCroy LC684 Digital Storage Scope, directly into 50 ohm input, with Amherst M1 software; V
DD
= 3.3V.
Per MJSQ spec (Methodologies for Jitter and Signal Quality specifications)
Rj and Dj
, measured on LeCroy LC684 Digital Storage Scope, directly into 50 ohm input, with Amherst M1 software.
Per MJSQ spec (Methodologies for Jitter and Signal Quality specifications)
Phase Jitter & Time Interval Error (TIE)
Frequency
Phase Jitter
12kHz to 20MHz (Fo = 156.16 MHz)
12kHz to 5MHz (Fo = 15.36 MHz)
T I E
(Sigma of Jitter Distribution)
Units
15.36 MHz
0.94 3.5
pS RMS
156.16 MHz
1.10 3.9
pS RMS
Random & Deterministic Jitter Composition
Frequency
Random (Rj)
(pS RMS)
Deterministic (Dj)
(pS P-P)
Total Jitter (Tj)
(14 x Rj) + Dj
15.36 MHz
1.68 8.7 32.7
156.16 MHz
1.47 10.3 31.3
Phase Noise
Model: FXTC-HE73 Series
Preliminary
Page 6 of 6
© 2012 FOX ELECTRONICS | ISO9001:2008 Certified
Doc #100909
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Pin Description and Recommended Circuit
Pin #
Name
Type
Function
1
E / D
1
Control Enable / Disable Control of Output (0 = Disabled)
2 GND Ground Electrical Ground for V
DD
3 Output Output HCMOS Oscillator Output
4
V
DD
2
Power Power Supply Source Voltage
NOTES:
1
Includes pull-up resistor to V
DD
to provide output when the pin (1) is No Connect.
2
Installation should include a 0.01µF bypass capacitor placed between V
DD
(Pin 4) and GND (Pin 2) to minimize power supply line noise.
E / D V
DD
N. C. N. C.
GND Output
Terminations as viewed from the Top
Enable / Disable Control
Pin # 1 (state) Output (Pin # 3)
OPEN
(No Connection)
ACTIVE Output
“1” Level V
IH
≥ 70% V
DD
ACTIVE Output
“0” Level V
IL
≤ 30% V
DD
High Impedance
Solderin
g
Reflow Profile
(
2 times Maximum at 260°C for 10 seconds MAX
)
25°C
160°C
180°C
225°C
260°C
10 Seconds Max
within 5°C of 260°C peak
Ramp Down
Not to exceed 6°C/s
Ramp-Up
3°C/s Max
p
t
120 ± 20 Seconds
In Pre-heating Area
Above 225°C Reflow Area
50±10 Seconds
400 Seconds MAX from +25°C to 260°C peak
2
1
3
4
TP
TP
P1-P3P4-P6P7-P9P10-P11

FXTC-HE73PR-18 MHZ

Mfr. #:
Buy FXTC-HE73PR-18 MHZ
Manufacturer:
Description:
XTAL OSC TCXO 18.0000MHZ HCMOS
Lifecycle:
New from this manufacturer.
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