Rev. 1.0 12/02 Copyright © 2002 by Silicon Laboratories Si5018-EVB-10
Si5018-EVB
EVALUATION BOARD FOR Si5018 SiPHY™ OC-48/STM-16
C
LOCK AND DATA RECOVERY IC WITH FEC
Description
The Si5018 evaluation board provides a platform for
testing and characterizing Silicon Laboratories Si5018
OC-48, STM-16, and 2.7 Gbps FEC clock and data
recovery (CDR) device.
All high-speed I/Os are ac coupled to ease interfacing to
industry standard test equipment.
Features
Single 2.5 V power supply
Differential I/Os ac coupled
Simple jumper configuration
Function Block Diagram
REFCLK
+
Z
C
= 50
Z
C
= 50
Z
C
= 50
Z
C
= 50
DATAIN
+
CLKOUT
+
DATAOUT
+
Z
C
= 50
Z
C
= 50
Z
C
= 50
Z
C
= 50
Pulse
Generator
Pattern
Generator
Jitter
Analyzer
Scope
Pattern
Analyzer
Si5018
LOL
REXT
PWRDN/CAL
10 k
Jumper
Si5018-EVB
Rev C
Test
Point
Si5018-EVB
2 Rev. 1.0
Functional Description
The evaluation board simplifies characterization of the
Si5018 OC-48, STM-16, and 2.7 Gbps FEC clock and
data recovery (CDR) device by providing access to all of
the Si5018 I/Os. Device performance can be evaluated
by following the Test Configuration section below.
Specific performance metrics include jitter tolerance,
jitter generation, and jitter transfer.
Power Supply
The evaluation board requires one 2.5 V supply. Supply
filtering is placed on the board to filter typical system
noise components, however, initial performance testing
should use a linear supply capable of supplying 2.5 V
±5% dc.
CAUTION: The evaluation board is designed so that the
body of the SMA jacks and GND are shorted. Care must
be taken when powering the PCB at potentials other
than GND at 0.0 V and VDD at 2.5 V relative to chassis
GND.
Self-Calibration
The Si5018 device provides an internal self-calibration
function that optimizes the loop gain parameters within
the internal DSPLL
TM
. Self-calibration is initiated by a
high-to-low transition of the PWRDN/CAL signal while a
valid reference clock is supplied to the REFCLK input.
On the Si5018-EVB board, a voltage detector IC is
utilized to initiate self-calibration. The voltage detector
drives the PWRDN/CAL signal low after the supply
voltage has reached a specific voltage level. This circuit
is described in Silicon Laboratories application note
AN42. On the Si5018-EVB, the PWRDN/CAL signal is
also accessible via a jumper located in the lower left-
hand corner of the evaluation board. PWRDN/CAL is
wired to the signal post adjacent to the 2.5 V post.
Device Powerdown
The CDR can be powered down via the PWRDN/CAL
signal. When asserted the evaluation board will draw
minimal current. PWRDN/CAL is controlled via one
jumper located in the lower left-hand corner of the
evaluation board. PWRDN/CAL is wired to the signal
post adjacent to the 2.5 V post.
CLKOUT, DATAOUT, DATAIN
These high-speed I/Os are wired to the board perimeter
on 30 mil (0.030 inch) 50 microstrip lines to the end-
launch SMA jacks as labeled on the PCB. These I/Os
are ac coupled to simplify direct connection to a wide
array of standard test hardware. Because each of these
signals are differential both the positive (+) and negative
(–) terminals must be terminated to 50 . Terminating
only one side will adversely degrade the performance of
the CDR. The inputs are terminated on the die with 50
resistors.
To improve the DATAOUT eye-diagram, short 100
transmission line segments precede the 50 high-
speed traces. These segments increase the interface
bandwidth from the chip to the 50 traces and reduce
data inter-symbol-interference. Please refer to Silicon
Laboratories application note AN43 for more details.
Note: The 50 termination is for each terminal/side of a dif-
ferential signal, thus the differential termination is actu-
ally 50 +50 =100.
REFCLK
REFCLK is used to center the frequency of the
DSPLL™ so that the device can lock to the data. Ideally
the REFCLK frequency should be 1/128th, 1/32nd, or
1/16th the VCO frequency and must have a frequency
accuracy of ±100 PPM. Internally, the CDR
automatically recognizes the REFCLK frequency within
one of these three frequency ranges. Typical REFCLK
frequencies are given in Table 1. REFCLK is ac coupled
to the SMA jacks located on the top side of the
evaluation board.
Loss-of-Lock (LOL)
LOL is an indicator of the relative frequency between
the data and the REFCLK. LOL will assert when the
frequency difference is greater than ±600 PPM. In order
to prevent LOL from de-asserting prematurely, there is
hysterisis in returning from the out-of-lock condition.
LOL will be de-asserted when the frequency difference
is less than ±300 PPM.
LOL is wired to a test point which is located on the
upper right-hand side of the evaluation board.
Test Configuration
The three critical tests that are typically performed on a
CDR device are jitter transfer, jitter tolerance, and jitter
generation. By connecting the Si5018 Evaluation Board
as shown in Figure 1, all three measurements can be
easily made.
REFCLK should be within ±100 PPM of the frequency
selected from Table 1. PWRDN/CAL must be
unjumpered.
Table 1. Typical REFCLK Frequencies
SONET/SDH
Gigabit
Ethernet
SONET/
SDH with
15/14 FEC
Ratio of
VCO to
REFCLK
19.44 MHz 19.53 MHz 20.83 MHz 128
77.76 MHz 78.125 MHz 83.31 MHz 32
155.52 MHz 156.25 MHz 166.63 MHz 16
Si5018-EVB
Rev. 1.0 3
Jitter Tolerance: Referring to Figure 1, this test
requires a pattern generator, a clock source
(synthesizer signal source), a modulation source, a jitter
analyzer, a pattern analyzer, and a pulse generator (all
unconnected high-speed outputs must be terminated to
50 ). During this test the Jitter Analyzer causes a
modulation on the data pattern which drives the DATAIN
ports of the CDR. The Bit-Error-Rate (BER) is monitored
on the Pattern Analyzer. The modulation (jitter)
frequency and amplitude is recorded when the BER
approaches a specified threshold.
Jitter Generation: Referring to Figure 1, this test
requires a pattern generator, a clock source
(synthesizer signal source), a jitter analyzer, and a
pulse generator (all unconnected high-speed outputs
must be terminated to 50 ). During this test there is no
modulation of the Data Clock, so the data that is sent to
the CDR is jitter free. The Jitter Analyzer measures the
RMS and peak-to-peak jitter on the CDR CLKOUT.
Thus, any jitter measured is jitter generated by the
CDR.
Jitter Transfer: Referring to Figure 1, this test requires
a pattern generator, a clock source (synthesizer signal
source), a modulation source, a jitter analyzer, and a
pulse generator (all unconnected high-speed outputs
must be terminated to 50 ). During this test the Jitter
Analyzer modulates the data pattern and data clock
reference. The modulated data clock reference is
compared with the CLKOUT of the CDR. Jitter on
CLKOUT relative to the jitter on the data clock reference
is plotted versus modulation frequency at predefined
jitter amplitudes.
Figure 1. Test Configuration for Jitter Tolerance, Transfer, and Generation
Jitter
Analyzer
Pattern
Analyzer
Pulse
Generator
Pattern
Generator
Modulation
Source
Synthesizer
Signal Source
2.5 V
REFCLK
DATAIN CLKOUT
DATAOUT
Scope
Si5018-EVB
REFCLK+
DATAIN+
DATAOUT+
CLKOUT+
GPIB
DATAOUT–
Clock
Data Clock+
FM
GPIB
GPIB
CLKOUT–
REFCLK–
DATAIN–
GPIB
+
+
+
+
+

SI5018-EVB

Mfr. #:
Manufacturer:
Silicon Labs
Description:
Clock & Timer Development Tools Si5018 Evaluation Board
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
T/T Paypal Visa MoneyGram Western Union

Products related to this Datasheet