NB2304A
http://onsemi.com
6
Table 8. SWITCHING CHARACTERISTICS FOR INDUSTRIAL TEMPERATURE DEVICES
(All parameters are specified with loaded outputs)
Parameter Description Test Conditions Min Typ Max Unit
t
1
Output Frequency 30 pF load (all devices)
15 pF load (−1, −2)
15
15
100
133.3
MHz
t
1
Duty Cycle = (t
2
/ t
1
) * 100
(all devices)
Measured at 1.4 V, F
OUT
v 66.66 MHz
30 pF load
40.0 50.0 60.0
%
Measured at 1.4 V, F
OUT
v 50 MHz
15 pF load
45.0 50.0 55.0
t
3
Output Rise Time
(−1, −2)
Measured between 0.8 V and 2.0 V
30 pF load
2.50
ns
Measured between 0.8 V and 2.0 V
15 pF load
1.50
Output Rise Time
(−1H)
Measured between 0.8 V and 2.0 V
30 pF load
1.50
t
4
Output Fall Time
(−1, −2)
Measured between 2.0 V and 0.8 V
30 pF load
2.50
ns
Measured between 2.0 V and 0.8 V
15 pF load
1.50
Output Fall Time
(−1H)
Measured between 2.0 V and 0.8 V
30 pF load
1.25
t
5
Output−to−Output Skew on same Bank
(−1, −2)
All outputs equally loaded 200
ps
Output−to−Output Skew
(−1H)
All outputs equally loaded 200
Output Bank A−to−Output Bank B skew
(−1)
All outputs equally loaded 200
Output Bank A−to−Output Bank B skew
(−2)
All outputs equally loaded 400
t
6
Delay, REF Rising Edge to FBK Rising
Edge
Measured at V
DD
/2 0 ±250 ps
t
7
Device−to−Device Skew Measured at V
DD
/2 on the FBK pins of the
device
0 500 ps
t
8
Output Slew Rate Measured between 0.8 V and 2.0 V using
Test Circuit #2
1 V/ns
t
J
Cycle−to−Cycle Jitter
(−1, −1H)
Measured at 66.67 MHz, loaded outputs,
15 pF load
180
ps
Measured at 66.67 MHz, loaded outputs,
30 pF load
200
Measured at 133.3 MHz, loaded outputs,
15 pF load
100
Cycle−to−Cycle Jitter
(−2)
Measured at 66.67 MHz, loaded outputs,
30 pF load
400
ps
Measured at 66.67 MHz, loaded outputs,
15 pF load
380
t
LOCK
PLL Lock Time Stable power supply, valid clock presented
on REF and FBK pins
1.0 ms
